公开(公告)号：US20140312925A1

公开(公告)日：2014-10-23

申请号：US14258911

申请日：2014-04-22

Applicant: STMicroelectronics S.r.l.

Inventor： Fabiano FRIGOLI ,  Giuseppe BALLOTTA ,  Massimo GREPPI ,  Luca Giuseppe FALORNI ,  Paolo ARANZULLA

IPC: G01R1/04

CPC classification number: G01R31/2887 ,  G01R1/0408 ,  G01R1/0483 ,  G01R31/2891 ,  G01R31/2893

Abstract: An embodiment of a device for positioning a miniaturized piece, including: a positioning structure, which forms a first cavity, designed to receive with play the miniaturized piece, and a second cavity communicating with the first cavity; at least one electrical-contact terminal, facing the second cavity and electrically coupleable to an electronic testing device, designed to carry out an electrical test on the miniaturized piece; and an actuator device, which causes a vibration of the positioning structure, the vibration being such that the miniaturized piece translates, in use, towards the second cavity, until it penetrates at least in part into the second cavity.

Abstract translation: 一种用于定位小型化件的装置的实施例，包括：定位结构，其形成第一腔体，设计成用于放置小型化件接收，以及与第一腔体连通的第二腔室; 至少一个电接触端子，面向第二腔并电耦合到电子测试装置，设计用于对小型化件进行电测试; 以及致动器装置，其引起定位结构的振动，振动使得小型化件在使用中朝向第二腔平移，直到其至少部分地进入第二腔。

公开(公告)号：US20200003831A1

公开(公告)日：2020-01-02

申请号：US16451660

申请日：2019-06-25

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Paolo ARANZULLA ,  Fabiano FRIGOLI ,  Massimo GREPPI ,  Marco CAMERANI ,  Sebastiano CONTI ,  Guglielmo ROCCASALVO ,  Enrico Rosario ALESSI ,  Massimiliano PESATURO

IPC: G01R31/28 ,  G01M3/32

Abstract: A method for testing the hermetic seal of a packaged device, which includes: a package that delimits a device chamber; and a transducer device, which is arranged within the device chamber and generates an electrical signal indicating at least one physical quantity external to the package. The testing method includes the steps of: imposing a reference pressure in the device chamber; arranging the packaged device in a testing chamber in which a testing pressure is present, different from the reference pressure; and subsequently detecting possible pressure variations within the device chamber.