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公开(公告)号：US20230036302A1
公开(公告)日：2023-02-02
申请号：US17879425
申请日：2022-08-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Eunhye LEE , Cheolkyu LIM
Abstract: Disclosed are an electronic device for generating workout types and a method of operating the electronic device. According to an embodiment, an electronic device includes: a memory and at least one processor connected to the memory, wherein the at least one processor is configured to: acquire a workout type name in response to a request for adding a workout type, recommend at least one data type based on the workout type name, generate a new workout type corresponding to the workout type name based on a data type selected from among the at least one recommended data type, and acquire workout measurement information corresponding to the selected data type in response to execution of the new workout type.
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公开(公告)号：US20240319229A1
公开(公告)日：2024-09-26
申请号：US18606516
申请日：2024-03-15
Applicant: Samsung Electronics Co., Ltd.
Inventor： Chunghyun KIM , Cheolkyu LIM , Byungwook JEONG
CPC classification number: G01R1/06794 , G01R1/07342 , G01R31/2831
Abstract: A wafer testing apparatus includes a probe board disposed above a chamber, a wafer chuck disposed below the probe board and configured to support the wafer, a camera located between the probe board and the wafer chuck and configured to capture images of probe imaging points arranged on a lower surface of the probe board and wafer imaging points arranged on an upper surface of the wafer, and a controller electrically connected to the camera and configured to adjust a tilt of the probe board on the basis of image information acquired by the camera. The probe imaging points include a plurality of probe outer imaging points arranged in a rhombic pattern on the lower surface of the probe board, and the wafer imaging points include a plurality of wafer outer imaging points arranged in a rhombic pattern on the upper surface of the wafer.
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