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公开(公告)号：US5241280A
公开(公告)日：1993-08-31
申请号：US533444
申请日：1990-06-01
申请人： Rashid K. Aidun , Frank J. Koch
发明人： Rashid K. Aidun , Frank J. Koch
摘要： A coating thickness gauge includes a measurement transducer and a particularly advantageous probe arrangement. The probe arrangement includes a probe assembly and a probe housing that encircles the probe assembly. The probe assembly may include an inductor that forms a part of an LC oscillator. The gauge is able to measure the thickness of coatings on magnetic and non-magnetic substrates through use of the same probe assembly. Alternatively, the probe assembly can include a capacitor forming a part of an LC or an RC oscillator. The bottom surface of the probe housing has two oppositely positioned V-shaped grooves formed therein for facilitating the measurement of coating thicknesses on convex surfaces. The outer peripheral surface of the probe housing includes two spaced apart flat surfaces connected together by two arcuate surfaces for stabilizing the gauge during measurement of coating thicknesses on concave surfaces. The probe assembly is mounted within the gauge housing in a manner that is adapted to facilitate movement of the probe assembly in a substantially vertical plane. All functions of the gauge can be operated through the use of the two keys and the gauge only requires a zeroing adjustment rather than a several step calibration procedure.
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公开(公告)号：US5723791A
公开(公告)日：1998-03-03
申请号：US127529
申请日：1993-09-28
CPC分类号： G01B17/025
摘要： A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by the transducer, the received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of the ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on the sampled data, the controller includes the ability to subject the sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to the first signals from sampled data corresponding to the second signals when the coating is thinner than a wavelength of the ultrasonic signal emitted by the transducer.
摘要翻译： 用于确定衬底上的涂层的厚度的量度包括用于将超声信号发射到涂层中并用于产生与由换能器接收的超声信号成比例的电信号的换能器，所接收的信号包括从换能器/涂层界面反射的第一信号 和从涂层/衬底界面反射的第二信号; 用于向所述换能器发送脉冲以触发所述超声波信号的发射的脉冲发生器; 采样器，用于对电传感器信号进行采样并产生采样数据; 用于控制脉冲发生器和采样器的定时器，以便对由采样器接收的信号执行等效的时间采样; 以及控制器，用于基于采样数据计算涂层的厚度，控制器包括对取样数据进行去卷积分析的能力，以便将与第一信号相对应的采样数据与对应于第二信号的采样数据区分开， 涂层比由换能器发射的超声信号的波长薄。
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3.发明授权Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil 失效使用磁通密度传感器和涡流搜索线圈的组合涂层厚度计
公开(公告)号：US5343146A
公开(公告)日：1994-08-30
申请号：US956280
申请日：1992-10-05
CPC分类号： G01B7/105
摘要： A gauge probe for a handheld combination coating thickness gauge allows the combination coating thickness gauge to measure both nonferrous coatings on ferrous substrate and nonconductive coatings on conductive nonferrous substrate. The gauge probe enables the combination coating thickness gauge to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate. The technique used to measure coatings on a ferrous substrate utilizes a permanent magnet to provide a constant magnetic flux and a Hall sensor and thermistor arranged to measure the temperature-compensated magnetic flux density at one of the poles of the permanent magnet. The flux density at the magnet pole can be related to a nonferrous coating thickness on a ferrous substrate. The technique used to measure nonconductive coatings on a conductive nonferrous substrate utilizes eddy current effects. A coil near the gauge probe tip is excited by an alternating current oscillating between about 6 MHz and about 12 MHz. The coil sets up eddy currents on the surface of the conducting substrate. The resulting eddy currents set up an opposing magnetic field which in turn have an effect on the excited coil. The eddy current effects on the coil are quantified, and the degree of the eddy current effects on the coil are related to the nonconductive coating thickness on a conductive substrate. The gauge probe detects the substrate type and automatically determines the coating thickness on the detected substrate.
摘要翻译： 用于手持组合涂层厚度计的测量探头允许组合涂层厚度计测量有色金属基底上的有色涂层和导电有色基底上的非导电涂层。 量规探头使得组合涂层厚度计可以通过单个探针自动确定基底特性，并对该基底上的涂层厚度进行测量。 用于测量含铁基底上的涂层的技术利用永久磁铁提供恒定的磁通量，霍尔传感器和热敏电阻被布置成测量永久磁体的一个磁极处的温度补偿磁通密度。 磁极处的磁通密度可以与铁基底上的有色涂层厚度有关。 用于测量导电有色基底上非导电涂层的技术采用涡流效应。 靠近测量头探头的线圈由约6MHz至约12MHz之间的交流振荡激发。 线圈在导电基板的表面上设置涡流。 所产生的涡流设置相反的磁场，这又对激励的线圈产生影响。 量化线圈上的涡流效应，并且涡流对线圈的影响程度与导电衬底上的非导电涂层厚度有关。 量规探头检测基板类型，并自动确定检测到的基板上的涂层厚度。
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公开(公告)号：USRE41342E1
公开(公告)日：2010-05-18
申请号：US09542640
申请日：2000-04-03
IPC分类号： G01N23/203
摘要： A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.
