-
公开(公告)号:US20180047449A1
公开(公告)日:2018-02-15
申请号:US15614671
申请日:2017-06-06
申请人: SANG-WAN NAM , SANG-IN PARK
发明人: SANG-WAN NAM , SANG-IN PARK
IPC分类号: G11C16/08 , G11C8/06 , G11C11/4099 , G11C16/34 , G11C11/408
CPC分类号: G11C16/08 , G11C8/06 , G11C11/4082 , G11C11/4087 , G11C11/4099 , G11C16/10 , G11C16/34 , G11C16/3454 , G11C29/028 , H03K19/02
摘要: A nonvolatile memory device includes a memory cell array, a row decoder circuit, a page buffer circuit, and a control logic circuit. The control logic circuit controls the row decoder circuit and the page buffer circuit to perform: (1) a pre-program of sequentially selecting a plurality of memory blocks and increasing threshold voltages of string selection transistors or ground selection transistors of the selected memory block and (2) after the pre-program is completed, a main program of sequentially selecting the plurality of memory blocks, programming string selection transistors or ground selection transistors of the selected memory block, and performing a verification by using a verification voltage.