公开(公告)号：US09170919B2

公开(公告)日：2015-10-27

申请号：US14019812

申请日：2013-09-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hee-Jun Shim ,  Min-Wook Ahn ,  Jin-Sae Jung ,  Yen-Jo Han

IPC: G06F9/44 ,  G06F11/36 ,  G06F9/45

CPC classification number: G06F11/3624 ,  G06F8/41 ,  G06F11/3612 ,  G06F11/3672

Abstract: An apparatus for detecting a source code error location in a mixed-mode program is disclosed. The apparatus may include a compiler, a mapping table generator, a simulator, a comparison data generator and an error location detector. The apparatus extracts low-level data while simulating a verification program and while simulating a reference program. The low-level data is mapped to mapping tables for a verification program and a reference program, and by comparing the tables it is determined if there is an error in the mixed-mode program and if so, where.

Abstract translation: 公开了一种用于在混合模式程序中检测源代码错误位置的装置。 该装置可以包括编译器，映射表生成器，模拟器，比较数据生成器和错误位置检测器。 该装置在模拟验证程序和模拟参考程序的同时提取低级数据。 低级数据被映射到用于验证程序和参考程序的映射表，并且通过比较表来确定混合模式程序中是否存在错误，如果是，则在哪里。

公开(公告)号：US09087152B2

公开(公告)日：2015-07-21

申请号：US13772647

申请日：2013-02-21

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Young-Chul Cho ,  Tai-Song Jin ,  Dong-Kwan Suh ,  Yen-Jo Han

IPC: G06F9/45 ,  G06F11/36 ,  G06F17/50

CPC classification number: G06F11/3604 ,  G06F8/4452 ,  G06F11/3664 ,  G06F17/5027

Abstract: A verification supporting apparatus and a verification supporting method of a reconfigurable processor is provided. The verification supporting apparatus includes an invalid operation determiner configured to detect an invalid operation from a result of scheduling on a source code, and a masking hint generator configured to generate a masking hint for the detected invalid operation.

Abstract translation: 提供了一种可重构处理器的验证支持装置和验证支持方法。 验证支持装置包括：无效操作确定器，被配置为根据源代码的调度结果来检测无效操作，以及掩蔽提示生成器，被配置为生成用于检测到的无效操作的屏蔽提示。

公开(公告)号：US09916414B2

公开(公告)日：2018-03-13

申请号：US14920548

申请日：2015-10-22

Applicant: Samsung Electronics Co., Ltd.

Inventor： Seong-Hoon Jeong ,  Moo-Kyoung Chung ,  Young-Chul Cho ,  Hee-Jun Shim ,  Jin-Sae Jung ,  Yen-Jo Han

IPC: G06F17/50 ,  G06F11/36

CPC classification number: G06F17/5081 ,  G06F11/3684 ,  G06F17/5009

Abstract: An apparatus for generating a test case includes a constrained description generator configured to define a plurality of constrained verification spaces in a total verification space, and generate a constrained description for each of the plurality of constrained verification spaces; and a test case generator configured to generate a test case using the constrained description.

公开(公告)号：US20160042116A1

公开(公告)日：2016-02-11

申请号：US14920548

申请日：2015-10-22

Applicant: Samsung Electronics Co., Ltd.

Inventor： Seong-Hoon Jeong ,  Moo-Kyoung Chung ,  Young-Chul Cho ,  Hee-Jun Shim ,  Jin-Sae Jung ,  Yen-Jo Han

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G06F11/3684 ,  G06F17/5009

Abstract: An apparatus for generating a test case includes a constrained description generator configured to define a plurality of constrained verification spaces in a total verification space, and generate a constrained description for each of the plurality of constrained verification spaces; and a test case generator configured to generate a test case using the constrained description.

Abstract translation: 用于生成测试用例的装置包括：受限描述发生器，其被配置为在总验证空间中定义多个约束验证空间，并且为所述多个约束验证空间中的每一个生成约束描述; 以及被配置为使用约束描述生成测试用例的测试用例生成器。