公开(公告)号：US20140369472A1

公开(公告)日：2014-12-18

申请号：US14303905

申请日：2014-06-13

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyun Hwa OH ,  Dong Goo KANG ,  Sung Hoon KANG ,  Young Hun SUNG

IPC: A61B6/00

CPC classification number: A61B6/484 ,  A61B6/06 ,  A61B6/4266 ,  A61B6/4417 ,  A61B6/463

Abstract: An X-ray imaging apparatus and control method for the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes an X-ray source to generate X-ray beams, and to irradiate the X-ray beams onto an object; a first X-ray detector configured to detect X-ray beams transmitted through the object and generate a first phase contrast signal; an X-ray obtainer including an X-ray collimator and a second X-ray detector, wherein the X-ray collimator is spaced apart from the object by a predetermined distance, and configured to focus the X-ray beams transmitted through the object, and wherein the second X-ray detector is configured to detect the focused X-ray beams and generate a second phase contrast signal based on the detected X-ray beams; and an image processor configured to create a phase contrast image and an absorption image of the object.

Abstract translation: 提供了一种用于X射线成像装置的X射线成像装置和控制方法。 X射线成像装置包括用于产生X射线束的X射线源，并将X射线束照射到物体上; 第一X射线检测器，被配置为检测透过物体的X射线束，并产生第一相位相差信号; 包括X射线准直仪和第二X射线检测器的X射线获取器，其中所述X射线准直仪与所述物体间隔预定距离，并且被配置为聚焦透过所述物体的X射线束， 并且其中所述第二X射线检测器被配置为检测所聚焦的X射线束，并且基于所检测的X射线束产生第二相位差信号; 以及被配置为创建对象的相位对比图像和吸收图像的图像处理器。

公开(公告)号：US20140105369A1

公开(公告)日：2014-04-17

申请号：US13871576

申请日：2013-04-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung Hoon KANG ,  Dong Goo KANG ,  Sung Su KIM ,  Young Hun SUNG ,  Hyun Hwa OH

IPC: G01T7/00

CPC classification number: G01T7/005

Abstract: Provided are a calibration apparatus and method that may be used for setting a magnitude of an electric pulse based on a result obtained by imaging at least one imaging object, and that may be used for mapping and calibrating a photon energy corresponding to an absorption edge of at least one calibration object.

Abstract translation: 提供了一种校准装置和方法，其可以用于基于通过对至少一个成像对象进行成像获得的结果来设置电脉冲的幅度，并且其可以用于映射和校准与吸收边对应的光子能量 至少一个校准对象。

公开(公告)号：US20130301799A1

公开(公告)日：2013-11-14

申请号：US13893453

申请日：2013-05-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dong Goo KANG ,  Sung Hoon KANG ,  Young Hun SUNG

IPC: A61B6/00

CPC classification number: A61B6/5258 ,  A61B6/4241 ,  A61B6/482 ,  A61B6/50 ,  A61B6/502 ,  A61B6/5205 ,  A61B6/5235 ,  A61B6/583 ,  A61B6/585 ,  H01L27/14663

Abstract: Disclosed herein are an X-ray imaging apparatus for forming an X-ray image having reduced noise by correcting errors according to characteristics of each of a plurality of pixels and a control method therefor. The X-ray imaging apparatus includes an X-ray generator to generate X-rays and irradiate the generated X-rays, an X-ray detector to detect the irradiated X-rays and output X-ray data by counting the number of photons having an energy that is equal to or greater than threshold energy among photons contained in the detected X-rays, for each of a plurality of pixels; a function acquisition unit to acquire calibration functions for the respective pixels using X-ray data output for a plurality of predesigned phantoms, and an image correction unit to correct an X-ray image of an object on a per pixel basis using the acquired calibration functions.

Abstract translation: 本文公开了一种X射线成像装置及其控制方法，用于通过根据多个像素中的每一个的特征校正误差来形成具有降低的噪声的X射线图像。 X射线成像装置包括产生X射线并照射所产生的X射线的X射线发生器，X射线检测器，用于检测照射的X射线，并通过计数具有 对于多个像素中的每一个，在所检测的X射线中包含的光子中等于或大于阈值能量的能量; 功能获取单元，用于使用针对多个预先设计的体模输出的X射线数据来获取各个像素的校准功能;以及图像校正单元，用于使用所获取的校准函数以每像素为基础校正对象的X射线图像 。

