公开(公告)号：US20040059526A1

公开(公告)日：2004-03-25

申请号：US10358285

申请日：2003-02-05

Applicant: President of Saitama University

Inventor： Satoru Toyooka ,  Hirofumi Kadono

IPC: G01R015/00

CPC classification number: G01B9/02022 ,  G01B9/02007 ,  G01B9/02084 ,  G01B9/02095 ,  G01B11/162

Abstract: A deformation measuring method using electronic speckle pattern interferometry comprises the steps of subtracting an average intensity from the intensity in a time domain at each point of a speckle pattern image so as to compute the cosine component of intensity; subjecting the cosine component to Hilbert transform in a temporal domain so as to compute the sine component of intensity; determining the arctangent of the ratio between thus computed sine and cosine components so as to determine an object phase; carrying out an unwrapping operation; and outputting three-dimensional deformation distribution data in a displayable mode.

Abstract translation: 使用电子散斑图案干涉测量的变形测量​​方法包括以下步骤：从斑点图案图像的每个点处的时域中的强度减去平均强度，以计算强度的余弦分量; 在时域中对余弦分量进行希尔伯特变换，以计算强度的正弦分量; 确定所计算的正弦和余弦分量之间的比率的反正切，以便确定目标相位; 进行展开操作; 并输出可显示模式的三维变形分布数据。

公开(公告)号：US20040057054A1

公开(公告)日：2004-03-25

申请号：US10334784

申请日：2003-01-02

Applicant: President of Saitama University

Inventor： Satoru Toyooka ,  Hirofumi Kadono

IPC: G01B011/02

CPC classification number: G01B9/02022 ,  G01B9/02007 ,  G01B9/02084 ,  G01B9/02095 ,  G01B11/162

Abstract: A deformation measuring method using electronic speckle pattern interferometry comprises the steps of subtracting an average intensity from the intensity in a time domain at each point of a speckle pattern image so as to compute the cosine component of intensity; subjecting the cosine component to Hilbert transform in a temporal domain so as to compute the sine component of intensity; determining the arctangent of the ratio between thus computed sine and cosine components so as to determine an object phase; carrying out an unwrapping operation; and outputting three-dimensional deformation distribution data in a displayable mode.

公开(公告)号：US20010052977A1

公开(公告)日：2001-12-20

申请号：US09783206

申请日：2001-02-15

Applicant: SAITAMA UNIVERSITY

Inventor： Satoru Toyooka

IPC: G01J003/12

CPC classification number: G01J3/12 ,  G01J3/2823 ,  G01J2003/1278 ,  G01J2003/1282

Abstract: An imaging spectral device for use in the spectrum image analysis for performing the spectroscopic analysis of the respective points in two dimensional field is disclosed. The device comprises an imaging spectral device composing a white-light source to illuminate an object to be measured, a tunable filter located in the optical path between the object and the white-light source, a driving mechanism for wavelength scanning of the tunable filter, and a control unit in which scanning rate of transmitting wavelength of the tunable filter is controlled by the above-mentioned driving mechanism in such a manner that the spectral transmittance of the tunable filter integrated within the exposure time becomes desired spectral distribution of the object to be measured.

Abstract translation: 公开了用于在二维场中进行各点的光谱分析的光谱图像分析中使用的成像光谱装置。 该装置包括构成白光源以照射待测物体的成像光谱装置，位于物体与白光源之间的光路中的可调滤光器，可调滤光器的波长扫描驱动机构， 以及控制单元，其中可调谐滤波器的发射波长的扫描速率由上述驱动机构控制，使得在曝光时间内积分的可调滤波器的分光透射率成为所要对象的所需光谱分布 测量。