Semiconductor device
    1.
    发明授权

    公开(公告)号:US12282056B2

    公开(公告)日:2025-04-22

    申请号:US18347137

    申请日:2023-07-05

    Inventor: Noboru Inomata

    Abstract: A disconnection detector circuit that can favorably inspect a connection state of a wire without increase in parasitic capacitance is provided. A semiconductor device includes, in one package, a first integrated circuit including a transformer including a primary coil and a secondary coil, and a second integrated circuit connected to a midpoint and one end of the secondary coil. The second integrated circuit includes a reference line and a detector circuit. The reference line connects the midpoint of the secondary coil and a reference potential. On basis of a potential at a predetermined reference point of the first power supply line, the detector circuit detects whether a connection state between the second integrated circuit and the secondary coil is normal or abnormal.

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