-
公开(公告)号:US20240213199A1
公开(公告)日:2024-06-27
申请号:US18227646
申请日:2023-07-28
发明人: Sungwoo PARK , Yongjae KIM , Heonwoo KIM , Seung-Kwan RYU
IPC分类号: H01L23/00 , H01L23/498 , H01L25/065
CPC分类号: H01L24/13 , H01L23/49816 , H01L24/16 , H01L24/17 , H01L25/0657 , H01L2224/13017 , H01L2224/16225 , H01L2224/1703 , H01L2225/06517 , H01L2225/06544 , H01L2924/37001
摘要: The present disclosure provides semiconductor packages and methods of fabricating the same. In some embodiments, a semiconductor package includes a substrate including first and second regions, a first pad on the first region, a second pad on the second region, a first dielectric layer on the first region and including a first opening exposing the first pad, a second dielectric layer on the second region and including a second opening exposing the second pad, a first bump structure on the first pad and in the first opening, and a second bump structure on the second pad and in the second opening. A thickness of the first dielectric layer is greater than a thickness of the second dielectric layer. A distance between the substrate and an uppermost end of the first bump structure is longer than a distance between the substrate and an uppermost end of the second bump structure.