Abstract:
An electrically erasable and programmable memory includes a memory array having memory cells connected to word lines and bit lines. The bit lines are arranged in columns. The memory also includes read circuits connected to the bit lines and programming latches connecting the bit lines to a programming line. The memory includes a device to break the conductive paths connecting the memory cells of a column to the read circuits when data has been loaded into the latches of the column, without breaking the conductive paths that connect the latches of the column to the read circuits.
Abstract:
A bias circuit integrated on a silicon wafer includes first, second and third branches. The first branch includes a first PMOS transistor in series with a first NMOS transistor. The second branch includes a second PMOS transistor, a second NMOS transistor and an electric resistor in series. The gate of the first NMOS transistor is connected to the gate of the second NMOS transistor. The first branch and the second branch are arranged as a current mirror. The third branch includes a third PMOS transistor in series with a third NMOS transistor. The third PMOS and NMOS transistors are arranged to maintain a drain voltage of the first PMOS transistor that is substantially identical to a drain voltage of the second PMOS transistor.
Abstract:
A bias device includes a first branch and a second branch. The first branch includes a first bipolar device and a corresponding bias circuit. The second branch includes a second bipolar device and a corresponding bias circuit. A self-bias circuit is connected to the first and second branches. A first current generator injects a first auxiliary current into the first bipolar device. A second current generator injects a second current into the second bipolar device that is equal or proportional to the first auxiliary current. The bias device stabilizes the operating point of a circuit.