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公开(公告)号：US20250027875A1
公开(公告)日：2025-01-23
申请号：US18775796
申请日：2024-07-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jinwoo Lee , Seungryeol Oh , Hidong Kwak , Jeongho Ahn , Seongsil Lee , Suyoung Lee , Hyeongcheol Lee
IPC: G01N21/31
Abstract: An optical imaging device includes a pulse generator including a pulse generating device configured to generate pulse lasers and a pulse expander configured to receive a pulse laser from the pulse generating device, and generate a broadened pulse laser by expanding a spectrum and width of the received pulse laser, an optical assembly including an objective lens configured to receive the broadened pulse laser and pass the received broadened pulse laser to a target object, and a light receiver including a light receiving device configured to receive a reflected pulse laser corresponding to the broadened pulse laser reflected from the target object and convert the reflected pulse laser into an electrical signal, and at least one processor configured to generate a spectral image set based on the electrical signal generated by the light receiving device.
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公开(公告)号：US11611708B2
公开(公告)日：2023-03-21
申请号：US17385601
申请日：2021-07-26
Applicant: Samsung Electronics Co., Ltd.
Inventor： Eunjik Yi , Sooman Jeong , Heeshin Kim , Hwansun Sung , Suyoung Lee , Jeongwook Lee
Abstract: A method of operating a digital image stabilization apparatus including acquiring motion information by a first camera for capturing an image of a first field of view, controlling a prism of a second camera using the motion information, acquiring a main image and a peripheral image by a second camera for capturing an image of a second field of view, the second field of view being narrower than the first field of view, and generating a stabilized frame image related to the main image using the motion information and the peripheral image may be provided.
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公开(公告)号：US11754517B2
公开(公告)日：2023-09-12
申请号：US17175173
申请日：2021-02-12
Applicant: Samsung Electronics Co., Ltd.
Inventor： Suyoung Lee , Jongmin Kim , Ilsuk Park , Kwangil Shin , Chungsam Jun
IPC: G06K9/00 , G01N23/225 , G01N23/221 , G06T7/00
CPC classification number: G01N23/225 , G01N23/221 , G06T7/001 , G01N2223/401 , G01N2223/6116 , G01N2223/6462 , G06T2207/30148
Abstract: An inspection apparatus and a method of inspecting a semiconductor device are disclosed. The inspection apparatus includes a stage on which a semiconductor device is positioned, a first light source irradiating a high-frequency light onto an inspection area of the semiconductor device to reduce a potential barrier of a PN junction in the semiconductor device, a beam scanner arranged over the semiconductor device and irradiating a charged particle beam onto the inspection area of the semiconductor device to generate secondary electrons, and a defect detector generating a detection image corresponding to the inspection area and detecting, based on a voltage contrast between a reference image and a plurality of detection images, a defect image indicating a defect in the semiconductor device from among the plurality of detection images.
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4.发明授权公开(公告)号：US11722795B2
公开(公告)日：2023-08-08
申请号：US17670793
申请日：2022-02-14
Applicant: Samsung Electronics Co., Ltd.
Inventor： Daeyoung Kim , Kundong Kim , Jongwoo Kim , Suyoung Lee
IPC: H04N5/355 , H04N25/59 , H04N25/60 , H04N25/587
CPC classification number: H04N25/59 , H04N25/587 , H04N25/60
Abstract: Disclosed is a device for noise reduction using dual conversion gain, which includes an image sensor including a pixel array, the pixel array configured to generate a first pixel signal corresponding to a first conversion gain and a second pixel signal corresponding to a second conversion gain from pixels sharing a floating diffusion region and the image sensor configured to generate first image data and second image data based on the first pixel signal and the second pixel signal, and an image signal processor that generates an output image based on the first image data and the second image data. The image signal processor includes a normalization circuit that normalizes the first image data based on a dynamic range of the second image data to generate third image data, and a blending circuit that generates the output image based on the second image data and the third image data.
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公开(公告)号：US11683466B2
公开(公告)日：2023-06-20
申请号：US17352883
申请日：2021-06-21
Applicant: Samsung Electronics Co., Ltd.
Inventor： Daejung Kim , Jongmun Song , Joohyoung Lee , Gilseong Heo , Suyoung Lee , Kilwoo Chung
CPC classification number: H04N13/239 , G06T3/40 , G06T5/50 , H04N23/58 , H04N23/62 , H04N23/631 , G06T2207/20016 , G06T2207/20221
Abstract: An electronic device includes: a display; a first camera module having a first field of view (FoV) and generating first image data; a second camera module having a second FoV that is less than the first FoV and generating second image data; and an application processor configured to obtain zoom information including a zoom ratio and a region of interest (ROI) determined based on a user's input, to generate converted image data by scaling an image area corresponding to the ROI with respect to image data corresponding to the zoom ratio from among the first image data and the second image data, and to control the display to display the converted image data.
