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公开(公告)号:US12112783B2
公开(公告)日:2024-10-08
申请号:US17537937
申请日:2021-11-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seung Pil Ko , Yongjae Kim , Geonhee Bae , Gawon Lee , Kilho Lee
CPC classification number: G11C11/161 , H01L23/528 , H10B61/00 , H10N50/10 , H10N50/20 , H10N50/80 , H10N50/85
Abstract: A magnetic memory device may include a substrate including a first region and a second region, a first interlayer insulating layer on the substrate, a first capping layer on the first interlayer insulating layer, the first capping layer covering the first and second regions of the substrate, a second interlayer insulating layer on a portion of the first capping layer covering the first region of the substrate, a bottom electrode contact included in the second interlayer insulating layer, a magnetic tunnel junction pattern on the bottom electrode contact, and a second capping layer on the second interlayer insulating layer, the second capping layer being in contact with the first capping layer on the second region of the substrate.