-
公开(公告)号:US20210026245A1
公开(公告)日:2021-01-28
申请号:US16801613
申请日:2020-02-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Byounghoon Lee , Yongseok Jung , Jumi Bang , Byoungsup Ahn
IPC: G03F7/095 , H01L21/027 , H01L21/311 , H01L21/3213 , H01L21/308 , G03F7/16 , G03F7/20 , G03F7/26
Abstract: Disclosed are methods of forming a pattern and methods of fabricating a semiconductor device. A method of fabricating a semiconductor device may include providing a substrate comprising a resist layer on the substrate and coating a compound on the resist layer to form a charge dissipation layer. The charge dissipation layer may include a conductive polymer and a metal complex.
-
2.
公开(公告)号:US10115562B2
公开(公告)日:2018-10-30
申请号:US15252828
申请日:2016-08-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Suyoung Lee , Tamamushi Shuichi , Byunggook Kim , Byoungsup Ahn
IPC: H01J37/302 , H01J37/04 , H01J37/317
Abstract: A system includes an aperture array comprising a plurality of active apertures, respective ones of the active apertures configured to selectively deflect beams passing therethrough. The system also includes a limiting aperture configured to pass beams not deflected by the active apertures to a target object. The system further includes a control circuit configured to control the active apertures to provide first and second different exposure duration resolutions.
-
公开(公告)号:US11333979B2
公开(公告)日:2022-05-17
申请号:US16801613
申请日:2020-02-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Byounghoon Lee , Yongseok Jung , Jumi Bang , Byoungsup Ahn
IPC: G03F7/095 , H01L21/027 , H01L21/311 , H01L21/3213 , H01L21/308 , G03F7/16 , G03F7/20 , G03F7/26
Abstract: Disclosed are methods of forming a pattern and methods of fabricating a semiconductor device. A method of fabricating a semiconductor device may include providing a substrate comprising a resist layer on the substrate and coating a compound on the resist layer to form a charge dissipation layer. The charge dissipation layer may include a conductive polymer and a metal complex.
-
-