LIQUID CRYSTAL DISPLAY AND METHOD OF MANUFACTURING THE SAME
    2.
    发明申请
    LIQUID CRYSTAL DISPLAY AND METHOD OF MANUFACTURING THE SAME 有权
    液晶显示器及其制造方法

    公开(公告)号:US20150168777A1

    公开(公告)日:2015-06-18

    申请号:US14282310

    申请日:2014-05-20

    Abstract: An exemplary embodiment provides a liquid crystal display including: a substrate; a first wire grid polarizer; a thin film transistor; a pixel electrode; a roof layer; and a plurality of microcavities. The substrate has a bottom surface and a top surface. The first wire grid polarizer is disposed on the bottom surface of the substrate. The thin film transistor is disposed on the top surface of the substrate. The pixel electrode is connected to the thin film transistor. The roof layer is disposed to face the pixel electrode. The plurality of microcavities having injection holes are formed between the pixel electrode and the roof layer, the microcavities forming a liquid crystal layer containing liquid crystal molecules.

    Abstract translation: 一个示例性实施例提供一种液晶显示器,包括:基板; 第一线栅偏振器; 薄膜晶体管; 像素电极; 屋顶层; 和多个微腔。 衬底具有底表面和顶表面。 第一线栅偏振器设置在基板的底表面上。 薄膜晶体管设置在基板的顶表面上。 像素电极连接到薄膜晶体管。 屋顶层设置成面对像素电极。 在像素电极和屋顶层之间形成具有注入孔的多个微腔,形成含有液晶分子的液晶层的微腔。

    DISPLAY DEVICE
    3.
    发明公开
    DISPLAY DEVICE 审中-公开

    公开(公告)号:US20240224731A1

    公开(公告)日:2024-07-04

    申请号:US18529575

    申请日:2023-12-05

    Inventor: Jong Soo LEE

    Abstract: A display device according to an embodiment includes a display panel including a main display area that displays images and an edge region disposed adjacent to the main display area; a protection film disposed below the display panel; and at least one additional layer disposed below the protection film, wherein the edge region includes a corner portion disposed on a corner, and the at least one additional layer overlap the corner portion and are spaced from each other.

    DEVICE FOR EVALUATING CRYSTALLINITY AND METHOD OF EVALUATING CRYSTALLINITY
    4.
    发明申请
    DEVICE FOR EVALUATING CRYSTALLINITY AND METHOD OF EVALUATING CRYSTALLINITY 审中-公开
    用于评估结晶度的装置和评估结晶性的方法

    公开(公告)号:US20170074806A1

    公开(公告)日:2017-03-16

    申请号:US15097514

    申请日:2016-04-13

    Abstract: A device for evaluating crystallinity includes a substrate holder configured to fix a polycrystalline silicon substrate thereon, a light source disposed below the substrate holder, a circular polarizing plate disposed above the polycrystalline silicon substrate, and a camera disposed above the circular polarizing plate and configured to capture an image transmitted through the circular polarizing plate.

    Abstract translation: 一种用于评价结晶度的装置,其特征在于,具备将多晶硅基板固定在其上的基板保持器,设置在基板保持架的下方的光源,设置在多晶硅基板的上方的圆偏振板,配置在圆偏振板的上方的照相机, 拍摄通过圆偏振片透射的图像。

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