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1.
公开(公告)号:US20250040139A1
公开(公告)日:2025-01-30
申请号:US18794727
申请日:2024-08-05
Applicant: SANDISK TECHNOLOGIES LLC
Inventor: Fei ZHOU , Kartik SONDHI , Senaka KANAKAMEDALA , Wei CAO
Abstract: A memory device includes a semiconductor source line layer containing silicon and electrical dopants, an alternating stack of insulating layers and electrically conductive layers located over the semiconductor source line layer, a memory opening vertically extending through the alternating stack, and a memory opening fill structure located in the memory opening. The memory opening fill structure includes a memory film, a vertical semiconductor channel including silicon that is laterally surrounded by the memory film, and a silicon-germanium structure contacting an end portion of the vertical semiconductor channel and contacting the semiconductor source line.
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2.
公开(公告)号:US20240268115A1
公开(公告)日:2024-08-08
申请号:US18357702
申请日:2023-07-24
Applicant: SANDISK TECHNOLOGIES LLC
Inventor: Wei CAO , Xiang YANG , Koichi MATSUNO
CPC classification number: H10B43/27 , H01L24/08 , H01L24/80 , H01L25/0657 , H01L25/18 , H01L25/50 , H10B43/35 , H10B80/00 , H01L2224/08145 , H01L2224/80006 , H01L2224/80895 , H01L2224/80896 , H01L2924/1431 , H01L2924/14511
Abstract: A memory device includes an alternating stack of insulating layers and electrically conductive layers, a memory opening vertically extending through the alternating stack, a memory opening fill structure located in the memory opening and including a memory film and a vertical semiconductor channel including a first semiconductor material, and source structure including an interfacial source layer and a primary source layer. The interfacial source layer includes a second semiconductor material that has a different band gap from a band gap of the first semiconductor material and is in contact with an end portion of the vertical semiconductor channel. The primary source layer includes a third semiconductor material that has a different band gap from the band gap of the second semiconductor material, and the primary source layer is in contact with the interfacial source layer.
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