公开(公告)号：US09170919B2

公开(公告)日：2015-10-27

申请号：US14019812

申请日：2013-09-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hee-Jun Shim ,  Min-Wook Ahn ,  Jin-Sae Jung ,  Yen-Jo Han

IPC: G06F9/44 ,  G06F11/36 ,  G06F9/45

CPC classification number: G06F11/3624 ,  G06F8/41 ,  G06F11/3612 ,  G06F11/3672

Abstract: An apparatus for detecting a source code error location in a mixed-mode program is disclosed. The apparatus may include a compiler, a mapping table generator, a simulator, a comparison data generator and an error location detector. The apparatus extracts low-level data while simulating a verification program and while simulating a reference program. The low-level data is mapped to mapping tables for a verification program and a reference program, and by comparing the tables it is determined if there is an error in the mixed-mode program and if so, where.

Abstract translation: 公开了一种用于在混合模式程序中检测源代码错误位置的装置。 该装置可以包括编译器，映射表生成器，模拟器，比较数据生成器和错误位置检测器。 该装置在模拟验证程序和模拟参考程序的同时提取低级数据。 低级数据被映射到用于验证程序和参考程序的映射表，并且通过比较表来确定混合模式程序中是否存在错误，如果是，则在哪里。

公开(公告)号：US09542188B2

公开(公告)日：2017-01-10

申请号：US13734526

申请日：2013-01-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hee-Jun Shim ,  Yeon-Gon Cho

IPC: G06F9/38 ,  G06F11/36

CPC classification number: G06F9/38 ,  G06F11/3636 ,  G06F11/3648

Abstract: Provided is a hardware debugging apparatus and method for a software-pipelined program. The hardware debugging apparatus and method overcome a currency problem caused during hardware debugging in the software-pipelined program by guarding certain execution blocks and restarting the processing of the software-pipelined program.

Abstract translation: 提供了一种用于软件流水线程序的硬件调试装置和方法。 硬件调试装置和方法通过保护某些执行块并重新启动软件流水线程序的处理，克服了软件流水线程序硬件调试过程中造成的货币问题。

公开(公告)号：US09916414B2

公开(公告)日：2018-03-13

申请号：US14920548

申请日：2015-10-22

Applicant: Samsung Electronics Co., Ltd.

Inventor： Seong-Hoon Jeong ,  Moo-Kyoung Chung ,  Young-Chul Cho ,  Hee-Jun Shim ,  Jin-Sae Jung ,  Yen-Jo Han

IPC: G06F17/50 ,  G06F11/36

CPC classification number: G06F17/5081 ,  G06F11/3684 ,  G06F17/5009

Abstract: An apparatus for generating a test case includes a constrained description generator configured to define a plurality of constrained verification spaces in a total verification space, and generate a constrained description for each of the plurality of constrained verification spaces; and a test case generator configured to generate a test case using the constrained description.

公开(公告)号：US20160042116A1

公开(公告)日：2016-02-11

申请号：US14920548

申请日：2015-10-22

Applicant: Samsung Electronics Co., Ltd.

Inventor： Seong-Hoon Jeong ,  Moo-Kyoung Chung ,  Young-Chul Cho ,  Hee-Jun Shim ,  Jin-Sae Jung ,  Yen-Jo Han

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G06F11/3684 ,  G06F17/5009

Abstract: An apparatus for generating a test case includes a constrained description generator configured to define a plurality of constrained verification spaces in a total verification space, and generate a constrained description for each of the plurality of constrained verification spaces; and a test case generator configured to generate a test case using the constrained description.

Abstract translation: 用于生成测试用例的装置包括：受限描述发生器，其被配置为在总验证空间中定义多个约束验证空间，并且为所述多个约束验证空间中的每一个生成约束描述; 以及被配置为使用约束描述生成测试用例的测试用例生成器。