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公开(公告)号:US10825532B2
公开(公告)日:2020-11-03
申请号:US16845387
申请日:2020-04-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Won-Bo Shim , Sang-Wan Nam , Ji-Ho Cho
Abstract: A method of operating a memory device includes performing a data read operation on at least one victim sub-block within a memory block containing a plurality of sub-blocks therein, in response to an erase command directed to a selected sub-block within the plurality of sub-blocks. Next, a soft program operation is performed on the at least one victim sub-block. This soft programming operation is then followed by an operation to erase the selected sub-block within the plurality of sub-blocks. This operation to erase the selected sub-block may include providing an erase voltage to a bulk region of a substrate on which the memory block extends, and the at least one victim sub-block may be disposed between the selected sub-block and the substrate.
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公开(公告)号:US10910077B2
公开(公告)日:2021-02-02
申请号:US16561570
申请日:2019-09-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ji-Sang Lee , Ji-Ho Cho , Byung-Soo Kim , Dong-Jin Shin
Abstract: An operation method of a nonvolatile memory device for programming memory cells connected to a selected word line, the method including: performing a program operation; suspending the program operation after performing a first portion of the program operation; and resuming the program operation to perform a second portion of the program operation, wherein the program operation is resumed within a reference time after the program operation is suspended.
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公开(公告)号:US20190392910A1
公开(公告)日:2019-12-26
申请号:US16561570
申请日:2019-09-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ji-Sang Lee , Ji-Ho Cho , Byung-Soo Kim , Dong-Jin Shin
Abstract: An operation method of a nonvolatile memory device for programming memory cells connected to a selected word line, the method including: performing a program operation; suspending the program operation after performing a first portion of the program operation; and resuming the program operation to perform a second portion of the program operation, wherein the program operation is resumed within a reference time after the program operation is suspended.
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公开(公告)号:US11056194B2
公开(公告)日:2021-07-06
申请号:US17036387
申请日:2020-09-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Won-Bo Shim , Sang-Wan Nam , Ji-Ho Cho
Abstract: A nonvolatile memory device includes a memory cell region, a peripheral circuit region, a memory block in the memory cell region, a row decoder in the peripheral circuit region, and a control circuit in the peripheral circuit region. The memory cell region includes a first metal pad. The peripheral circuit region includes a second metal pad and is vertically connected to the memory cell region by the first metal pad and the second metal pad. The memory block includes memory cells stacked in a direction intersecting a substrate, and is divided into a plurality of sub-blocks configured to be erased independently. The row decoder selects the memory block by units of a sub-block. The control circuit receives a data erase command for a selected sub-block among the plurality of sub-blocks, performs a data read operation on at least one victim sub-block among the plurality of sub-blocks in response to the data erase command, selectively performs a soft program operation on the at least one victim sub-block based on a result of the data read operation, and performs a data erase operation on the selected sub-block after the data read operation is performed and the soft program operation is selectively performed.
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公开(公告)号:US10658043B2
公开(公告)日:2020-05-19
申请号:US16164845
申请日:2018-10-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Won-Bo Shim , Sang-Wan Nam , Ji-Ho Cho
Abstract: A method of operating a memory device includes performing a data read operation on at least one victim sub-block within a memory block containing a plurality of sub-blocks therein, in response to an erase command directed to a selected sub-block within the plurality of sub-blocks. Next, a soft program operation is performed on the at least one victim sub-block. This soft programming operation is then followed by an operation to erase the selected sub-block within the plurality of sub-blocks. This operation to erase the selected sub-block may include providing an erase voltage to a bulk region of a substrate on which the memory block extends, and the at least one victim sub-block may be disposed between the selected sub-block and the substrate.
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公开(公告)号:US20210012840A1
公开(公告)日:2021-01-14
申请号:US17036387
申请日:2020-09-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Won-Bo Shim , Sang-Wan Nam , Ji-Ho Cho
Abstract: A nonvolatile memory device includes a memory cell region, a peripheral circuit region, a memory block in the memory cell region, a row decoder in the peripheral circuit region, and a control circuit in the peripheral circuit region. The memory cell region includes a first metal pad. The peripheral circuit region includes a second metal pad and is vertically connected to the memory cell region by the first metal pad and the second metal pad. The memory block includes memory cells stacked in a direction intersecting a substrate, and is divided into a plurality of sub-blocks configured to be erased independently. The row decoder selects the memory block by units of a sub-block. The control circuit receives a data erase command for a selected sub-block among the plurality of sub-blocks, performs a data read operation on at least one victim sub-block among the plurality of sub-blocks in response to the data erase command, selectively performs a soft program operation on the at least one victim sub-block based on a result of the data read operation, and performs a data erase operation on the selected sub-block after the data read operation is performed and the soft program operation is selectively performed.
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公开(公告)号:US20200243144A1
公开(公告)日:2020-07-30
申请号:US16845387
申请日:2020-04-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Won-Bo Shim , Sang-Wan Nam , Ji-Ho Cho
Abstract: A method of operating a memory device includes performing a data read operation on at least one victim sub-block within a memory block containing a plurality of sub-blocks therein, in response to an erase command directed to a selected sub-block within the plurality of sub-blocks. Next, a soft program operation is performed on the at least one victim sub-block. This soft programming operation is then followed by an operation to erase the selected sub-block within the plurality of sub-blocks. This operation to erase the selected sub-block may include providing an erase voltage to a bulk region of a substrate on which the memory block extends, and the at least one victim sub-block may be disposed between the selected sub-block and the substrate.
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公开(公告)号:US10431315B2
公开(公告)日:2019-10-01
申请号:US15825786
申请日:2017-11-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ji-Sang Lee , Ji-Ho Cho , Byung-Soo Kim , Dong-Jin Shin
Abstract: An operation method of a nonvolatile memory device for programming memory cells connected to a selected word line, the method including: performing a program operation; suspending the program operation after performing a first portion of the program operation; and resuming the program operation to perform a second portion of the program operation, wherein the program operation is resumed within a reference time after the program operation is suspended.
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