公开(公告)号：US09583229B2

公开(公告)日：2017-02-28

申请号：US15218017

申请日：2016-07-23

Applicant: Rising Star Pathway, a California Corporation

Inventor： Yiying Cao ,  Roger Kim ,  Michael Chang ,  Zhuotong Xian ,  Katherine Han

IPC: G21K7/00 ,  G01N23/20

CPC classification number: G21K7/00 ,  G01N23/20083 ,  G01N2223/3103

Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample.

Abstract translation: 改进的X射线激光显微镜系统和方法，结合了从X射线衍射和X射线成像方法获得的信息。 将样品置于超低温，超低压真空室中，暴露于使用X射线镜和针孔准直方法进一步浓缩的相干X射线照射的短暂阵列。 使用诸如自由电子X射线激光器的硬X射线激光器和X射线衍射方法获得来自样品的更高分辨率数据。 使用硬或软X射线激光源的任何一种可以获得来自相同样品的较低分辨率数据，以及使用纳米级蚀刻区域板技术的X射线成像方法。 在一些实施例中，可以同时获得衍射和成像数据。 来自两个来源的数据被组合以创建样本的更完整的表示。

公开(公告)号：US20160329119A1

公开(公告)日：2016-11-10

申请号：US15218017

申请日：2016-07-23

Applicant: Rising Star Pathway, a California Corporation

Inventor： Yiying Cao ,  Roger Kim ,  Michael Chang ,  Zhuotong Xian ,  Katherine Han

IPC: G21K7/00

CPC classification number: G21K7/00 ,  G01N23/20083 ,  G01N2223/3103

Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample.

Abstract translation: 改进的X射线激光显微镜系统和方法，结合了从X射线衍射和X射线成像方法获得的信息。 将样品置于超低温，超低压真空室中，暴露于使用X射线镜和针孔准直方法进一步浓缩的相干X射线照射的短暂阵列。 使用诸如自由电子X射线激光器的硬X射线激光器和X射线衍射方法获得来自样品的更高分辨率数据。 使用硬或软X射线激光源的任何一种可以获得来自相同样品的较低分辨率数据，以及使用纳米级蚀刻区域板技术的X射线成像方法。 在一些实施例中，可以同时获得衍射和成像数据。 来自两个来源的数据被组合以创建样本的更完整的表示。