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公开(公告)号:US11205601B2
公开(公告)日:2021-12-21
申请号:US16747404
申请日:2020-01-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eung chang Lee , Heeyoub Kang , Haejung Yang , Youngrok Oh , Kitaek Lee , Bong jae Lee
Abstract: A semiconductor package includes a semiconductor chip and a polydimethylsiloxane (PDMS) layer that is provided on the semiconductor chip and of which upper surface is exposed to the outside. Since the semiconductor package may include the PDMS layer, heat emitting performance of the semiconductor package in a vacuum state may improve.
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公开(公告)号:US20220334940A1
公开(公告)日:2022-10-20
申请号:US17510634
申请日:2021-10-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Haejung Yang , Heeyoub Kang , Youngrok Oh , Kitaek Lee , Heechul Lee
Abstract: A storage device includes at least one non-volatile memory device, a first temperature sensor and a second temperature sensor arranged adjacent to the at least one non-volatile memory device, and a controller controlling an operation performance level of the at least one non-volatile memory device based on a plurality of performance tables, a first temperature detected by the first temperature sensor, and a second temperature detected by the second temperature sensor. Each performance table includes a plurality of entries, and each entry includes information regarding the operation performance level of the at least one non-volatile memory device. Each performance table corresponds to a result of a calculation regarding the first temperature and the second temperature.
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公开(公告)号:US11681599B2
公开(公告)日:2023-06-20
申请号:US17510634
申请日:2021-10-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Haejung Yang , Heeyoub Kang , Youngrok Oh , Kitaek Lee , Heechul Lee
CPC classification number: G06F11/3034 , G06F11/3058 , G06F11/3409 , G06F11/3466
Abstract: A storage device includes at least one non-volatile memory device, a first temperature sensor and a second temperature sensor arranged adjacent to the at least one non-volatile memory device, and a controller controlling an operation performance level of the at least one non-volatile memory device based on a plurality of performance tables, a first temperature detected by the first temperature sensor, and a second temperature detected by the second temperature sensor. Each performance table includes a plurality of entries, and each entry includes information regarding the operation performance level of the at least one non-volatile memory device. Each performance table corresponds to a result of a calculation regarding the first temperature and the second temperature.
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