公开(公告)号：US11187613B2

公开(公告)日：2021-11-30

申请号：US16863303

申请日：2020-04-30

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe Grosse ,  Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G02B6/00 ,  G01M11/00 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US10677684B2

公开(公告)日：2020-06-09

申请号：US16211511

申请日：2018-12-06

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe Grosse ,  Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G02B6/00 ,  G01M11/00 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US10180373B2

公开(公告)日：2019-01-15

申请号：US15489127

申请日：2017-04-17

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe Grosse ,  Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00 ,  G02B6/00

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US11680870B2

公开(公告)日：2023-06-20

申请号：US17516165

申请日：2021-11-01

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe Grosse ,  Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G02B6/00 ,  G01M11/00 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00

CPC classification number: G01M11/02 ,  G01M11/33 ,  G01R31/2656 ,  G01R31/27 ,  G01R31/2884 ,  G01R31/303 ,  G01R31/311 ,  G01R31/31728 ,  G01R35/00 ,  G02B6/00 ,  G02B6/12004 ,  G02B6/2808 ,  G02B6/34

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US20170307687A1

公开(公告)日：2017-10-26

申请号：US15489127

申请日：2017-04-17

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe Grosse ,  Patrick Le Maitre ,  Jean-Francois Carpentier

IPC: G01R31/317 ,  G01R31/27 ,  G01R31/311 ,  G01R31/28 ,  G01R31/303 ,  G01R35/00 ,  G01R31/265

CPC classification number: G01M11/02 ,  G01M11/33 ,  G01R31/2656 ,  G01R31/27 ,  G01R31/2884 ,  G01R31/303 ,  G01R31/311 ,  G01R31/31728 ,  G01R35/00 ,  G02B6/00 ,  G02B6/12004 ,  G02B6/2808 ,  G02B6/34

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.