公开(公告)号：US20140341336A1

公开(公告)日：2014-11-20

申请号：US14282623

申请日：2014-05-20

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung Su KIM ,  Hyun Hwa OH ,  Dong Goo KANG ,  Sung Hoon KANG ,  Young Hun SUNG ,  Kang Eui LEE ,  Seok Min HAN

IPC: A61B6/00

CPC classification number: A61B6/502 ,  A61B6/4488

Abstract: An X-ray imaging apparatus and method for controlling the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes an X-ray source configured to generate and emit X-rays onto an object, an X-ray detector configured to detect the X-rays transmitted through the object and convert the X-rays into an electrical signal, a heating portion located at an upper portion of the X-ray detector configured to contact a lower part of the object, a heat transfer portion configured to transfer heat produced in the X-ray source to the heating portion, and a thermal insulation member located between the X-ray detector and the heating portion configured to block heat from being transferred to the X-ray detector.

Abstract translation: 提供一种用于控制X射线成像装置的X射线成像装置和方法。 X射线成像装置包括被配置为产生X射线并将X射线发射到物体上的X射线源，X射线检测器，被配置为检测通过物体传输的X射线并将X射线转换成电信号 位于所述X射线检测器的上部的加热部，所述加热部配置成与所述被检体的下部接触，所述传热部被配置为将在所述X射线源中产生的热量传递到所述加热部，以及绝热部件 位于X射线检测器和被配置为阻止热量传递到X射线检测器的加热部分之间。

公开(公告)号：US20140105364A1

公开(公告)日：2014-04-17

申请号：US13890657

申请日：2013-05-09

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seok Min HAN ,  Dong Goo KANG ,  Young Hun SUNG ,  Sung Hoon KANG ,  Jae Hyun KWON ,  Sung Su KIM ,  Hyun Hwa OH

IPC: G01T1/29

CPC classification number: G01T1/2914 ,  A61B6/4241 ,  A61B6/482 ,  G01N23/087 ,  G01N2223/423 ,  G01T1/36

Abstract: Provided is an apparatus for spectrum estimation. The apparatus includes a threshold setter which sets at least one threshold in order to separate a spectrum into at least one energy bin; a reference value setter which sets one of the at least one threshold as a reference threshold; a threshold adjuster which adjusts the at least one threshold based on a predetermined condition; a comparer which compares the reference threshold with the adjusted threshold; and an output unit which outputs a spectrum in which the adjusted threshold is set, when a value which is determined based on the comparison result corresponds to a predetermined maximum value.

Abstract translation: 提供了一种用于频谱估计的装置。 该装置包括阈值设定器，其设置至少一个阈值以便将频谱分离成至少一个能量仓; 参考值设定器，其将所述至少一个阈值中的一个设置为参考阈值; 阈值调整器，其基于预定条件来调整所述至少一个阈值; 比较参考阈值与调整后的阈值的比较器; 以及输出单元，当基于比较结果确定的值对应于预定的最大值时，输出设置了调整后的阈值的频谱。

公开(公告)号：US20140185760A1

公开(公告)日：2014-07-03

申请号：US14100123

申请日：2013-12-09

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung Su KIM ,  Hyun Hwa OH ,  Dong Goo KANG ,  Sung Hoon KANG ,  Young Hun SUNG ,  Kang Eui LEE ,  Seok Min HAN

IPC: A61B6/00

CPC classification number: A61B6/5294 ,  A61B6/0414 ,  A61B6/4241 ,  A61B6/482 ,  A61B6/502 ,  A61B6/5258 ,  A61B6/583

Abstract: The X-ray imaging apparatus includes an X-ray generator to generate and emit X-rays, an X-ray detector to detect the emitted X-rays and acquire X-ray data, and a controller to convert the X-ray data into X-ray characteristic coordinates and estimate a response characteristic function of the X-ray detector from a relationship between measurement data and reference data, the measurement data and the reference data being converted into the X-ray characteristic coordinates.

