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公开(公告)号:US20220334368A1
公开(公告)日:2022-10-20
申请号:US17741240
申请日:2022-05-10
发明人: Jekwan Ryu , Hojin Lee , Ahreum Oh
IPC分类号: G02B21/06 , G02B21/18 , G02B21/36 , G02B27/58 , G06T7/00 , G03F7/20 , G06V10/60 , G06V10/145 , G06V20/69
摘要: A particle detection method detects presence and location of particles on a target using measured signals from a plurality of structured illumination patterns. The particle detection method uses measured signals obtained by illuminating the target with structured illumination patterns to detect particles. Specifically, the degree of variation in these measured signals in raw images is calculated to determine whether a particle is present on the target at a particular area of interest.
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公开(公告)号:US11366303B2
公开(公告)日:2022-06-21
申请号:US16262429
申请日:2019-01-30
发明人: Jekwan Ryu , Hojin Lee , Ahreum Oh
IPC分类号: G02B21/06 , G02B21/18 , G02B21/36 , G02B27/58 , G06T7/00 , G03F7/20 , G06V10/60 , G06V10/145 , G06V20/69
摘要: A particle detection method detects presence and location of particles on a target using measured signals from a plurality of structured illumination patterns. The particle detection method uses measured signals obtained by illuminating the target with structured illumination patterns to detect particles. Specifically, the degree of variation in these measured signals in raw images is calculated to determine whether a particle is present on the target at a particular area of interest.
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公开(公告)号:US11841495B2
公开(公告)日:2023-12-12
申请号:US17741240
申请日:2022-05-10
发明人: Jekwan Ryu , Hojin Lee , Ahreum Oh
IPC分类号: G02B21/36 , G02B21/06 , G02B21/18 , G02B27/58 , G06T7/00 , G03F7/00 , G06V10/60 , G06V10/145 , G06V20/69 , G02B21/08
CPC分类号: G02B21/367 , G02B21/06 , G02B21/08 , G02B21/365 , G02B27/58 , G03F7/70408 , G06T7/0012 , G06V10/145 , G06V10/60 , G06V20/695 , G06T2207/10056 , G06T2207/30072
摘要: A particle detection method detects presence and location of particles on a target using measured signals from a plurality of structured illumination patterns. The particle detection method uses measured signals obtained by illuminating the target with structured illumination patterns to detect particles. Specifically, the degree of variation in these measured signals in raw images is calculated to determine whether a particle is present on the target at a particular area of interest.
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