FOCUS RING INSPECTION DEVICE AND FOCUS RING INSPECTION METHOD

    公开(公告)号:US20240159590A1

    公开(公告)日:2024-05-16

    申请号:US18507065

    申请日:2023-11-12

    CPC classification number: G01J5/0003 H01J37/32642 G01J2005/0077

    Abstract: Proposed is an inspection technology for inspecting a focus ring. A device and a method for inspecting the focus ring including a heat transfer member are proposed. The inspection device may include a housing configured to provide inspection space of the focus ring, with a predetermined area of an upper wall of the housing being formed of a transparent material, a hot plate provided in the housing and configured to heat treat the focus ring while the hot plate supports the focus ring, and an inspection unit configured to inspect a connection state between the focus ring and the heat transfer member by obtaining a thermal image of the focus ring after the focus ring is completely heat treated.

    SUBSTRATE PROCESSING APPARATUS AND METHOD OF FABRICATING SAME

    公开(公告)号:US20220139680A1

    公开(公告)日:2022-05-05

    申请号:US17408383

    申请日:2021-08-21

    Abstract: A substrate processing apparatus and a method of fabricating the same are proposed. A bonding layer, by which a chuck body and a base plate of an electrostatic chuck device are bonded, is completely covered using a double-sealing structure in which a covering member for preventing a processing gas from infiltrating into the bonding layer and a sealing member for preventing the bonding layer from being damaged are bonded to each other. The durability and the efficiency of the operation of the electrostatic chuck device are improved.

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