-
公开(公告)号:US10962581B2
公开(公告)日:2021-03-30
申请号:US16575805
申请日:2019-09-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ji Nyeong Yun , Jae Moo Choi , Jong Pill Park , Jae Hong Kim
IPC: G01R31/01 , G01R31/28 , G01R1/073 , G01R31/319
Abstract: A semiconductor integrated circuit test system can include a first semiconductor integrated circuit tester configured to conduct a first test of a first characteristic of one of a plurality of semiconductor integrated circuits, wherein the first test is completed by the first semiconductor integrated circuit tester within a first test time. A second semiconductor integrated circuit tester, can be coupled to the first semiconductor integrated circuit tester, where the second semiconductor integrated circuit tester can be configured to conduct a second test of a second characteristic of each of the plurality of the semiconductor integrated circuits simultaneously, wherein the second test is completed within a second test time that is at least about two orders of magnitude more than the first test time.
-
公开(公告)号:US10444270B2
公开(公告)日:2019-10-15
申请号:US15455818
申请日:2017-03-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ji Nyeong Yun , Jae Moo Choi , Jong Pill Park , Jae Hong Kim
IPC: G01R31/01 , G01R31/28 , G01R1/073 , G01R31/319
Abstract: A semiconductor integrated circuit test system can include a first semiconductor integrated circuit tester configured to conduct a first test of a first characteristic of one of a plurality of semiconductor integrated circuits, wherein the first test is completed by the first semiconductor integrated circuit tester within a first test time. A second semiconductor integrated circuit tester, can be coupled to the first semiconductor integrated circuit tester, where the second semiconductor integrated circuit tester can be configured to conduct a second test of a second characteristic of each of the plurality of the semiconductor integrated circuits simultaneously, wherein the second test is completed within a second test time that is at least about two orders of magnitude more than the first test time.
-