IMAGING DEVICE AND ELECTRONIC DEVICE
    1.
    发明申请

    公开(公告)号:US20200314368A1

    公开(公告)日:2020-10-01

    申请号:US16307250

    申请日:2017-06-07

    摘要: The present disclosure relates to an imaging device and an electronic device capable of restricting an occurrence of a sunspot phenomenon in a simple configuration. The imaging device includes: a sample/hold part configured to sample and hold a reset voltage as a reset level voltage of a pixel signal; and an AD conversion part configured to analog digital (AD) convert the pixel signal, in which the AD conversion part selects and outputs one of a first output signal as the AD converted pixel signal and a second output signal at a predetermined level on the basis of a comparison result between the reset voltage held by the sample/hold part and a predetermined reference voltage. The technology according to the present disclosure can be applied to a CMOS image sensor, for example.

    SOLID-STATE IMAGING DEVICE AND IMAGING SYSTEM

    公开(公告)号:US20240305908A1

    公开(公告)日:2024-09-12

    申请号:US18546638

    申请日:2022-01-31

    摘要: A solid-state imaging device (100) includes a pixel unit (101), a first acquisition unit (108A), and a second acquisition unit (108B). The pixel unit (101) includes a plurality of sets (110) of a first pixel (110A) and a second pixel (110B). The sets (110) of the first pixel (110A) and the second pixel (110B) are arranged in a pixel region. The first pixel (110A) receives light other than visible light. The second pixel (110B) receives the visible light. The first acquisition unit (108A) acquires a first signal from the first pixel (110A). The second acquisition unit (108B) acquires a second signal from the second pixel (110B) when an object (ob) within a predetermined distance range (R0) is detected based on the first signal.

    PHOTODETECTION CIRCUIT AND DISTANCE MEASURING DEVICE

    公开(公告)号:US20230231060A1

    公开(公告)日:2023-07-20

    申请号:US18000809

    申请日:2021-05-14

    发明人: YASUNORI TSUKUDA

    IPC分类号: H01L31/02 H01L31/107 G01J1/44

    摘要: There is provided a photodetection circuit capable of improving distance measuring performance.
    The photodetection circuit according to an embodiment of the present disclosure includes: an avalanche photodiode; a charging circuit that supplies a voltage to the avalanche photodiode; an input amplifier including a comparison circuit in which a voltage level of an output terminal changes according to a comparison result between a voltage of an input terminal connected to the avalanche photodiode and a reference voltage, and a voltage control circuit that changes a potential of the reference voltage; and a state detecting circuit that sets timing for causing the voltage control circuit to change the potential of the reference voltage on the basis of a detection result of the voltage level.

    SOLID-STATE IMAGING ELEMENT AND ELECTRONIC DEVICE

    公开(公告)号:US20230112018A1

    公开(公告)日:2023-04-13

    申请号:US17906126

    申请日:2020-12-15

    摘要: In a solid-state imaging element that measures a distance on the basis of a light receiving timing of reflected light, the shortest distance that can be measured is shortened. A photoelectric conversion region generates charges through photoelectric conversion. A multiplication region multiplies the generated charges. An output electrode outputs the multiplied charges. A detection circuit detects the presence or absence of photons contained in reflected light with respect to radiation light on the basis of the charges output from the output electrode. An additional electrode discharges the charges from the photoelectric conversion region in a case where a predetermined potential is applied to the additional electrode. A control circuit applies the predetermined potential to the additional electrode at a radiation timing when the radiation light is radiated.

    OBSERVATION APPARATUS, OBSERVATION METHOD, AND DISTANCE MEASUREMENT SYSTEM

    公开(公告)号:US20230046614A1

    公开(公告)日:2023-02-16

    申请号:US17758293

    申请日:2020-12-28

    发明人: YASUNORI TSUKUDA

    IPC分类号: G01C3/06 G01S7/4861

    摘要: The present technology relates to an observation apparatus, an observation method, and a distance measurement system capable of improving distance measurement accuracy. A first measurement unit that measures a first number of reactions of a light receiving element in response to incidence of photons on a first pixel, a second measurement unit that measures a second number of reactions of the light receiving element in response to incidence of photons on a second pixel, a light emitting unit that emits light to the second pixel, and a light emission control unit that controls the light emitting unit according to a difference between the first number of reactions and the second number of reactions are included. The present technology can be applied to, for example, a distance measurement apparatus that measures a distance to a predetermined object, and can be applied to an observation apparatus that observes a characteristic of a pixel included in the distance measurement apparatus.

    IMAGING APPARATUS AND INFORMATION PROCESSING APPARATUS

    公开(公告)号:US20230387175A1

    公开(公告)日:2023-11-30

    申请号:US18249356

    申请日:2021-10-01

    发明人: YASUNORI TSUKUDA

    IPC分类号: H01L27/146

    摘要: An imaging apparatus according to the present technology includes a plurality of photoelectric conversion units, each including a photoelectric conversion element that performs photoelectric conversion with light in a different wavelength region, the photoelectric conversion units being stacked in a light incident direction, and a charge holding unit that holds charges accumulated in the photoelectric conversion element in the different photoelectric conversion units.

    RANGING DEVICE AND RANGING SYSTEM
    8.
    发明公开

    公开(公告)号:US20230204770A1

    公开(公告)日:2023-06-29

    申请号:US18001051

    申请日:2021-06-03

    发明人: YASUNORI TSUKUDA

    摘要: A ranging device according to the present disclosure includes an avalanche photodiode (APD) (10), a first histogram generating section (24), an element operating section (26), a second histogram generating section (31), and a calculating section (25). The first histogram generating section (24) generates a first histogram that is a histogram of time from a timing at which a light source emits light to a timing at which the APD (10) receives the light. The element operating section (26) enables operation of the APD (10) on the basis of an enable signal (S1). The second histogram generating section (31) generates a second histogram that is a histogram of time from a timing at which the enable signal (S1) is switched to a timing at which the APD (10) is brought into a valid state. The calculating section (25) calculates a distance (D) to an object to be measured (X) on the basis of at least one of the first histogram or the second histogram.

    IMAGING ELEMENT, DRIVING METHOD, AND ELECTRONIC EQUIPMENT

    公开(公告)号:US20210337156A1

    公开(公告)日:2021-10-28

    申请号:US16319109

    申请日:2017-07-21

    摘要: The present disclosure relates to an imaging element, a driving method, and electronic equipment that enable imaging to be performed at higher speed. The imaging element includes a pixel array in which a plurality of pixels are arranged in a matrix shape, an AD converter that performs AD conversion in parallel on pixel signals that have been output from the plurality of pixels for each column of the plurality of pixels arranged in the pixel array, and a reference signal generator that generates a reference signal that the AD converter refers to when the AD converter performs AD conversion on a pixel signal for an identical pixel signal, the reference signal having a waveform that includes a slope having a constant gradient. Then, when the AD converter performs, on the identical pixel signal, multi-sampling for performing sampling during a P-phase period and sampling during a D-phase period at least once or more, the reference signal generator generates a reference signal in which, from among a plurality of slopes during the D-phase period, a sampling period of a second slope has been set to be shorter than a sampling period of a first slope. The present technology is applicable, for example, to a CMOS image sensor including a column-parallel ADC.