公开(公告)号：US09841300B2

公开(公告)日：2017-12-12

申请号：US14654952

申请日：2014-01-13

Applicant: RENISHAW PLC

Inventor： Matthew Donald Kidd ,  Nicholas John Weston ,  James Reynolds Henshaw ,  Marcus Ardron ,  John Dardis ,  Robert Thomson

IPC: G01D5/34 ,  B82Y20/00 ,  B23K26/362

Abstract: A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.

公开(公告)号：US11123799B2

公开(公告)日：2021-09-21

申请号：US16507522

申请日：2019-07-10

Applicant: RENISHAW PLC

Inventor： David Roberts McMurtry ,  Geoffrey McFarland ,  Nicholas John Weston ,  Ben Ian Ferrar

IPC: G02B26/02 ,  G02B26/10 ,  B22F12/00 ,  B29C64/153 ,  B22F10/10 ,  B33Y30/00 ,  B33Y40/00 ,  B33Y50/02

Abstract: This invention concerns an additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus comprises a build chamber 101 containing a working area, a plurality of high energy beams 133, 233 for consolidating material deposited in the working area in layers and an optical unit 135 for controlling transmission of the high energy beams onto material in the working area. The optical unit 135 comprises a plurality of independently controllable optical elements 141, 241 each optical element 141, 241 for controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unit 135 movable in the build chamber 101.

公开(公告)号：USRE46012E1

公开(公告)日：2016-05-24

申请号：US14562093

申请日：2014-12-05

Applicant: RENISHAW PLC

Inventor： Nicholas John Weston ,  Yvonne Ruth Huddart

IPC: G06K9/00 ,  G06K9/36 ,  H04N13/02 ,  G01B11/00 ,  G01B11/25 ,  G06T7/00 ,  G01B11/02

CPC classification number: G01B11/007 ,  G01B11/026 ,  G01B11/2527 ,  G06T7/0004 ,  G06T7/521 ,  G06T7/593 ,  G06T2207/30164

Abstract: A non-contact measurement apparatus and method. A probe is provided for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured. Also provided is an image analyzer configured to analyze at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured. The image analyzer is further configured to obtain topographical data regarding a surface of the object via analysis of an image, obtained by the probe, of the object on which an optical pattern is projected.

公开(公告)号：US11105607B2

公开(公告)日：2021-08-31

申请号：US16316995

申请日：2017-07-26

Applicant: RENISHAW PLC

Inventor： Nicholas John Weston ,  Yvonne Ruth Huddart

IPC: G01B11/02 ,  G01B21/04 ,  G01B11/25 ,  G01B11/00 ,  G01N21/89 ,  G01N21/95 ,  G06T7/00

Abstract: A method of putting a feature of interest on an object and an optical inspection system of a non-contact probe mounted on a positioning apparatus in a desired relationship. The method includes: a) identifying a target point of interest on the object to be inspected by arranging the non-contact probe and object at a first relative configuration at which a marker feature, projected by the non-contact probe along a projector axis that is not coaxial with the optical inspection system's optical axis, identifies the target point of interest; and b) subsequently moving the non-contact probe and/or object so as to put them at a second relative configuration at which the target point of interest and optical inspection system are at the desired relationship, in which the positioning apparatus is configured to guide such motion in accordance with the control path.

公开(公告)号：US10399145B2

公开(公告)日：2019-09-03

申请号：US14897152

申请日：2014-06-11

Applicant: RENISHAW PLC

Inventor： David Roberts McMurtry ,  Geoffrey McFarland ,  Nicholas John Weston ,  Ben Ian Ferrar

IPC: B22F3/105 ,  B29C64/386 ,  B33Y30/00 ,  B33Y50/02 ,  G02B26/02 ,  G02B26/10 ,  B29C64/153 ,  B33Y40/00

Abstract: An additive manufacturing apparatus for building objects by layerwise consolidation of material. The apparatus includes a build chamber containing a working area, a plurality of high energy beams for consolidating material deposited in the working area in layers and an optical unit for controlling transmission of the high energy beams onto material in the working area. The optical unit includes a plurality of independently controllable optical elements each optical element for controlling transmission of at least one of the high energy beams onto the material in the working area, the optical unit movable in the build chamber.

公开(公告)号：US09945697B2

公开(公告)日：2018-04-17

申请号：US14654952

申请日：2014-01-13

Applicant: RENISHAW PLC

Inventor： Matthew Donald Kidd ,  Nicholas John Weston ,  James Reynolds Henshaw ,  Marcus Ardron ,  John Dardis ,  Robert Thomson

IPC: G01D5/34 ,  B82Y20/00 ,  B23K26/362

CPC classification number: G01D5/345 ,  B23K26/361 ,  B23K26/362 ,  B82Y20/00 ,  G01D5/344

Abstract: A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.