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公开(公告)号:US20250158580A1
公开(公告)日:2025-05-15
申请号:US18391681
申请日:2023-12-21
Applicant: RichWave Technology Corp.
Inventor: Tien-Yun Peng , Ching-Wen Hsu , Chih-Sheng Chen
Abstract: An amplification circuit includes a radio-frequency input terminal, a radio-frequency output terminal, a first amplification stage circuit, a second amplification stage circuit, and a variable impedance path. The radio-frequency input terminal is used to receive a radio-frequency signal. The radio-frequency output terminal is used to output the amplified radio-frequency signal. The first amplification stage circuit is coupled to the radio-frequency input terminal and the radio-frequency output terminal. The second amplification stage circuit is coupled to the radio-frequency input terminal and the radio-frequency output terminal. The variable impedance path is coupled to the first amplification stage circuit and the second amplification stage circuit. When the second amplification stage circuit is enabled, the variable impedance path has a low impedance. When the second amplification stage circuit is disabled, the variable impedance path has a high impedance.
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公开(公告)号:US20240223133A1
公开(公告)日:2024-07-04
申请号:US18202963
申请日:2023-05-29
Applicant: RichWave Technology Corp.
Inventor: Chang-Heng Chen , Tien-Yun Peng , Chih-Sheng Chen
CPC classification number: H03F1/30 , H03F3/245 , H03F2200/451
Abstract: A radio-frequency circuit can include a power amplifier, a first bias circuit and a second bias circuit. The power amplifier can include an input terminal used to receive a radio-frequency signal, and an output terminal used to output an amplified radio-frequency signal. The first bias circuit can include a first output terminal coupled to the input terminal of the power amplifier through a common node. The second bias circuit can include a second output terminal and a current adjustment circuit, where the second output terminal can be coupled to the common node, and the current adjustment circuit can include a transistor. The transistor can include a first terminal coupled to the second output terminal, a second terminal used to receive a reference voltage, and a control terminal.
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公开(公告)号:US11899048B2
公开(公告)日:2024-02-13
申请号:US18110865
申请日:2023-02-16
Applicant: RichWave Technology Corp.
Inventor: Tien-Yun Peng , Hsien-Huang Tsai , Chih-Sheng Chen
CPC classification number: G01R19/0046 , H03K19/20
Abstract: A voltage state detector includes a voltage drop circuit, a pull-down circuit, a load circuit, a transistor, a pull-up circuit, first and second output terminals, and a logic circuit. The pull-down circuit is coupled to the voltage drop circuit. The transistor has a first terminal coupled to the load circuit, a second terminal coupled to the pull-down circuit, and a control terminal coupled to the voltage drop circuit. The pull-up circuit is coupled to the load circuit and the voltage drop circuit. The first output terminal is coupled to the first terminal of the transistor for outputting a first state determination signal. The second output terminal is coupled to the voltage drop circuit for outputting a second state determination signal. The logic circuit includes a NOR gate for performing an NOR operation on the first state determination signal and the second state determination signal to output a control signal.
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公开(公告)号:US11703532B2
公开(公告)日:2023-07-18
申请号:US17495825
申请日:2021-10-07
Applicant: RichWave Technology Corp.
Inventor: Po-Wei Wu , Hsiang-Jen Jao , Chih-Sheng Chen , Tien-Yun Peng
IPC: G01R29/00 , G01R29/027
CPC classification number: G01R29/0273
Abstract: A device of measuring a duty cycle includes a resistor-capacitor circuit and a control circuit. The resistor-capacitor circuit is used to generate a first voltage when a reference signal is in a first state, and generate a second voltage and a third voltage when the reference signal is in a second state. The control circuit is coupled to the resistor-capacitor circuit, and configured to acquire an ON-time according to the first voltage, the second voltage and the third voltage. The ON-time is a time interval during which the reference signal is in the first state.
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公开(公告)号:US20230058738A1
公开(公告)日:2023-02-23
申请号:US17551127
申请日:2021-12-14
Applicant: RichWave Technology Corp.
Inventor: Chih-Sheng Chen , Tien-Yun Peng , Hsien-Huang Tsai
IPC: H03K3/01
Abstract: A driving circuit includes a first reference terminal, a second reference terminal, at least one input terminal, an output terminal, a first transistor, a second transistor, a switch module, and at least one control signal terminal. The at least one input terminal receives at least one input signal. The output terminal outputs an output signal in response to the at least one input signal. The first transistor and the second transistor respectively include control terminals coupled to the at least one input terminal. The switch module includes at least one control terminal coupled to the at least one control signal terminal to receive at least one control signal. The at least one input signal has a transition period. The switch module can be turned off according to the at least one control signal.
