System and method for inspection of a substrate that has a refractive index
    7.
    发明授权
    System and method for inspection of a substrate that has a refractive index 有权
    用于检查具有折射率的基板的系统和方法

    公开(公告)号:US07030978B2

    公开(公告)日:2006-04-18

    申请号:US10423353

    申请日:2003-04-25

    IPC分类号: G01N21/00

    摘要: A system and method for inspection of a substrate having a first refractive index, the method including the steps of: (i) defining an apodization scheme in response to a characteristic of the layer; (ii) applying an apodizer to apodize a beam of radiation in response to the apodization scheme; (iii) directing the apodized beam of radiation to impinge on the substrate, whereby a plurality of rays are reflected from the substrate; whereas the apodized beam of radiation propagates through an at least partially transparent medium having a third refractive index and an at least partially transparent layer having a second refractive index and is subsequently reflected from the substrate; whereas the second refractive index differs from the first refractive index and from the third refractive index; and (iv) detecting at least some of the plurality of reflected rays.

    摘要翻译: 一种用于检查具有第一折射率的衬底的系统和方法,所述方法包括以下步骤:(i)响应于所述层的特性定义变迹方案; (ii)响应于变迹方案应用变迹器来变形辐射束; (iii)引导变迹的辐射束照射到衬底上,由此多个射线从衬底反射; 而变迹的辐射束通过具有第三折射率的至少部分透明的介质和具有第二折射率的至少部分透明的层传播,并随后从基底反射; 而第二折射率与第一折射率和第三折射率不同; 和(iv)检测所述多个反射光线中的至少一些。

    INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUCTION CHARACTERISTICS
    10.
    发明申请
    INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUCTION CHARACTERISTICS 有权
    检验方法和检验系统展示品种减少特性

    公开(公告)号:US20140299790A1

    公开(公告)日:2014-10-09

    申请号:US14009869

    申请日:2011-04-07

    IPC分类号: G01N21/88

    摘要: A method and an inspection system that exhibiting speckle reduction characteristics includes a light source arranged to generate input light pulses, and diffuser-free speckle reduction optics that include a beam splitter, for splitting an input light pulse from the light source into multiple light pulses that are oriented at angles in relation to each other when exiting the beam splitter, and at least one optical element for directing the multiple light pulses to impinge on an inspected object at different angles.

    摘要翻译: 具有斑点减少特性的方法和检查系统包括布置成产生输入光脉冲的光源和包括分束器的无漫射器散斑光学器件,用于将来自光源的输入光脉冲分成多个光脉冲, 在离开分束器时相对于彼此的角度定向,并且至少一个光学元件用于引导多个光脉冲以不同的角度撞击在被检查物体上。