公开(公告)号：US20160305774A1

公开(公告)日：2016-10-20

申请号：US14685921

申请日：2015-04-14

Applicant: RAYTHEON COMPANY

Inventor： Thomas William Ross, Jr. ,  Steven A. Miles ,  David C. Mann ,  Marco A. Avila ,  David Russell McDonald ,  Jeffery M. Gallagher

IPC: G01B11/27

CPC classification number: G01B11/272 ,  G01J1/0266 ,  G01J1/0411 ,  G01J1/4228 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0286 ,  G01J3/0289 ,  G01J5/0806 ,  G01J5/089 ,  G02B7/287 ,  G02B27/34 ,  G02B27/36 ,  H04N5/2258 ,  H04N5/23212 ,  H04N17/002

Abstract: System and method for sensor alignment. In one example, a reimaging optical system includes reimaging foreoptics positioned to receive and reimage incident electromagnetic radiation to produce an intermediate image plane and output an optical beam of the received incident electromagnetic radiation, an imaging optical apparatus positioned to receive the optical beam and focus the electromagnetic radiation of the optical beam onto a first focal plane, a first imaging sensor positioned at the first focal plane and configured to produce a first image responsive to receiving the electromagnetic radiation of the optical beam, an alignment object selectively positioned at the intermediate image plane and configured to superimpose an alignment tool upon the first image, and a controller coupled to the first imaging sensor and configured to perform an alignment process for the first imaging sensor based on at least a position of the alignment tool in the first image.

Abstract translation: 用于传感器校准的系统和方法。 在一个示例中，重建成像光学系统包括对定位成接收和再成像入射电磁辐射的前置光谱，以产生中间图像平面并输出接收到的入射电磁辐射的光束;成像光学装置，定位成接收光束并聚焦 光束在第一焦平面上的电磁辐射，位于第一焦平面处的第一成像传感器，其被配置为产生响应于接收光束的电磁辐射的第一图像;对准物体选择性地定位在中间像平面 并且被配置为将对准工具叠加在第一图像上，以及控制器，耦合到第一成像传感器并且被配置为基于至少第一图像中的对准工具的位置来执行第一成像传感器的对准处理。

公开(公告)号：US09689669B2

公开(公告)日：2017-06-27

申请号：US14685921

申请日：2015-04-14

Applicant: RAYTHEON COMPANY

Inventor： Thomas William Ross, Jr. ,  Steven A. Miles ,  David C. Mann ,  Marco A. Avila ,  David Russell McDonald ,  Jeffery M. Gallagher

IPC: G01B11/27 ,  G02B27/36 ,  G02B27/34 ,  H04N5/232 ,  G02B7/28 ,  G01J5/08 ,  G01J3/02 ,  G01J1/42 ,  G01J1/04 ,  G01J1/02 ,  H04N17/00 ,  H04N5/225

CPC classification number: G01B11/272 ,  G01J1/0266 ,  G01J1/0411 ,  G01J1/4228 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0286 ,  G01J3/0289 ,  G01J5/0806 ,  G01J5/089 ,  G02B7/287 ,  G02B27/34 ,  G02B27/36 ,  H04N5/2258 ,  H04N5/23212 ,  H04N17/002

Abstract: System and method for sensor alignment. In one example, a reimaging optical system includes reimaging foreoptics positioned to receive and reimage incident electromagnetic radiation to produce an intermediate image plane and output an optical beam of the received incident electromagnetic radiation, an imaging optical apparatus positioned to receive the optical beam and focus the electromagnetic radiation of the optical beam onto a first focal plane, a first imaging sensor positioned at the first focal plane and configured to produce a first image responsive to receiving the electromagnetic radiation of the optical beam, an alignment object selectively positioned at the intermediate image plane and configured to superimpose an alignment tool upon the first image, and a controller coupled to the first imaging sensor and configured to perform an alignment process for the first imaging sensor based on at least a position of the alignment tool in the first image.

公开(公告)号：US09857223B2

公开(公告)日：2018-01-02

申请号：US14947238

申请日：2015-11-20

Applicant: RAYTHEON COMPANY

Inventor： Randall W. Zywicki ,  David C. Mann ,  Andre D. Cropper

IPC: G01J3/26 ,  B81B7/00 ,  G01J3/28

CPC classification number: G01J3/26 ,  B81B7/00 ,  G01J3/2803

Abstract: An interferometer system comprising an optical detector including a substrate and a two-dimensional array of pixels disposed on the substrate is provided. The interferometer system may further comprise an interferometer disposed proximate the optical detector without an optical element between the interferometer and the optical detector. The interferometer may include a first plate positioned proximate the substrate and extending over the two-dimensional array of pixels, a second plate spaced apart from the first plate, the first and second plates defining an optical gap between them, and at least one actuatable spacer positioned between the first plate and the second plate and configured to space apart the first and second plates from one another and to selectively alter a thickness of the optical gap.

公开(公告)号：US20170146400A1

公开(公告)日：2017-05-25

申请号：US14947238

申请日：2015-11-20

Applicant: RAYTHEON COMPANY

Inventor： Randall W. Zywicki ,  David C. Mann ,  Andre D. Cropper

IPC: G01J3/26

CPC classification number: G01J3/26 ,  B81B7/00 ,  G01J3/2803

Abstract: An interferometer system comprising an optical detector including a substrate and a two-dimensional array of pixels disposed on the substrate is provided. The interferometer system may further comprise an interferometer disposed proximate the optical detector without an optical element between the interferometer and the optical detector. The interferometer may include a first plate positioned proximate the substrate and extending over the two-dimensional array of pixels, a second plate spaced apart from the first plate, the first and second plates defining an optical gap between them, and at least one actuatable spacer positioned between the first plate and the second plate and configured to space apart the first and second plates from one another and to selectively alter a thickness of the optical gap.