Abstract:
An optical device in which an end surface of a periodic multilayer structure is provided as a beam incidence surface or as a beam exit surface. The optical device can realize a high resolving-power spectroscopic apparatus without having any increase in size of the apparatus and by use of good directivity of beam leaked from the multilayer structure and strong wavelength dependence of an angle of the leaked beam.
Abstract:
The invention provides a method and apparatus for determining the wavelength of a sample source of light, the apparatus having a reference light source of known wavelength, a collimator for collimating light from the sample source and from the reference source, a dispersing means for receiving and spatially dispersing collimated light from the collimator according to wavelength, focusing means for focusing dispersed light from the dispersing means, and a photodetector located in the focal plane of the focusing means and having an aperture for spatially selectively admitting light from the focusing means, and operable to provide a temporally calibratable output signal indicative of the wavelength of the selectively admitted light, wherein the apparatus is operable to scan the focused spatially dispersed beam across the aperture, and the photodetector output includes resolvable features corresponding to light from the reference source and sample source, whereby a time difference between the features is indicative of a wavelength difference between the light from the reference source and the sample source.
Abstract:
A microdensitometer system capable of micrometer resolution for reading radiochromic films, includes: a film holder for supporting a radio chromic film sample; a high-precision scanning stage including a monochromatic light source for illuminating the film sample; a CCD microscope camera for a photographing light from the light source that is transmitted through the film sample; and a microcomputer for analysing data relayed from the CCD microscope camera. The film sample is translated by the scanning stage to enable analysis of the whole film sample.
Abstract:
There is provided a mirror supporting structure for a monochromator capable of turning the mirrors about axis lines which cross each other, thereby adjusting the attachment angles of the mirrors in two directions. The mirror supporting structure for a monochromator comprises first angle adjusting means for turning the mirrors about each first axis line which does not cross each plane direction of the mirrors and second angle adjusting means for turning the mirrors about each second axis line which does not cross each plane direction of the mirrors at right angles but is parallel with a line crossing the first axis line. The first angle adjusting means comprises a first leg member and a second leg member which are disposed to be spaced from each other, and a support member installed between the first leg member and the second leg member and supporting the mirrors, and wherein the mirrors are supported by the support member in a manner that each plane direction of the mirrors does not cross the installing direction of the support member at right angles, and the support member can be turned about a line which is parallel with the installing direction of the support member.
Abstract:
In a light wavelength measuring instrument, a wavelength approximated to a wavelength of a light beam to be measured can be simply selected from light beams, whose spectrum distributions are previously known, as a measurement basis of a wavelength of the light beam to be measured. The light wavelength measuring instrument includes: a reference light source for emitting a reference light beam having a known spectrum distribution; a first spectrometer for spectrum-separating at least the reference light beam; a second spectrometer, having higher resolving power than that of the first spectrometer, for spectrum-separating the light beam to be measured and the reference light beam; and a detector for detecting both the light beam to be measured and the reference light beam emitted from the second spectrometer.
Abstract:
A microdensitometer arranged to scan an exposed film is coupled to a programmed computer. The computer analyses images captured through a microscope by a digital camera and to nullmapnull and indicate the optical density of the exposed film and distribution of density levels at any visible wavelength. This information, recorded in the exposed film, can be used to determine the actual exposure to which a patient has been subjected during X-ray treatment, where the film has been exposed to the X-rays during the treatment. If a film is sensitive to mechanical stress, the microdensitometer can also be used to yield mechanical stress distribution that has been applied to the film.
Abstract:
An imaging spectral device for use in the spectrum image analysis for performing the spectroscopic analysis of the respective points in two dimensional field is disclosed. The device comprises an imaging spectral device composing a white-light source to illuminate an object to be measured, a tunable filter located in the optical path between the object and the white-light source, a driving mechanism for wavelength scanning of the tunable filter, and a control unit in which scanning rate of transmitting wavelength of the tunable filter is controlled by the above-mentioned driving mechanism in such a manner that the spectral transmittance of the tunable filter integrated within the exposure time becomes desired spectral distribution of the object to be measured.
Abstract:
Inverting optics are used to invert, with respect to the dispersion plane, the wavefront of a monochromator employing a beam making more than one pass through the dispersing medium. Further, the inverting functionality can be turned-on or turned-off, thereby reversibly converting between additive and subtractive monochromator architectures. Inversion reversal is accomplished by reorienting the inverting optics orthogonally about an axis coaxial with the beam, either back and forth or monotonically, or by displacing portions or all of the inverting optics into and out of the beam. Examples of inverting optics include Dove prisms and equivalent multiple all-reflective surfaces. The system and method can be applied to two-pass and other multi-pass monochromators and to dual and other multiple serial monochromator configurations using diffraction gratings or other dispersing elements.
Abstract:
Inverting optics are used to invert, with respect to the dispersion plane, the wavefront of a monochromator employing a beam making more than one pass through the dispersing medium. Further, the inverting functionality can be turned-on or turned-off, thereby reversibly converting between additive and subtractive monochromator architectures. Inversion reversal is accomplished by rotating the inverting optics by 90 degrees coaxially with the beam, either back and forth or monotonically, or by translating portions or all of the inverting optics into and out of the beam. Examples of inverting optics include Dove prisms and equivalent multiple all-reflective surfaces. The system and method can be applied to two-pass and other multi-pass monochromators and to dual and other multiple serial monochromator configurations using diffraction gratings or other dispersing elements.
Abstract:
A fluorescence spectrophotometer having an excitation double monochromator, a coaxial excitation/emission light transfer module, and an emission double monochromator. Each monochromator includes a pair of holographic concave gratings mounted to precisely select a desired band of wavelengths from incoming broadband light without using other optical elements, such as mirrors. Selected excitation light is directed into a sample well by a light transfer module that includes a coaxial excitation mirror positioned to direct excitation light directly to the bottom of a well of a multi-well plate. Fluorescence emission light that exits the well opening is collected by a relatively large coaxial emission mirror. The collected emission light is wavelength selected by the emission double monochromator. Selected emission light is detected by a photodetector module.