Method of fabrication of semiconductor devices
    1.
    发明授权
    Method of fabrication of semiconductor devices 失效
    半导体器件的制造方法

    公开(公告)号:US3686080A

    公开(公告)日:1972-08-22

    申请号:US3686080D

    申请日:1971-07-21

    Applicant: RCA CORP

    CPC classification number: H01L23/53242 H01L29/456 H01L2924/0002 H01L2924/00

    Abstract: IN THE FABRICATION OF CERTAIN TYPES OF SEMICONDUCTOR DEVICES, A SEMICONDUCTOR SUBSTRATE IS PROVIDED WITH SUCCESSIVE LAYERS OF A FIRST LAYER OF TITANIUM, A SECOND LAYER OF A MEMBER OF THE PLATINUM GROUP OF METALS, AND A THIRD LAYER OF TITANIUM, THE LAYERS PREFERABLY BEING PROVIDED IN A PROTETIVE ATMOSPHERE. PORTIONS OF THE UPPERMOST LAYER OF TITANIUM ARE SELECTIVELY ETCHED TO EXPOSED PORTIONS OF THE SECOND LAYER. THE EXPOSED PORTIONS OF THE SECOND LAYER ARE THEN IMMEDIATELY ETCHED AWAY, THE REMAINING PORTIONS OF THE UPPERMOST TITANIUM LAYER SERVING AS AN ETCH MASK IN THE PROCESS. THE PORTIONS OF THE BOTTOM LAYER OF TITANIUM EXPOSED BY THE ETCHING OF THE SECOND LAYER ARE COATED WITH AN ELECTRICALLY NON-CONDUCTIVE COATING, OTHER PORTIONS OF THE SECOND LAYER ARE EXPOSED BY REMOVAL OF THE OVERCOATING OF TITANIUM THEREFROM, AND GOLD IS IMMEDIATELY THEREAFTER PLATED ONTO THE NEWLY EXPOSED SECOND LAYER PORTIONS.

    Method of making electrical contacts on the surface of a semiconductor device
    2.
    发明授权
    Method of making electrical contacts on the surface of a semiconductor device 失效
    在半导体器件表面制造电气接触的方法

    公开(公告)号:US3640812A

    公开(公告)日:1972-02-08

    申请号:US3640812D

    申请日:1970-09-02

    Applicant: RCA CORP

    CPC classification number: C23C14/3464 H01L21/00

    Abstract: The semiconductor device and a metal backing plate are simultaneously sputter etched so that some of the backing plate metal is back scattered onto the device and forms a thin metalsemiconductor alloy region in the semiconductor contact openings. At least one layer of electrode metal is then deposited on the device surface and the alloy regions. Part of the metal layer is then removed to define the desired electrode leads.

    Abstract translation: 半导体器件和金属背板被同时溅射蚀刻,使得一些背板金属反向散射到器件上,并在半导体接触开口中形成薄的金属 - 半导体合金区域。 然后在器件表面和合金区域上沉积至少一层电极金属。 然后去除金属层的一部分以限定所需的电极引线。

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