公开(公告)号：US20190101699A1

公开(公告)日：2019-04-04

申请号：US16148535

申请日：2018-10-01

Applicant: STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Nicolas MICHIT ,  Patrick LE MAITRE

IPC: G02B6/293

CPC classification number: G02B6/29343 ,  G02B6/3546 ,  G02B6/3596 ,  G02B2006/12145 ,  G02B2006/12147 ,  H04Q11/0005 ,  H04Q2011/0007

Abstract: A photonic interconnection elementary switch is integrated in an optoelectronic chip/The switch includes first and second linear optical waveguides which intersect to form a first intersection. Two first photonic redirect ring resonators are respectively coupled to the first and second optical waveguides. Two second photonic redirect ring resonators are respectively coupled to the first and second optical waveguides. A third linear optical waveguide is coupled to one of the first ring resonators and one of the second ring resonators. A fourth linear optical waveguide is coupled to another of the first resonators and to another of the second ring resonators. A base switch, complex switch, and photonic interconnection network integrated in an optoelectronic chip, include at least two of the photonic interconnection elementary switches.

公开(公告)号：US20190113415A1

公开(公告)日：2019-04-18

申请号：US16211511

申请日：2018-12-06

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe GROSSE ,  Patrick LE MAITRE ,  Jean-Francois CARPENTIER

IPC: G01M11/02 ,  G01R31/311 ,  G02B6/28 ,  G02B6/12 ,  G02B6/00 ,  G01R35/00 ,  G01R31/265 ,  G02B6/34 ,  G01R31/303 ,  G01R31/28 ,  G01R31/27 ,  G01R31/317

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US20190079247A1

公开(公告)日：2019-03-14

申请号：US16123829

申请日：2018-09-06

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Nicolas MICHIT ,  Patrick LE MAITRE

IPC: G02B6/293

Abstract: A photonic interconnect switch is formed by first and second linear optical waveguides that cross to form an intersection. First and second redirecting photonic ring resonators are coupled together in an intermediate optical coupling zone and are controllable with an electrical signal. The first ring resonator is coupled to the first optical waveguide in a first optical coupling zone. The second ring resonator is coupled to the second optical waveguide in a second optical coupling zone.

公开(公告)号：US20200256759A1

公开(公告)日：2020-08-13

申请号：US16863303

申请日：2020-04-30

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe GROSSE ,  Patrick LE MAITRE ,  Jean-Francois CARPENTIER

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G02B6/00 ,  G01M11/00 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US20190162906A1

公开(公告)日：2019-05-30

申请号：US16199845

申请日：2018-11-26

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Nicolas MICHIT ,  Patrick LE MAITRE

IPC: G02B6/293 ,  G02B6/42

Abstract: An elementary photonic interconnect switch is integrated into an optoelectronic chip and includes four simple photonic interconnect switches. Each simple photonic interconnect switch has two optical waveguides that cross and are linked by a ring resonator having one ring. A basic photonic interconnect switch, a complex photonic interconnect switch and/or a photonic interconnect network are integrated into an optoelectronic chip and including at least two elementary photonic interconnect switches.