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1.发明申请公开(公告)号：US20190302956A1
公开(公告)日：2019-10-03
申请号：US16284198
申请日：2019-02-25
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor： Masato HIRAI
Abstract: A semiconductor device includes: a plurality of first sensors that is arranged at predetermined intervals; a first measurement circuit that measures the added value of two or more first detection signals among those output from all the first sensors and outputs a first measurement result; a second measurement circuit that measures the added value of two or more first detection signals that are different from those measured by the first measurement circuit among the first detection signals and outputs a second measurement result; and an analysis circuit that analyzes the position of a detection target on the basis of the first and second measurement results, wherein the first sensors and the first and second measurement circuits are coupled to each other so that combinations of the first and second measurement results differ from each other depending on the position of the detection target.
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公开(公告)号：US20190195703A1
公开(公告)日：2019-06-27
申请号：US16182188
申请日：2018-11-06
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor： Masato HIRAI , Takeshi YOSHIZAWA , Takeshi KUWANO
IPC: G01L1/14
Abstract: To improve the efficiency of pressure detection, a driver applies a positive-phase signal to a capacitance element from an opposite side to a coupling point in a control device. Another driver applies a reverse-phase signal to another capacitance element from an opposite side to the coupling point. A control unit detects pressures applied to the capacitance elements based on a potential fluctuation at the coupling point.
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Patent Agency Ranking
3.发明申请公开(公告)号：US20180300106A1
公开(公告)日：2018-10-18
申请号：US16007805
申请日：2018-06-13
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor： Masato HIRAI , Yuki HIGUCHI , Takeshi KUWANO , Kosuke FUWA
CPC classification number: G06F7/50 , G06F1/3203 , G06F3/03545 , G06F3/0416 , G06F3/046 , G06F7/523
Abstract: The speed of pen position detection is improved without increasing the circuit area and the current consumption.A sampling circuit samples a signal and outputs sampling data. A arithmetic circuit calculates a real part and an imaginary part of the sampling data. The arithmetic circuit classifies the real part of the sampling data into one of a plurality of groups and classifies the imaginary part of the sampling data into one of the groups according to an order of output of the sampling data from the sampling circuit. Then, the arithmetic circuit adds together real parts of sampling data belonging to a group and adds together imaginary parts of sampling data belonging to a group for each of the groups, and calculates amplitude and phase of the signal by using an addition result of the real parts and an addition result of the imaginary parts of each of the groups.
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4.发明申请公开(公告)号：US20170199725A1
公开(公告)日：2017-07-13
申请号：US15402671
申请日：2017-01-10
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor： Masato HIRAI , Yuki HIGUCHI , Takeshi KUWANO , Kosuke FUWA
CPC classification number: G06F7/50 , G06F1/3203 , G06F3/03545 , G06F3/0416 , G06F3/046 , G06F7/523
Abstract: The speed of pen position detection is improved without increasing the circuit area and the current consumption. A sampling circuit samples a signal and outputs sampling data. A arithmetic circuit calculates a real part and an imaginary part of the sampling data. The arithmetic circuit classifies the real part of the sampling data into one of a plurality of groups and classifies the imaginary part of the sampling data into one of the groups according to an order of output of the sampling data from the sampling circuit. Then, the arithmetic circuit adds together real parts of sampling data belonging to a group and adds together imaginary parts of sampling data belonging to a group for each of the groups, and calculates amplitude and phase of the signal by using an addition result of the real parts and an addition result of the imaginary parts of each of the groups.
