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公开(公告)号:US20230011310A1
公开(公告)日:2023-01-12
申请号:US17857812
申请日:2022-07-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhong KIM , Yunhwan JUNG , Heesung CHAE , Mooyoung KIM , Haesick SUL
Abstract: An image sensor may include a pixel array a pixel array including an active pixel and an optical black pixel, the active pixel configured to generate a first pixel signal, and the optical black pixel configured to generate a second pixel signal, a first biasing circuit configured to bias the first pixel signal based on a first bias voltage, a first analog-to-digital converter configured to convert the biased first pixel signal into a first digital signal, a second biasing circuit configured to bias the second pixel signal based on a second bias voltage, and a second analog-to-digital converter configured to convert the biased second pixel signal into a second digital signal, the second digital signal configured to generate smaller random noise than the first analog-to-digital converter.
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2.
公开(公告)号:US20230295908A1
公开(公告)日:2023-09-21
申请号:US18322355
申请日:2023-05-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kyung-Min KIM , Haesick SUL , Sunyood KANG , Yungong KIM , Seongnam-si SUH , Hyeongji LEE , Yunhwan JUNG
IPC: E03C1/086
CPC classification number: E03C1/086
Abstract: Disclosed is a bandgap reference circuit, which includes a first current generator that generates a first current proportional to a temperature, a second current generator that outputs a second current obtained by mirroring the first current to a first node at which a reference voltage is formed, a first resistor that is connected with the first node and is supplied with the second current, and a first bipolar junction transistor (BJT) that includes an emitter node connected with the first resistor, a base node supplied with a first power, and a collector node supplied with a second power different from the first power.
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3.
公开(公告)号:US20240048870A1
公开(公告)日:2024-02-08
申请号:US18354162
申请日:2023-07-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sunyool KANG , Haesick SUL , Yunhwan JUNG , Yongjun CHO , Heesung CHAE
IPC: H04N25/772 , H03M1/34 , H03M1/12
CPC classification number: H04N25/772 , H03M1/34 , H03M1/1205
Abstract: Provided are analog-digital converting circuits including a comparator, and an image sensor. The analog-digital converting circuit include a counter and a comparator, the comparator including a first P-type transistor including a gate connected to a first input node of the comparator, a second P-type transistor including a gate connected to a second input node of the comparator, a first N-type transistor including a gate connected to the first input node and a drain connected to the first P-type transistor, a second N-type transistor including a gate connected to the second input node and a drain connected to the second P-type transistor, and a transistor including a gate connected to the drain of the first N-type transistor and a source to which ground voltage or power supply voltage is applied.
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4.
公开(公告)号:US20210382513A1
公开(公告)日:2021-12-09
申请号:US17150316
申请日:2021-01-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kyung-Min KIM , Haesick SUL , Sunyool KANG , Yunhong KIM , Seungmin SUH , Hyeonji LEE , Yunhwan JUNG
Abstract: Disclosed is a bandgap reference circuit, which includes a first current generator that generates a first current proportional to a temperature, a second current generator that outputs a second current obtained by mirroring the first current to a first node at which a reference voltage is formed, a first resistor that is connected with the first node and is supplied with the second current, and a first bipolar junction transistor (BJT) that includes an emitter node connected with the first resistor, a base node supplied with a first power, and a collector node supplied with a second power different from the first power.
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