摘要翻译： 模块化涂层厚度计包括产生代表涂层厚度的信号的探针，连接到探针的PCMCIA卡，用于将信号转换成标准PCMCIA输出格式，以及便携式计算单元，用于通过PCMCIA卡接收信号。 仪表允许现场用户交替记录涂层厚度测量数据和与每个涂层厚度测量相关的描述性文字或图形数据。
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公开(公告)号：US5751608A
公开(公告)日：1998-05-12
申请号：US529137
申请日：1995-09-15
IPC分类号： G01B7/02 , G01B7/06 , G01B21/00 , G01B21/02 , G01B21/08 , G01D7/00 , G01D7/10 , G01D9/00 , G01D9/02 , G01N23/203 , G06F15/52
摘要： A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.
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公开(公告)号：USD331201S
公开(公告)日：1992-11-24
申请号：US604426
申请日：1990-10-26
申请人： Frank J. Koch
设计人： Frank J. Koch
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公开(公告)号：USD308248S
公开(公告)日：1990-05-29
申请号：US252445
申请日：1988-10-03
申请人： Frank J. Koch
设计人： Frank J. Koch
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公开(公告)号：US4705153A
公开(公告)日：1987-11-10
申请号：US812506
申请日：1985-12-23
申请人： Frank J. Koch
发明人： Frank J. Koch
CPC分类号： G07F11/045 , G07D5/04
摘要： A coin acceptor includes first and second members initially spaced apart from one another and frictionally carrying a third member. Moving the first and second members toward one another displaces the third member a distance corresponding to the weight of the coin selectively positioned on the third member. The distance which the third member is displaced is compared with a reference position.
摘要翻译： 硬币接收器包括最初彼此间隔开并摩擦地承载第三构件的第一和第二构件。 将第一和第二构件朝向彼此移动，使第三构件相对应于选择性地定位在第三构件上的硬币的重量相对应的距离。 将第三构件移位的距离与参考位置进行比较。
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公开(公告)号：US06282962B1
公开(公告)日：2001-09-04
申请号：US08951010
申请日：1997-10-15
IPC分类号： G01N2900
CPC分类号： G01B17/025
摘要： A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by the transducer, the received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of the ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on the sampled data, the controller includes the ability to subject the sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to the first signals from sampled data corresponding to the second signals when the coating is thinner than a wavelength of the ultrasonic signal emitted by the transducer.
摘要翻译： 用于确定衬底上的涂层的厚度的量度包括用于将超声信号发射到涂层中并用于产生与由换能器接收的超声信号成比例的电信号的换能器，所接收的信号包括从换能器/涂层界面反射的第一信号 和从涂层/衬底界面反射的第二信号; 用于向所述换能器发送脉冲以触发所述超声波信号的发射的脉冲发生器; 采样器，用于对电传感器信号进行采样并产生采样数据; 用于控制脉冲发生器和采样器的定时器，以便对由采样器接收的信号执行等效的时间采样; 以及控制器，用于基于采样数据计算涂层的厚度，控制器包括对取样数据进行去卷积分析的能力，以便将与第一信号相对应的采样数据与对应于第二信号的采样数据区分开， 涂层比由换能器发射的超声信号的波长薄。
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公开(公告)号：US06250160B1
公开(公告)日：2001-06-26
申请号：US09208416
申请日：1998-12-10
IPC分类号： G01N2918
CPC分类号： G01B17/025
摘要： A gauge for determining a thickness of a coating on a substrate includes a transducer for emitting ultrasonic signals into the coating and for generating electrical signals proportional to the ultrasonic signals received by said transducer, said received signals include first signals reflected from a transducer/coating interface and second signals reflected from a coating/substrate interface; a pulser for sending pulses to the transducer to trigger the emission of said ultrasonic signals; a sampler for sampling the electrical transducer signals and generating sampled data; a timer for controlling the pulser and the sampler so as to perform an equivalent time sampling of the signals received by the sampler; and a controller for calculating a thickness of the coating based on said sampled data, said controller includes the ability to subject said sampled data to a deconvolution analysis so as to distinguish sampled data corresponding to said first signals from sampled data corresponding to said second signals when the coating is thinner than a wavelength of the ultrasonic signal emitted by the transducer.
摘要翻译： 用于确定衬底上的涂层的厚度的量度包括用于将超声信号发射到涂层中并用于产生与所述换能器接收的超声信号成比例的电信号的换能器，所述接收信号包括从换能器/涂层界面反射的第一信号 和从涂层/衬底界面反射的第二信号; 脉冲发生器，用于向所述换能器发送脉冲以触发所述超声信号的发射; 采样器，用于对电传感器信号进行采样并产生采样数据; 用于控制脉冲发生器和采样器的定时器，以便对由采样器接收的信号执行等效的时间采样; 以及控制器，用于基于所述采样数据计算涂层的厚度，所述控制器包括将所述采样数据进行去卷积分析的能力，以便将对应于所述第一信号的采样数据与对应于所述第二信号的采样数据区分开， 涂层比由换能器发射的超声信号的波长薄。
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