公开(公告)号：US20210397166A1

公开(公告)日：2021-12-23

申请号：US16905130

申请日：2020-06-18

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Subbian Govindaraj ,  David A. Vasko ,  Juergen Weinhofer ,  Andrew J Ellis ,  Ka-Hing Lin ,  Michael Pantaleano ,  Sujeet Chand ,  Kyle A. Crum

IPC: G05B19/418

Abstract: An industrial control programming development platform simplifies generation of an industrial control program and associated tag definitions by generating at least a portion of the control program and tag definitions based on analysis of digital engineering drawings of an automation system to be monitored and controlled. This drawing-based program generation includes creation and configuration of smart data tags that model and contextualize controller data at the device level for processing by higher level analytic systems. This device-level contextualization can be based in part on inferences drawn from the digital engineering drawings.

公开(公告)号：US11726459B2

公开(公告)日：2023-08-15

申请号：US16905130

申请日：2020-06-18

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Subbian Govindaraj ,  David A. Vasko ,  Juergen Weinhofer ,  Andrew J Ellis ,  Ka-Hing Lin ,  Michael Pantaleano ,  Sujeet Chand ,  Kyle A. Crum

IPC: G05B19/418

CPC classification number: G05B19/41835 ,  G05B2219/34329

Abstract: An industrial control programming development platform simplifies generation of an industrial control program and associated tag definitions by generating at least a portion of the control program and tag definitions based on analysis of digital engineering drawings of an automation system to be monitored and controlled. This drawing-based program generation includes creation and configuration of smart data tags that model and contextualize controller data at the device level for processing by higher level analytic systems. This device-level contextualization can be based in part on inferences drawn from the digital engineering drawings.

公开(公告)号：US11841699B2

公开(公告)日：2023-12-12

申请号：US16587187

申请日：2019-09-30

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Michael Pantaleano ,  Ka H Lin ,  Juergen K Weinhofer ,  Andrew J Ellis ,  Kyle Crum ,  Sujeet Chand ,  David Vasko ,  Subbian Govindaraj

IPC: G05B19/418 ,  G06F11/00 ,  G06Q10/0639

CPC classification number: G05B19/41875 ,  G05B19/4183 ,  G05B19/41885 ,  G06F11/00 ,  G06Q10/06395

Abstract: An industrial data broker system receives contextualized industrial data from one or more industrial devices that support data modeling at the device level. The received industrial data is augmented with contextualization metadata that defines correlations between the data relevant to an analytical objective, and labels specifying analytic topics to which each data item is relevant. The broker system allows external systems, such as analytic systems, to subscribe to topics of interest, and streams a subset of contextualized device data relevant to the topic of interest to the external system for analysis.

公开(公告)号：US11435726B2

公开(公告)日：2022-09-06

申请号：US16587214

申请日：2019-09-30

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Michael Pantaleano ,  Ka H Lin ,  Juergen K Weinhofer ,  Andrew J Ellis ,  Kyle Crum ,  Sujeet Chand ,  David Vasko ,  Subbian Govindaraj

IPC: G05B19/418 ,  H04W4/38 ,  G06N20/00 ,  G06K19/077

Abstract: An industrial device supports device-level data modeling that pre-models data stored in the device with known relationships, correlations, key variable identifiers, and other such metadata to assist higher-level analytic systems to more quickly and accurately converge to actionable insights relative to a defined business or analytic objective. Data at the device level can be modeled according to modeling templates stored on the device that define relationships between items of device data for respective analytic goals (e.g., improvement of product quality, maximizing product throughput, optimizing energy consumption, etc.). This device-level modeling data can be provided to higher level systems together with their corresponding data tag values to high level analytic systems, which discovers insights into an industrial process or machine based on analysis of the data and its modeling data.

