公开(公告)号：US20220038651A1

公开(公告)日：2022-02-03

申请号：US17198355

申请日：2021-03-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sunyool KANG ,  Kyungtae KIM ,  Yunhwan JUNG ,  Yongjun CHO ,  Heesung CHAE

IPC: H04N5/3745 ,  H04N5/369 ,  H04N5/378

Abstract: An image sensor includes a first amplifier comparing and amplifying a first voltage signal received from a first column line, and a ramp signal; a second amplifier amplifying an output of the first amplifier; a third amplifier comparing and amplifying a second voltage signal received from a second column line, and the ramp signal; and a fourth amplifier amplifying an output of the third amplifier, wherein the second amplifier and the fourth amplifier output a decision signal at different points in time by dummy switch control split.

公开(公告)号：US20230179884A1

公开(公告)日：2023-06-08

申请号：US17893675

申请日：2022-08-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yongjun CHO ,  Sunyool KANG ,  Yunhong KIM ,  Heesung CHAE

IPC: H04N5/369 ,  H01L27/146 ,  H04N5/3745

CPC classification number: H04N5/3698 ,  H01L27/14612 ,  H01L27/14643 ,  H04N5/37455

Abstract: Disclosed is an image sensor device which includes an image pixel that outputs a reset voltage and a first data voltage through a data line, and a voltage hold circuit that is connected with the data line, stores a first voltage based on the reset voltage, and provides the data line with a second voltage based on the first voltage.

公开(公告)号：US20220078363A1

公开(公告)日：2022-03-10

申请号：US17333712

申请日：2021-05-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sunyool KANG ,  Yunhwan JUNG ,  Seokyong HONG

IPC: H04N5/369 ,  H04N5/376 ,  H04N5/378

Abstract: An image sensor includes a pixel array including a plurality of pixels connected to row lines extending in a first direction and to column lines extending in a second direction intersecting the first direction, a ramp voltage generator configured to output a ramp voltage, a plurality of comparators, each of the plurality of comparators including a first input terminal to which the ramp voltage is input, and a second input terminal connected to one of the column lines, and a replica circuit having a same structure as a structure of a portion of the comparators. Each of the comparators includes a plurality of transistors, a first auto-zero transistor connected to the first input terminal, a second auto-zero transistor connected to the second input terminal, and wirings connected to the plurality of transistors, the first auto-zero transistor, and the second auto-zero transistor.

公开(公告)号：US20210193568A1

公开(公告)日：2021-06-24

申请号：US17192408

申请日：2021-03-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yunhwan JUNG ,  Sunyool KANG ,  Jaehong KIM

IPC: H01L23/522 ,  H04N5/357 ,  H04N5/378 ,  H03K4/08 ,  H01L27/08

Abstract: A comparison circuit that includes an input sampling capacitor and an image sensor including the same are provided. The comparison circuit includes an amplifier configured to receive a pixel signal and a ramp signal to perform a correlated double sampling operation, a first pixel capacitor connected to the amplifier through a first floating node and configured to transmit the pixel signal, a first ramp capacitor connected to the amplifier through a second floating node and configured to transmit the ramp signal, a second pixel capacitor connected in parallel to the first pixel capacitor, and a second ramp capacitor connected in parallel to the first ramp capacitor, wherein the second pixel capacitor is formed between the first floating node and first peripheral routing lines, and the second ramp capacitor is formed between the second floating node and second peripheral routing lines.

公开(公告)号：US20180033722A1

公开(公告)日：2018-02-01

申请号：US15662630

申请日：2017-07-28

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yunhwan JUNG ,  Sunyool KANG ,  Jaehong KIM

IPC: H01L23/522 ,  H01L27/08

CPC classification number: H01L23/5223 ,  H01L23/5225 ,  H01L27/0805 ,  H03K4/08 ,  H04N5/3575 ,  H04N5/378

Abstract: A comparison circuit that includes an input sampling capacitor and an image sensor including the same are provided. The comparison circuit includes an amplifier configured to receive a pixel signal and a ramp signal to perform a correlated double sampling operation, a first pixel capacitor connected to the amplifier through a first floating node and configured to transmit the pixel signal, a first ramp capacitor connected to the amplifier through a second floating node and configured to transmit the ramp signal, a second pixel capacitor connected in parallel to the first pixel capacitor, and a second ramp capacitor connected in parallel to the first ramp capacitor, wherein the second pixel capacitor is formed between the first floating node and first peripheral routing lines, and the second ramp capacitor is formed between the second floating node and second peripheral routing lines.

