Abstract:
IN THE FABRICATION OF CERTAIN TYPES OF SEMICONDUCTOR DEVICES, A SEMICONDUCTOR SUBSTRATE IS PROVIDED WITH SUCCESSIVE LAYERS OF A FIRST LAYER OF TITANIUM, A SECOND LAYER OF A MEMBER OF THE PLATINUM GROUP OF METALS, AND A THIRD LAYER OF TITANIUM, THE LAYERS PREFERABLY BEING PROVIDED IN A PROTETIVE ATMOSPHERE. PORTIONS OF THE UPPERMOST LAYER OF TITANIUM ARE SELECTIVELY ETCHED TO EXPOSED PORTIONS OF THE SECOND LAYER. THE EXPOSED PORTIONS OF THE SECOND LAYER ARE THEN IMMEDIATELY ETCHED AWAY, THE REMAINING PORTIONS OF THE UPPERMOST TITANIUM LAYER SERVING AS AN ETCH MASK IN THE PROCESS. THE PORTIONS OF THE BOTTOM LAYER OF TITANIUM EXPOSED BY THE ETCHING OF THE SECOND LAYER ARE COATED WITH AN ELECTRICALLY NON-CONDUCTIVE COATING, OTHER PORTIONS OF THE SECOND LAYER ARE EXPOSED BY REMOVAL OF THE OVERCOATING OF TITANIUM THEREFROM, AND GOLD IS IMMEDIATELY THEREAFTER PLATED ONTO THE NEWLY EXPOSED SECOND LAYER PORTIONS.
Abstract:
The semiconductor device and a metal backing plate are simultaneously sputter etched so that some of the backing plate metal is back scattered onto the device and forms a thin metalsemiconductor alloy region in the semiconductor contact openings. At least one layer of electrode metal is then deposited on the device surface and the alloy regions. Part of the metal layer is then removed to define the desired electrode leads.