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Patent Agency Ranking
公开(公告)号：US20220343523A1
公开(公告)日：2022-10-27
申请号：US17556472
申请日：2021-12-20
Applicant: Samsung Electronics Co., Ltd.
Inventor： Soonyong Cho , Yoojeong Seo , Seokhyeon Lee , Yongkoo Park , Suyoung Lee , Kilwoo Chung
Abstract: Disclosed is an electronic device configured to generate depth information. The electronic device includes: a memory storing one or more instructions and image data; and at least one processing circuit configured to generate the depth information on the image data by executing the one or more instructions, wherein the at least one processing circuit is further configured to obtain luminance data of the image data, generate absolute depth data for the luminance data by using a first artificial neural network configured to extract disparity features, and generate the depth information based on the absolute depth data.
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公开(公告)号：US20240412943A1
公开(公告)日：2024-12-12
申请号：US18528851
申请日：2023-12-05
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jinwoo Lee , Bumjoo Lee , Jong Cheon Sun , Suyoung Lee , Hyeongcheol Lee
Abstract: A substrate inspection method includes reducing a surface potential of a substrate; and increasing a difference of the surface potential of the substrate, where reducing the surface potential of the substrate includes: controlling a scanning electron microscope to irradiate an electron beam to the substrate for a first irradiation time; and after a first standby time has elapsed, controlling the scanning electron microscope to re-irradiate the electron beam to the substrate for the first irradiation time, where increasing the difference of the surface potential of the substrate includes: controlling the scanning electron microscope to irradiate the electron beam to the substrate for a second irradiation time; and after a second standby time has elapsed, controlling the scanning electron microscope to re-irradiate the electron beam to the substrate for the second irradiation time, and where the first irradiation time is less than the second irradiation time.
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公开(公告)号：US11978223B2
公开(公告)日：2024-05-07
申请号：US17556472
申请日：2021-12-20
Applicant: Samsung Electronics Co., Ltd.
Inventor： Soonyong Cho , Yoojeong Seo , Seokhyeon Lee , Yongkoo Park , Suyoung Lee , Kilwoo Chung
CPC classification number: G06T7/529 , G06T7/55 , H04N25/00 , G06T2207/20081 , G06T2207/20084
Abstract: Disclosed is an electronic device configured to generate depth information. The electronic device includes: a memory storing one or more instructions and image data; and at least one processing circuit configured to generate the depth information on the image data by executing the one or more instructions, wherein the at least one processing circuit is further configured to obtain luminance data of the image data, generate absolute depth data for the luminance data by using a first artificial neural network configured to extract disparity features, and generate the depth information based on the absolute depth data.
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公开(公告)号：US20210333225A1
公开(公告)日：2021-10-28
申请号：US17175173
申请日：2021-02-12
Applicant: Samsung Electronics Co., Ltd.
Inventor： Suyoung Lee , Jongmin Kim , Ilsuk Park , Kwangil Shin , Chungsam Jun
IPC: G01N23/225 , G01N23/221 , G06T7/00
Abstract: An inspection apparatus and a method of inspecting a semiconductor device are disclosed. The inspection apparatus includes a stage on which a semiconductor device is positioned, a first light source irradiating a high-frequency light onto an inspection area of the semiconductor device to reduce a potential barrier of a PN junction in the semiconductor device, a beam scanner arranged over the semiconductor device and irradiating a charged particle beam onto the inspection area of the semiconductor device to generate secondary electrons, and a defect detector generating a detection image corresponding to the inspection area and detecting, based on a voltage contrast between a reference image and a plurality of detection images, a defect image indicating a defect in the semiconductor device from among the plurality of detection images.
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10.发明授权公开(公告)号：US11140330B2
公开(公告)日：2021-10-05
申请号：US17038952
申请日：2020-09-30
Applicant: Samsung Electronics Co., Ltd.
Inventor： Eunjik Yi , Sooman Jeong , Heeshin Kim , Hwansun Sung , Suyoung Lee , Jeongwook Lee
Abstract: A method of operating a digital image stabilization apparatus including acquiring motion information by a first camera for capturing an image of a first field of view, controlling a prism of a second camera using the motion information, acquiring a main image and a peripheral image by a second camera for capturing an image of a second field of view, the second field of view being narrower than the first field of view, and generating a stabilized frame image related to the main image using the motion information and the peripheral image may be provided.
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