公开(公告)号：US20240205566A1

公开(公告)日：2024-06-20

申请号：US18230290

申请日：2023-08-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yongjun CHO ,  Sunyool KANG ,  Yunhwan JUNG

IPC: H04N25/772

CPC classification number: H04N25/772

Abstract: An image sensor including a pixel array including a plurality of pixels arranged in a plurality of rows and a plurality of columns, a row driver configured to transmit control signals to the pixel array, and an analog-to-digital converter array configured to receive pixel signals from the pixel array and convert the pixel signals into a digital signal, wherein the row driver is configured to transmit a control signal such that a first pixel group arranged in a first row from among the plurality of rows and a second pixel group arranged in a second row from among the plurality of rows output pixel signals during a first period, and transmit a control signal such that a third pixel group arranged in the first row and a fourth pixel group arranged in the second row output pixel signals during a second period.

公开(公告)号：US20240048870A1

公开(公告)日：2024-02-08

申请号：US18354162

申请日：2023-07-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sunyool KANG ,  Haesick SUL ,  Yunhwan JUNG ,  Yongjun CHO ,  Heesung CHAE

IPC: H04N25/772 ,  H03M1/34 ,  H03M1/12

CPC classification number: H04N25/772 ,  H03M1/34 ,  H03M1/1205

Abstract: Provided are analog-digital converting circuits including a comparator, and an image sensor. The analog-digital converting circuit include a counter and a comparator, the comparator including a first P-type transistor including a gate connected to a first input node of the comparator, a second P-type transistor including a gate connected to a second input node of the comparator, a first N-type transistor including a gate connected to the first input node and a drain connected to the first P-type transistor, a second N-type transistor including a gate connected to the second input node and a drain connected to the second P-type transistor, and a transistor including a gate connected to the drain of the first N-type transistor and a source to which ground voltage or power supply voltage is applied.

公开(公告)号：US20210382513A1

公开(公告)日：2021-12-09

申请号：US17150316

申请日：2021-01-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kyung-Min KIM ,  Haesick SUL ,  Sunyool KANG ,  Yunhong KIM ,  Seungmin SUH ,  Hyeonji LEE ,  Yunhwan JUNG

IPC: G05F3/26 ,  G05F1/46

Abstract: Disclosed is a bandgap reference circuit, which includes a first current generator that generates a first current proportional to a temperature, a second current generator that outputs a second current obtained by mirroring the first current to a first node at which a reference voltage is formed, a first resistor that is connected with the first node and is supplied with the second current, and a first bipolar junction transistor (BJT) that includes an emitter node connected with the first resistor, a base node supplied with a first power, and a collector node supplied with a second power different from the first power.

公开(公告)号：US20200058583A1

公开(公告)日：2020-02-20

申请号：US16663582

申请日：2019-10-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yunhwan JUNG ,  Sunyool KANG ,  Jaehong KIM

IPC: H01L23/522 ,  H01L27/08 ,  H03K4/08 ,  H04N5/378 ,  H04N5/357

Abstract: A comparison circuit that includes an input sampling capacitor and an image sensor including the same are provided. The comparison circuit includes an amplifier configured to receive a pixel signal and a ramp signal to perform a correlated double sampling operation, a first pixel capacitor connected to the amplifier through a first floating node and configured to transmit the pixel signal, a first ramp capacitor connected to the amplifier through a second floating node and configured to transmit the ramp signal, a second pixel capacitor connected in parallel to the first pixel capacitor, and a second ramp capacitor connected in parallel to the first ramp capacitor, wherein the second pixel capacitor is formed between the first floating node and first peripheral routing lines, and the second ramp capacitor is formed between the second floating node and second peripheral routing lines.