Systems and methods for analyzing stability using metal resistance variations

    公开(公告)号:US11132178B2

    公开(公告)日:2021-09-28

    申请号:US16856887

    申请日:2020-04-23

    申请人: STC.UNM

    发明人: James Plusquellic

    摘要: This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

    Privacy-preserving, mutual PUF-based authentication protocol

    公开(公告)号:US10956557B2

    公开(公告)日:2021-03-23

    申请号:US16067757

    申请日:2017-01-11

    申请人: STC.UNM

    摘要: An authentication protocol using a Hardware-Embedded Delay PUF (“HELP”), which derives randomness from within-die path delay variations that occur along the paths within a hardware implementation of a cryptographic primitive, for example, the Advanced Encryption Standard (“AES”) algorithm or Secure Hash Algorithm 3 (“SHA-3”). The digitized timing values which represent the path delays are stored in a database on a secure server (verifier) as an alternative to storing PUF response bitstrings thereby enabling the development of an efficient authentication protocol that provides both privacy and mutual authentication.

    SYSTEMS AND METHODS FOR ANALYZING STABILITY USING METAL RESISTANCE VARIATIONS

    公开(公告)号:US20200293288A1

    公开(公告)日:2020-09-17

    申请号:US16856887

    申请日:2020-04-23

    申请人: STC.UNM

    发明人: James Plusquellic

    摘要: This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

    Systems and methods for analyzing stability using metal resistance variations

    公开(公告)号:US10048939B2

    公开(公告)日:2018-08-14

    申请号:US14907423

    申请日:2014-08-28

    申请人: STC.UNM

    发明人: James Plusquellic

    摘要: This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

    System and methods for entropy and statistical quality metrics in physical unclonable function generated bitstrings

    公开(公告)号:US11095461B2

    公开(公告)日:2021-08-17

    申请号:US16346772

    申请日:2017-11-03

    申请人: STC.UNM

    摘要: The Distribution Effect is proposed for the HELP PUF that is based on purposely introducing biases in the mean and range parameters of path delay distributions to enhance entropy. The biased distributions are then used in the bitstring construction process to introduce differences in the bit values associated with path delays that would normally remain fixed. Offsets are computed to fine tune a token's digitized path delays as a means of maximizing entropy and reproducibility in the generated bitstrings: a first population-based offset method computes median values using data from multiple tokens (i.e., the population) and a second chip-specific technique is proposed which fine tunes path delays using enrollment data from the authenticating token.

    Reliability enhancement methods for physically unclonable function bitstring generation

    公开(公告)号:US10366253B2

    公开(公告)日:2019-07-30

    申请号:US15534116

    申请日:2015-12-15

    申请人: STC.UNM

    发明人: James Plusquellic

    摘要: A Hardware-Embedded Delay Physical Unclonable Function (“HELP PUF”) leverages entropy by monitoring path stability and measuring path delays from core logic macros. Reliability and security enhancing techniques for the HELP PUF reduce bit flip errors during regeneration of the bitstring across environmental variations and improve cryptographic strength along with the corresponding difficulty of carrying out model building attacks. A voltage-based enrollment process screens unstable paths on normally synthesized (glitchy) functional units and reduces bit flip errors by carrying out enrollment at multiple supply voltages controlled using on-chip voltage regulators.