SEMICONDUCTOR DEVICE AND METHOD FOR DRIVING THE SAME

    公开(公告)号:US20240146293A1

    公开(公告)日:2024-05-02

    申请号:US18470830

    申请日:2023-09-20

    CPC classification number: H03K17/08116 H03K2217/0027

    Abstract: A semiconductor device that outputs a high-speed and large-current pulse is provided. The semiconductor device includes: a first N channel transistor having its gate receiving a second voltage as its input; a first resistance element having its second terminal connected to a drain of the first N channel transistor; a second resistance element having its first terminal connected to a source of the first N channel transistor; a second N channel transistor having its gate receiving a second voltage as its input; a third resistance element having its second terminal connected to a drain of the second N channel transistor; a fourth resistance element having its first terminal connected to a source of the second N channel transistor; and an isolator having its first terminal connected to the drain of the first N channel transistor and having its second terminal connected to the drain of the second N channel transistor.

    SEMICONDUCTOR DEVICE
    2.
    发明公开

    公开(公告)号:US20240094279A1

    公开(公告)日:2024-03-21

    申请号:US18347137

    申请日:2023-07-05

    Inventor: Noboru INOMATA

    CPC classification number: G01R31/2853 G01R31/2884

    Abstract: A disconnection detector circuit that can favorably inspect a connection state of a wire without increase in parasitic capacitance is provided. A semiconductor device includes, in one package, a first integrated circuit including a transformer including a primary coil and a secondary coil, and a second integrated circuit connected to a midpoint and one end of the secondary coil. The second integrated circuit includes a reference line and a detector circuit. The reference line connects the midpoint of the secondary coil and a reference potential. On basis of a potential at a predetermined reference point of the first power supply line, the detector circuit detects whether a connection state between the second integrated circuit and the secondary coil is normal or abnormal.

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