公开(公告)号：US20220278472A1

公开(公告)日：2022-09-01

申请号：US17636347

申请日：2020-08-14

Applicant: SUZHOU HYC TECHNOLOGY CO., LTD.

Inventor： Jianye Xu ,  Bin Jiang

IPC: H01R13/24 ,  H01R13/629 ,  H01R13/40 ,  G01R1/04

Abstract: The present disclosure provides an electrical connector and a device for testing conduction which relate to the field of testing devices. By providing a first contact end having a planar structure, the contact area between the electrical connector and a testing substrate is increased, and a large current can be conducted and damage to the product and device is avoided. A second contact end is a point or linear structure, and when poor contact is caused due to the uneven testing substrate or oxidization of the testing substrate, effective contact and electrical connection with the testing substrate can be achieved, to improve the effectiveness of an electrical connection.

公开(公告)号：US11973289B2

公开(公告)日：2024-04-30

申请号：US17636347

申请日：2020-08-14

Applicant: SUZHOU HYC TECHNOLOGY CO., LTD.

Inventor： Jianye Xu ,  Bin Jiang

IPC: H01R13/24 ,  G01R1/04 ,  H01R13/40 ,  H01R13/629

CPC classification number: H01R13/2464 ,  G01R1/0416 ,  H01R13/2428 ,  H01R13/40 ,  H01R13/629 ,  H01R2201/20

Abstract: The present disclosure provides an electrical connector and a device for testing conduction which relate to the field of testing devices. By providing a first contact end having a planar structure, the contact area between the electrical connector and a testing substrate is increased, and a large current can be conducted and damage to the product and device is avoided. A second contact end is a point or linear structure, and when poor contact is caused due to the uneven testing substrate or oxidization of the testing substrate, effective contact and electrical connection with the testing substrate can be achieved, to improve the effectiveness of an electrical connection.

公开(公告)号：US11860191B2

公开(公告)日：2024-01-02

申请号：US17608144

申请日：2020-06-19

Applicant: SUZHOU HYC TECHNOLOGY CO., LTD.

Inventor： Bin Jiang ,  Yue Liu ,  Hao Li

IPC: G01R1/07 ,  G01R1/073

CPC classification number: G01R1/07307

Abstract: The present disclosure discloses a probe module, comprising: a body, a floating plate located at the bottom of the body and a probe assembly located on the side of the body which is far away from the floating plate. The probe assembly includes a cover plate, a mould core comprising pin grooves and blade pins each limited and fixed in the pin groove by a limiting member. The floating plate comprises pin holes, and the floating plate is configured to be floatable relative to the body in an extension direction of the blade pin and electrical contact terminals of the blade pins may be inserted into the pin holes from the surface of the floating plate close to the body and protrude from the surface of the floating plate which is far away from the body.

公开(公告)号：US20220229090A1

公开(公告)日：2022-07-21

申请号：US17608144

申请日：2020-06-19

Applicant: SUZHOU HYC TECHNOLOGY CO., LTD.

Inventor： Bin Jiang ,  Yue Liu ,  Hao Li

IPC: G01R1/073

Abstract: The present disclosure discloses a probe module, comprising: a body, a floating plate located at the bottom of the body and a probe assembly located on the side of the body which is far away from the floating plate. The probe assembly includes a cover plate, a mould core comprising pin grooves and blade pins each limited and fixed in the pin groove by a limiting member. The floating plate comprises pin holes, and the floating plate is configured to be floatable relative to the body in an extension direction of the blade pin and electrical contact terminals of the blade pins may be inserted into the pin holes from the surface of the floating plate close to the body and protrude from the surface of the floating plate which is far away from the body.