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5.发明申请公开(公告)号：US20170371478A1
公开(公告)日：2017-12-28
申请号：US15488504
申请日：2017-04-16
Applicant: Renesas Electronics Corporation
Inventor： Masato HIRAI , Kosuke FUWA
CPC classification number: G06F3/0416 , G06F3/03545 , G06F3/044 , G06F3/046 , G06F2203/04106
Abstract: A reception unit (13) sequentially selects a plurality of sensor coils and receives a signal from a position indicator via the sensor coil that has been selected, and an operational circuit (14) detects, using an amplitude value and a phase value of the signal received by the reception unit (13) via each of the plurality of sensor coils, coordinates of a position indicated by the position indicator and a writing force of the position indicator. When the sensor (20) includes a sensor capacitor, a transmission unit (12) outputs a signal to the sensor capacitor, the reception unit (13) receives a signal generated at a connecting point between the sensor capacitor and the transmission unit (12), and the operational circuit (14) detects whether a touch key corresponding to the sensor capacitor has been touched using a phase value of the signal received by the reception unit (13).
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6.发明申请SEMICONDUCTOR DEVICE, AND RESISTANCE MEASURING SYSTEM AND PRESSURE INSTRUMENTATION DEVICE EACH INCLUDING THE SEMICONDUCTOR DEVICE 审中-公开半导体器件和电阻测量系统以及每个包含半导体器件的压力测量器件公开(公告)号：US20160097692A1
公开(公告)日：2016-04-07
申请号：US14865187
申请日：2015-09-25
Applicant: Renesas Electronics Corporation
Inventor： Masato HIRAI , Siewling LIM
CPC classification number: G01L1/2262 , G01R27/02
Abstract: According to one embodiment, a semiconductor device 1 includes: a variable current generating unit 11 that sends a direct current Idac of a value according to a control signal S1 from one measurement node of a bridge circuit B1 in which a change amount ΔR4 of a resistance value of a pressure-sensitive resistance element R4 appears as a potential difference ΔV between measurement nodes NA, NB; a potential difference determining unit 12 that determines whether or not the potential difference ΔV has been generated; and a control unit 13 that outputs the control signal S1 to the variable current generating unit 11 so that the variable current generating unit 11 sends the direct current Idac of a value that does not generate the potential difference ΔV based on a determination result D1 of the potential difference determining unit 12.
Abstract translation: 根据一个实施例，半导体器件1包括：可变电流产生单元11，其从桥接电路B1的一个测量节点发送根据控制信号S1的值的直流Idac，其中变化量＆Dgr; R4 压敏电阻元件R4的电阻值作为测量节点NA，NB之间的电位差Dgr; V出现; 电位差确定单元12，其确定是否已经产生了电位差Dgr; V; 以及控制单元13，其将控制信号S1输出到可变电流产生单元11，使得可变电流产生单元11基于确定结果D1发送不产生电位差Dgr; V的值的直流Idac 的电位差判定部12。
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7.发明申请SEMICONDUCTOR DEVICE AND AC RESISTANCE MEASURING SYSTEM INCLUDING THE SAME 审中-公开半导体器件和交流电阻测量系统，包括它们公开(公告)号：US20160091543A1
公开(公告)日：2016-03-31
申请号：US14853834
申请日：2015-09-14
Applicant: Renesas Electronics Corporation
Inventor： Masato HIRAI , Siewling LIM
Abstract: Provided is a semiconductor device including: an AC voltage generation unit that generates an AC voltage having an amplitude according to a control signal; a resistance element provided in series with a measurement target, the AC voltage being applied to the resistance element; a voltage detecting unit that detects that a difference voltage between two ends of the resistance element has reached a specified voltage; and a control unit that outputs the control signal to the AC voltage generation unit to cause the AC voltage generation unit to generate the AC voltage so that the difference voltage reaches the specified voltage, based on a detection result of the voltage detecting unit.
Abstract translation: 提供一种半导体器件，包括：交流电压产生单元，其产生具有根据控制信号的振幅的交流电压; 与测量对象串联设置的电阻元件，将AC电压施加到电阻元件; 电压检测单元，其检测所述电阻元件的两端之间的差电压已达到指定电压; 以及控制单元，其基于所述电压检测单元的检测结果，将所述控制信号输出到所述AC电压生成单元，以使所述AC电压生成单元生成所述AC电压，使得所述差电压达到所述规定电压。
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