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公开(公告)号：US20240085336A1
公开(公告)日：2024-03-14
申请号：US18136750
申请日：2023-04-19
发明人： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Alberto Castro , Glenn Wikle , Lars Jacquemetton , Peter Campbell
摘要： This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
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公开(公告)号：US11674904B2
公开(公告)日：2023-06-13
申请号：US16915858
申请日：2020-06-29
发明人： Vivek R. Dave , Mark J. Cola , R. Bruce Madigan , Alberto Castro , Glenn Wikle , Lars Jacquemetton , Peter Campbell
摘要： This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
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公开(公告)号：US20240092016A1
公开(公告)日：2024-03-21
申请号：US18512691
申请日：2023-11-17
IPC分类号： B29C64/153 , B22F10/28 , B22F10/31 , B22F10/38 , B22F12/44 , B22F12/49 , B22F12/90 , B29C64/393 , B33Y10/00 , B33Y30/00 , B33Y40/00 , B33Y50/02
CPC分类号： B29C64/153 , B22F10/28 , B22F10/31 , B22F10/38 , B22F12/44 , B22F12/49 , B22F12/90 , B29C64/393 , B33Y10/00 , B33Y30/00 , B33Y40/00 , B33Y50/02 , B22F2003/245
摘要： This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
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公开(公告)号：US20230202100A1
公开(公告)日：2023-06-29
申请号：US18112146
申请日：2023-02-21
IPC分类号： B29C64/153 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B22F10/28 , B22F12/44 , B22F12/49 , B22F12/90 , B22F10/31 , B22F10/38 , B33Y40/00 , B29C64/393
CPC分类号： B29C64/153 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B22F10/28 , B22F12/44 , B22F12/49 , B22F12/90 , B22F10/31 , B22F10/38 , B33Y40/00 , B29C64/393 , B22F2003/245
摘要： This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
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公开(公告)号：US11607875B2
公开(公告)日：2023-03-21
申请号：US17409711
申请日：2021-08-23
IPC分类号： B22F12/00 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B29C64/153 , B29C64/393 , B22F10/28 , B22F12/44 , B22F12/49 , B22F12/90 , B22F10/31 , B22F10/38 , B33Y40/00 , B22F3/24 , B22F10/12 , B22F10/18 , B22F10/25 , B22F10/368
摘要： This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
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公开(公告)号：US11931956B2
公开(公告)日：2024-03-19
申请号：US17943651
申请日：2022-09-13
发明人： Vivek R. Dave , David D. Clark , Matias Roybal , Mark J. Cola , Martin S. Piltch , R. Bruce Madigan , Alberto Castro
IPC分类号： B29C64/153 , B22F10/00 , B22F10/20 , B22F10/28 , B22F10/31 , B22F10/36 , B22F10/368 , B22F12/90 , B29C64/386 , B33Y50/02 , G05B19/418 , B22F10/10 , B22F10/30 , B22F10/366 , B22F10/38 , B22F10/85 , B22F12/41 , B22F12/44 , B22F12/49 , B29C64/393
CPC分类号： B29C64/153 , B22F10/00 , B22F10/20 , B22F10/28 , B22F10/31 , B22F10/36 , B22F10/368 , B22F12/90 , B29C64/386 , B33Y50/02 , G05B19/41875 , B22F10/10 , B22F10/30 , B22F10/366 , B22F10/38 , B22F10/85 , B22F12/41 , B22F12/44 , B22F12/49 , B22F2999/00 , B29C64/393 , G05B2219/32194 , Y02P10/25 , B22F2999/00 , B22F10/368 , B22F2203/11 , B22F2203/03
摘要： This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
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公开(公告)号：US11858207B2
公开(公告)日：2024-01-02
申请号：US18112146
申请日：2023-02-21
IPC分类号： B29C64/153 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B22F10/28 , B22F12/44 , B22F12/49 , B22F12/90 , B22F10/31 , B22F10/38 , B33Y40/00 , B29C64/393 , B22F3/24 , B22F10/12 , B22F10/18 , B22F10/25 , B22F10/368
CPC分类号： B29C64/153 , B22F10/28 , B22F10/31 , B22F10/38 , B22F12/44 , B22F12/49 , B22F12/90 , B29C64/393 , B33Y10/00 , B33Y30/00 , B33Y40/00 , B33Y50/02 , B22F10/12 , B22F10/18 , B22F10/25 , B22F10/368 , B22F2003/245 , Y02P10/25
摘要： This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
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8.发明申请公开(公告)号：US20230127650A1
公开(公告)日：2023-04-27
申请号：US17895904
申请日：2022-08-25
IPC分类号： B23K31/12 , B33Y30/00 , B22F10/28 , B22F12/90 , B22F10/366 , B22F10/368 , B23K26/342
摘要： This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.
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