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公开(公告)号:US11411539B2
公开(公告)日:2022-08-09
申请号:US17093504
申请日:2020-11-09
Applicant: RichWave Technology Corp.
Inventor: Chih-Sheng Chen , Tien-Yun Peng , Hung-Chia Lo
Abstract: An amplifier device includes an amplifying unit and a bias module. The amplifying unit has a first end coupled to a voltage source configured to receive a source voltage, a second end configured to receive an input signal, and a third end coupled to a first reference potential terminal configured to receive a first reference potential. The first end of the amplifying unit is configured to output an output signal amplified by the amplifying unit. The bias module is coupled to the second end of the amplifying unit, and configured to receive a voltage signal to generate a bias current according to a first counter-gradient and a second counter-gradient, and provide the bias current to the amplifying unit. The voltage signal is a variable voltage. A supply current flowing into the amplifying unit and is adjusted in accordance with the voltage signal to stay within a predetermined range.
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公开(公告)号:US20210058037A1
公开(公告)日:2021-02-25
申请号:US17093504
申请日:2020-11-09
Applicant: RichWave Technology Corp.
Inventor: Chih-Sheng Chen , Tien-Yun Peng , Hung-Chia Lo
Abstract: An amplifier device includes an amplifying unit and a bias module. The amplifying unit has a first end coupled to a voltage source configured to receive a source voltage, a second end configured to receive an input signal, and a third end coupled to a first reference potential terminal configured to receive a first reference potential. The first end of the amplifying unit is configured to output an output signal amplified by the amplifying unit. The bias module is coupled to the second end of the amplifying unit, and configured to receive a voltage signal to generate a bias current according to a first counter-gradient and a second counter-gradient, and provide the bias current to the amplifying unit. The voltage signal is a variable voltage. A supply current flowing into the amplifying unit and is adjusted in accordance with the voltage signal to stay within a predetermined range.
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公开(公告)号:US10454479B2
公开(公告)日:2019-10-22
申请号:US16111238
申请日:2018-08-24
Applicant: RichWave Technology Corp.
Inventor: Chih-Sheng Chen , Tien-Yun Peng
IPC: H03K19/003 , H03K19/00 , H03K19/017 , H03K19/20
Abstract: An inverter includes a first system voltage terminal, a second system voltage terminal, an output terminal, a plurality of P-type transistors, a plurality of N-type transistors, and a voltage drop impedance element. The first system voltage terminal receives a first voltage, and the second system voltage terminal receives a second voltage. The plurality of P-type transistors are coupled in series between the first system voltage terminal and the output terminal. The plurality of N-type transistors are coupled in series between the output terminal and the second system voltage terminal. The voltage drop impedance element is coupled in parallel with a first N-type transistor of the plurality of N-type transistors, and the impedance of the voltage drop impedance element is smaller than the impedance of the first N-type transistor when the first N-type transistor is turned off.
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公开(公告)号:US20230060339A1
公开(公告)日:2023-03-02
申请号:US17495825
申请日:2021-10-07
Applicant: RichWave Technology Corp.
Inventor: Po-Wei Wu , Hsiang-Jen Jao , Chih-Sheng Chen , Tien-Yun Peng
IPC: G01R29/027
Abstract: A device of measuring a duty cycle includes a resistor-capacitor circuit and a control circuit. The resistor-capacitor circuit is used to generate a first voltage when a reference signal is in a first state, and generate a second voltage and a third voltage when the reference signal is in a second state. The control circuit is coupled to the resistor-capacitor circuit, and configured to acquire an ON-time according to the first voltage, the second voltage and the third voltage. The ON-time is a time interval during which the reference signal is in the first state.
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公开(公告)号:US20220307916A1
公开(公告)日:2022-09-29
申请号:US17246734
申请日:2021-05-03
Applicant: RichWave Technology Corp.
Inventor: Po-Wei Wu , Tien-Yun Peng , Chih-Sheng Chen
Abstract: A temperature detector is used to detect a temperature of a circuit under test, and includes a temperature coefficient component, a multiplier, an impedance component and a node. The temperature coefficient component is arranged in proximity to the circuit under test. A control terminal of the multiplier is coupled to a second terminal of the temperature coefficient component. The impedance component is coupled between the second terminal of the temperature coefficient component and the control terminal of the multiplier, or between a second terminal of the multiplier and a third voltage terminal. The node is formed between the second terminal of the temperature coefficient component and the control terminal of the multiplier. A voltage at the node and an amplified detection current flowing to a first terminal of the multiplier are positively correlated to the temperature of the circuit under test.
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