公开(公告)号：US10962581B2

公开(公告)日：2021-03-30

申请号：US16575805

申请日：2019-09-19

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ji Nyeong Yun ,  Jae Moo Choi ,  Jong Pill Park ,  Jae Hong Kim

IPC: G01R31/01 ,  G01R31/28 ,  G01R1/073 ,  G01R31/319

Abstract: A semiconductor integrated circuit test system can include a first semiconductor integrated circuit tester configured to conduct a first test of a first characteristic of one of a plurality of semiconductor integrated circuits, wherein the first test is completed by the first semiconductor integrated circuit tester within a first test time. A second semiconductor integrated circuit tester, can be coupled to the first semiconductor integrated circuit tester, where the second semiconductor integrated circuit tester can be configured to conduct a second test of a second characteristic of each of the plurality of the semiconductor integrated circuits simultaneously, wherein the second test is completed within a second test time that is at least about two orders of magnitude more than the first test time.

公开(公告)号：US10444270B2

公开(公告)日：2019-10-15

申请号：US15455818

申请日：2017-03-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ji Nyeong Yun ,  Jae Moo Choi ,  Jong Pill Park ,  Jae Hong Kim

IPC: G01R31/01 ,  G01R31/28 ,  G01R1/073 ,  G01R31/319

Abstract: A semiconductor integrated circuit test system can include a first semiconductor integrated circuit tester configured to conduct a first test of a first characteristic of one of a plurality of semiconductor integrated circuits, wherein the first test is completed by the first semiconductor integrated circuit tester within a first test time. A second semiconductor integrated circuit tester, can be coupled to the first semiconductor integrated circuit tester, where the second semiconductor integrated circuit tester can be configured to conduct a second test of a second characteristic of each of the plurality of the semiconductor integrated circuits simultaneously, wherein the second test is completed within a second test time that is at least about two orders of magnitude more than the first test time.