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1.发明授权Configuration of memory cells and method of checking the operation of memory cells 有权存储单元的配置以及检查存储单元操作的方法公开(公告)号：US06279129B1
公开(公告)日：2001-08-21
申请号：US09465726
申请日：1999-12-17
申请人： Roderick McConnell , Detlev Richter
发明人： Roderick McConnell , Detlev Richter
IPC分类号： G11C2900
CPC分类号： G11C29/44 , G11C2029/1208
摘要： A method of checking the operation of memory cells. A first group of memory cells and a second group of memory cells are provided. The first group of memory cells is tested and a first set of test results is obtained, and the first set of test results is stored in the second group of memory cells. The first set of test results is read from the second group of memory cells. The second group of memory cells is tested and a second set of test results is obtained. The second set of test results is stored in the first group of memory cells. The test results can be compressed before they are output. Errors can be corrected by using an error correction code or duplicate copies of the test results. The method allows a test device to be provided that does not have memory. The complexity of the test device is therefore advantageously reduced. An electronic circuit is provided that includes a first group of memory cells, a second group of memory cells, and a test device programmed such that the method can be performed.
摘要翻译： 检查存储单元的操作的方法。 提供了第一组存储器单元和第二组存储单元。 测试第一组存储器单元并且获得第一组测试结果，并且将第一组测试结果存储在第二组存储器单元中。 从第二组存储单元读取第一组测试结果。 测试第二组记忆单元，并获得第二组测试结果。 第二组测试结果存储在第一组存储单元中。 测试结果可以在输出之前进行压缩。 可以通过使用纠错码或测试结果的副本来纠正错误。 该方法允许提供没有存储器的测试设备。 因此有利地减少了测试装置的复杂性。 提供一种电子电路，其包括第一组存储器单元，第二组存储器单元和被编程的测试装置，使得可以执行该方法。
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2.发明授权Method and configuration for the output of bit error tables from semiconductor devices 有权用于从半导体器件输出位错误表的方法和配置公开(公告)号：US06910163B2
公开(公告)日：2005-06-21
申请号：US10210015
申请日：2002-07-31
摘要： A method and a configuration for the output of bit error tables from semiconductor devices are described. A test control unit reads the bit error table from the memory device following a request from the test apparatus. Then, the bit error tables are transmitted sequentially to the test apparatus for further processing.
摘要翻译： 描述了用于从半导体器件输出位错误表的方法和配置。 测试控制单元根据来自测试设备的请求从存储设备读取位错误表。 然后，将比特错误表依次发送到测试装置进一步处理。
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公开(公告)号：US10741063B2
公开(公告)日：2020-08-11
申请号：US15898589
申请日：2018-02-18
申请人： Roderick McConnell
发明人： Roderick McConnell
摘要： A traffic metering system for metering access to at least one metered segment, configured to receive requests from one or more vehicles announcing a destination and a requested arrival time, and to authorize the vehicles to enter a metered segment based on a schedule for the at least one metered segment. Vehicles configured for use in the metering network announce a request for destination and arrival time to the metering network and the metering network authorizes the vehicle to enter the metered segment based on a schedule for the at least one metered segment.
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公开(公告)号：US20190259273A1
公开(公告)日：2019-08-22
申请号：US15898589
申请日：2018-02-18
申请人： Roderick McConnell
发明人： Roderick McConnell
摘要： A traffic metering system for metering access to at least one metered segment, configured to receive requests from one or more vehicles announcing a destination and a requested arrival time, and to authorize the vehicles to enter a metered segment based on a schedule for the at least one metered segment. Vehicles configured for use in the metering network announce a request for destination and arrival time to the metering network and the metering network authorizes the vehicle to enter the metered segment based on a schedule for the at least one metered segment.
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公开(公告)号：US09117586B2
公开(公告)日：2015-08-25
申请号：US12400141
申请日：2009-03-09
摘要： A circuit arrangement includes a coreless transformer. A trimming device is connected to the transformer and includes a variable capacitance and/or inductance.
摘要翻译： 电路装置包括无芯变压器。 修整装置连接到变压器并且包括可变电容和/或电感。
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公开(公告)号：US20100226064A1
公开(公告)日：2010-09-09
申请号：US12400141
申请日：2009-03-09
IPC分类号： H01F5/04
摘要： A circuit arrangement includes a coreless transformer. A trimming device is connected to the transformer and includes a variable capacitance and/or inductance.
