Abstract:
A technique for tracking changes in bias conditions of a microelectromechanical system (MEMS) device includes applying an electrode bias signal to an electrode of the MEMS device. The technique includes applying a mass bias signal to a mass of the MEMS device suspended from a substrate of the MEMS device. The technique includes generating the mass bias signal based on a target mass-to-electrode bias signal level and a signal level of the electrode bias signal.
Abstract:
A fractional-N divider supplies a divided clock signal. An adjusted divided clock signal is generated in a digital-to-time converter circuit having a delay linearly proportional to digital quantization errors of the fractional-N divider. The adjusted divided clock signal is generated based on first and second capacitors charging to a predetermined level. The charging of the first and second capacitors is interleaved in alternate periods of the divided clock. The charging of each capacitor with a current corresponding to respective digital quantization errors is interleaved with charging with a fixed current. A first edge of a first pulse of the adjusted divided clock signal is generated in response to the first capacitor charging to a predetermined voltage and a first edge of a next pulse of the adjusted divided clock signal is generated in response to the second capacitor charging to the predetermined voltage.
Abstract:
An apparatus includes a microelectromechanical system (MEMS) device configured as part of an oscillator. The MEMS device includes a mass suspended from a substrate of the MEMS, a first electrode configured to provide a first signal based on a displacement of the mass, and a second electrode configured to receive a second signal based on the first signal. The apparatus includes an amplifier coupled to the first electrode and a first node. The amplifier is configured to generate an output signal, the output signal being based on the first signal and a first gain. The apparatus includes an attenuator configured to attenuate the output signal based on a second gain and provide as the second signal an attenuated version of the output signal.
Abstract:
An apparatus includes a microelectromechanical system (MEMS) device configured as part of an oscillator. The MEMS device includes a mass suspended from a substrate of the MEMS, a first electrode configured to provide a first signal based on a displacement of the mass, and a second electrode configured to receive a second signal based on the first signal. The apparatus includes an amplifier coupled to the first electrode and a first node. The amplifier is configured to generate an output signal, the output signal being based on the first signal and a first gain. The apparatus includes an attenuator configured to attenuate the output signal based on a second gain and provide as the second signal an attenuated version of the output signal.
Abstract:
A fractional-N divider supplies a divided clock signal. An adjusted divided clock signal is generated in a digital-to-time converter circuit having a delay linearly proportional to digital quantization errors of the fractional-N divider. The adjusted divided clock signal is generated based on first and second capacitors charging to a predetermined level. The charging of the first and second capacitors is interleaved in alternate periods of the divided clock. The charging of each capacitor with a current corresponding to respective digital quantization errors is interleaved with charging with a fixed current. A first edge of a first pulse of the adjusted divided clock signal is generated in response to the first capacitor charging to a predetermined voltage and a first edge of a next pulse of the adjusted divided clock signal is generated in response to the second capacitor charging to the predetermined voltage.
Abstract:
A technique for tracking changes in bias conditions of a microelectromechanical system (MEMS) device includes applying an electrode bias signal to an electrode of the MEMS device. The technique includes applying a mass bias signal to a mass of the MEMS device suspended from a substrate of the MEMS device. The technique includes generating the mass bias signal based on a target mass-to-electrode bias signal level and a signal level of the electrode bias signal.