公开(公告)号：US11709481B2

公开(公告)日：2023-07-25

申请号：US17822257

申请日：2022-08-25

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Michael Pantaleano ,  Ka H Lin ,  Juergen K Weinhofer ,  Andrew J Ellis ,  Kyle Crum ,  Sujeet Chand ,  David Vasko ,  Subbian Govindaraj

IPC: G05B19/418 ,  H04W4/38 ,  G06N20/00 ,  G06K19/077

CPC classification number: G05B19/4183 ,  G06K19/07758 ,  G06N20/00 ,  H04W4/38

Abstract: An industrial device supports device-level data modeling that pre-models data stored in the device with known relationships, correlations, key variable identifiers, and other such metadata to assist higher-level analytic systems to more quickly and accurately converge to actionable insights relative to a defined business or analytic objective. Data at the device level can be modeled according to modeling templates stored on the device that define relationships between items of device data for respective analytic goals (e.g., improvement of product quality, maximizing product throughput, optimizing energy consumption, etc.). This device-level modeling data can be provided to higher level systems together with their corresponding data tag values to high level analytic systems, which discovers insights into an industrial process or machine based on analysis of the data and its modeling data.

公开(公告)号：US20220404803A1

公开(公告)日：2022-12-22

申请号：US17822257

申请日：2022-08-25

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Michael Pantaleano ,  Ka H Lin ,  Juergen K Weinhofer ,  Andrew J Ellis ,  Kyle Crum ,  Sujeet Chand ,  David Vasko ,  Subbian Govindaraj

IPC: G05B19/418 ,  H04W4/38 ,  G06N20/00 ,  G06K19/077

Abstract: An industrial device supports device-level data modeling that pre-models data stored in the device with known relationships, correlations, key variable identifiers, and other such metadata to assist higher-level analytic systems to more quickly and accurately converge to actionable insights relative to a defined business or analytic objective. Data at the device level can be modeled according to modeling templates stored on the device that define relationships between items of device data for respective analytic goals (e.g., improvement of product quality, maximizing product throughput, optimizing energy consumption, etc.). This device-level modeling data can be provided to higher level systems together with their corresponding data tag values to high level analytic systems, which discovers insights into an industrial process or machine based on analysis of the data and its modeling data.

公开(公告)号：US20210097456A1

公开(公告)日：2021-04-01

申请号：US16588118

申请日：2019-09-30

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Michael Pantaleano ,  Ka H Lin ,  Juergen K Weinhofer ,  Andrew J Ellis ,  Kyle Crum ,  Sujeet Chand ,  David Vasko ,  Subbian Govindaraj

IPC: G06Q10/06 ,  G06N20/00 ,  G06F17/16

Abstract: A smart gateway platform leverages pre-defined industrial expertise to identify limited subsets of available industrial data deemed relevant to a desired business objective, and to collect and model this relevant data to apply useful constraints on subsequent artificial intelligence or machine learning analytics applied to the data. This approach can reduce the data space to which AI analytics are applied and assist data analytic systems to more quickly derive valuable insights and business outcomes. In some embodiments, the smart gateway platform can operate within the context of a multi-level industrial analytic system, feeding pre-modeled data to one or more AI or machine learning systems executing on one or more different levels of an industrial enterprise. The multi-level industrial analytic system can also further refine modeled industrial data as the data moves upward through the system (e.g., from the device level to higher levels).

公开(公告)号：US20210096541A1

公开(公告)日：2021-04-01

申请号：US16587214

申请日：2019-09-30

Applicant: Rockwell Automation Technologies, Inc.

Inventor： Bijan Sayyarrodsari ,  Michael Pantaleano ,  Ka H Lin ,  Juergen K Weinhofer ,  Andrew J Ellis ,  Kyle Crum ,  Sujeet Chand ,  David Vasko ,  Subbian Govindaraj

IPC: G05B19/418 ,  G06N20/00 ,  H04W4/38 ,  G06K19/077

Abstract: An industrial device supports device-level data modeling that pre-models data stored in the device with known relationships, correlations, key variable identifiers, and other such metadata to assist higher-level analytic systems to more quickly and accurately converge to actionable insights relative to a defined business or analytic objective. Data at the device level can be modeled according to modeling templates stored on the device that define relationships between items of device data for respective analytic goals (e.g., improvement of product quality, maximizing product throughput, optimizing energy consumption, etc.). This device-level modeling data can be provided to higher level systems together with their corresponding data tag values to high level analytic systems, which discovers insights into an industrial process or machine based on analysis of the data and its modeling data.