摘要翻译： 电路装置包括无芯变压器。 修整装置连接到变压器并且包括可变电容和/或电感。
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公开(公告)号：US07986044B2
公开(公告)日：2011-07-26
申请号：US11360982
申请日：2006-02-23
申请人： Roderick McConnell
发明人： Roderick McConnell
IPC分类号： H01L23/48
CPC分类号： H01L25/0657 , H01L23/48 , H01L23/50 , H01L24/45 , H01L24/48 , H01L24/49 , H01L2224/05554 , H01L2224/32145 , H01L2224/451 , H01L2224/48091 , H01L2224/4813 , H01L2224/48145 , H01L2224/48147 , H01L2224/49 , H01L2225/06527 , H01L2924/01005 , H01L2924/01006 , H01L2924/01014 , H01L2924/01033 , H01L2924/01083 , H01L2924/14 , H01L2924/1433 , H01L2924/3011 , H01L2924/00014 , H01L2924/00
摘要： Data signals are transmitted between a number of semiconductor chips which are connected to one another in a common chip package. For that a signal transmission arrangement is set up for a transmission of the signals via in each case one transmitting/receiving interface which is arranged at the chip ends of a power supply connection which connects the number of semiconductor chips.
摘要翻译： 数据信号在公共芯片封装中彼此连接的多个半导体芯片之间传输。 为此，信号传输装置被设置用于在每种情况下传输信号通过一个发送/接收接口，其布置在连接半导体芯片的数量的电源连接的芯片端。
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公开(公告)号：US20060211380A1
公开(公告)日：2006-09-21
申请号：US11360982
申请日：2006-02-23
申请人： Roderick McConnell
发明人： Roderick McConnell
IPC分类号： H04B1/38
CPC分类号： H01L25/0657 , H01L23/48 , H01L23/50 , H01L24/45 , H01L24/48 , H01L24/49 , H01L2224/05554 , H01L2224/32145 , H01L2224/451 , H01L2224/48091 , H01L2224/4813 , H01L2224/48145 , H01L2224/48147 , H01L2224/49 , H01L2225/06527 , H01L2924/01005 , H01L2924/01006 , H01L2924/01014 , H01L2924/01033 , H01L2924/01083 , H01L2924/14 , H01L2924/1433 , H01L2924/3011 , H01L2924/00014 , H01L2924/00
摘要： The invention relates to a method and to an arrangement for signal transmission for the transmission of data signals between a number of semiconductor chips which are connected to one another in a common package. The signal transmission arrangement is set up for a transmission of the signals via in each case one transmitting/receiving interface which is arranged at the chip ends of a power supply connection which connects the number of semiconductor chips.
摘要翻译： 本发明涉及用于在公共封装中彼此连接的多个半导体芯片之间传输数据信号的信号传输的方法和装置。 信号传输装置被设置用于在每种情况下传输信号通过一个发送/接收接口，其布置在连接半导体芯片的数量的电源连接的芯片端。
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公开(公告)号：US5986952A
公开(公告)日：1999-11-16
申请号：US204927
申请日：1998-12-03
申请人： Roderick McConnell , Klaus Bernauer , Jochen Breilmann , Manfred Bromba , Eckehard Plattner , Konrad Schonemann
发明人： Roderick McConnell , Klaus Bernauer , Jochen Breilmann , Manfred Bromba , Eckehard Plattner , Konrad Schonemann
CPC分类号： G11C29/72 , G11C11/005 , G11C29/24 , G11C29/78
摘要： Addressable first units having ROM memory cells, for example word or bit lines, can be replaced by redundant second units having RAM memory cells. This has the advantage that the RAM memory cells can be realized with a smaller area than alternative PROM memory cells. The invention can be applied particularly advantageously to DROM memories.
摘要翻译： 具有ROM存储器单元（例如字或位线）的可寻址的第一单元可以由具有RAM存储单元的冗余第二单元代替。 这具有以下优点：RAM存储器单元可以以比替代的PROM存储器单元小的面积来实现。 本发明可以特别有利地应用于DROM存储器。
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