SEMICONDUCTOR PACKAGE CUTTING SYSTEM AND METHOD

    公开(公告)号:US20250087503A1

    公开(公告)日:2025-03-13

    申请号:US18824705

    申请日:2024-09-04

    Abstract: Provided is a semiconductor package cutting system including a cutting device for partial-cutting at least a portion of a strip including a plurality of semiconductor packages, an inspection device mounted at a side of the cutting device to supply a first strip to be cut to the cutting device and to receive and inspect a second strip cut by the cutting device, and a storage device mounted at a side of the inspection device to supply the first strip stored therein, to the inspection device and to receive and store the second strip inspected by the inspection device, wherein the inspection device includes an inspection table for placing the second strip thereon and moving the second strip along a first direction.

    SEMICONDUCTOR PACKAGE CUTTING SYSTEM AND METHOD

    公开(公告)号:US20250087504A1

    公开(公告)日:2025-03-13

    申请号:US18824861

    申请日:2024-09-04

    Abstract: Provided is a semiconductor package cutting system including a loading device storing at least one strip or at least one magazine containing the strip, a cutting device mounted behind the loading device to partial-cut at least a portion of the strip supplied from the loading device, an inspection device mounted behind the cutting device to inspect the strip cut by the cutting device, and an unloading device mounted behind the inspection device to unload the inspected strip.

    SEMICONDUCTOR PACKAGE CUTTING SYSTEM AND METHOD

    公开(公告)号:US20250083359A1

    公开(公告)日:2025-03-13

    申请号:US18824834

    申请日:2024-09-04

    Abstract: Provided is a semiconductor package cutting system including a cutting device for partial-cutting at least a portion of a strip including a plurality of semiconductor packages, an inspection device mounted behind the cutting device to supply a first strip to be cut to the cutting device and to receive and inspect a second strip cut by the cutting device, and a storage device mounted behind the inspection device to supply the first strip stored therein, to the inspection device and to receive and store the second strip inspected by the inspection device, wherein the inspection device includes an inspection table for placing the first or second strip thereon and moving the first strip along a first direction.

Patent Agency Ranking