Abstract translation: X射线成像装置包括：X射线发生器，用于产生和发射X射线; X射线检测器，用于检测所发射的X射线，并获取X射线数据;以及控制器，将X射线数据转换为 X射线特征坐标并根据测量数据和参考数据之间的关系估计X射线检测器的响应特征函数，测量数据和参考数据被转换成X射线特征坐标。

公开(公告)号：US20140185759A1

公开(公告)日：2014-07-03

申请号：US14069975

申请日：2013-11-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dong Goo KANG ,  Sung Hoon KANG ,  Young Hun SUNG ,  Hyun Hwa OH ,  Myung Jin CHUNG

IPC: G01N23/087

CPC classification number: G01T1/2018 ,  A61B6/4241 ,  A61B6/4291 ,  A61B6/482 ,  A61B6/502 ,  A61B6/5205 ,  G01N23/04 ,  G21K1/10

Abstract: Disclosed herein are an X-ray detection panel, an X-ray image generating module, an X-ray imaging apparatus, and a method of generating an X-ray image. The X-ray imaging apparatus includes an X-ray generator configured to emit X-rays; an X-ray detection panel comprising a plurality of pixel groups, each pixel group configured to detect X-rays having an energy band and to convert the detected X-rays into electrical signals; and an image processor configured to acquire readout data from the electrical signals of at least one of the plurality of pixel groups, to calculate estimated data, and to generate an X-ray image by combining the readout data and the estimated data.

Abstract translation: 这里公开了X射线检测面板，X射线图像生成模块，X射线摄像装置和X射线图像的生成方法。 X射线成像装置包括：X射线发生器，被配置为发射X射线; 包括多个像素组的X射线检测面板，每个像素组被配置为检测具有能带的X射线，并将检测到的X射线转换为电信号; 以及图像处理器，被配置为从所述多个像素组中的至少一个像素组的电信号获取读出数据，以计算估计数据，并且通过组合读出数据和估计数据来生成X射线图像。

公开(公告)号：US20150063537A1

公开(公告)日：2015-03-05

申请号：US14338805

申请日：2014-07-23

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jae Hak LEE ,  Dong Goo KANG ,  Sung Hoon KANG ,  Young Hun SUNG ,  Seok Min HAN

IPC: A61B6/02 ,  A61B6/00

CPC classification number: A61B6/022 ,  A61B6/032 ,  A61B6/4007 ,  A61B6/4441

Abstract: Disclosed herein is an X-ray imaging apparatus including: an X-ray generator including a first X-ray source configured to irradiate a first X-ray onto an object, and at least one second X-ray source spaced apart from the first X-ray source and configured to irradiate at least one second X-ray onto the object; an X-ray detector configured to detect the first X-ray which has propagated through the object and the at least one second X-ray which has propagated through the object; and an image processor configured to produce a first X-ray image of the object based on the detected first X-ray, to produce at least one second X-ray image of the object based on the detected at least one second X-ray, and to produce a stereoscopic image of the object based on the first X-ray image and the at least one second X-ray image.

Abstract translation: 本发明公开了一种X射线成像装置，包括：X射线发生器，包括被配置为将第一X射线照射到物体上的第一X射线源和与第一X射线源分离的至少一个第二X射线源 射线源并被配置为将至少一个第二X射线照射到物体上; X射线检测器，其被配置为检测已经传播通过物体的第一X射线和已经传播通过物体的至少一个第二X射线; 以及图像处理器，被配置为基于检测到的第一X射线产生对象的第一X射线图像，以基于检测到的至少一个第二X射线产生对象的至少一个第二X射线图像， 并且基于第一X射线图像和至少一个第二X射线图像产生对象的立体图像。

公开(公告)号：US20140185766A1

公开(公告)日：2014-07-03

申请号：US14144766

申请日：2013-12-31

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sung Hoon KANG ,  Dong Goo KANG ,  Sang Wook HAN ,  Young Hun SUNG ,  Hyun Hwa OH

IPC: G01N23/04

CPC classification number: G01T7/005 ,  G01T1/169

Abstract: An X-ray imaging apparatus includes an X-ray generator configured to generate and emit X-rays, an X-ray detector configured to detect the X-rays and count a number of photons having energy equal to or greater than threshold energy per pixel among photons contained in the detected X-rays, a map generator configured to extract corrected threshold energy corresponding to target threshold energy mapped to each pixel, and a data correction unit configured to calculate corrected X-ray data corresponding to the corrected threshold energy per pixel from a plurality of X-ray data acquired based on a plurality of images of a target object obtained by using a plurality of approximate energies equal or approximate to the target threshold energy as threshold energy of the X-ray detector.

Abstract translation: X射线成像装置包括被配置为产生和发射X射线的X射线发生器，被配置为检测X射线并计数具有等于或大于每像素阈值能量的能量的数量的X光检测器的X射线检测器 在包含在所检测的X射线中的光子之间，映射发生器被配置为提取对应于映射到每个像素的目标阈值能量的校正阈值能量;以及数据校正单元，被配置为计算对应于每像素校正的阈值能量的校正的X射线数据 从基于通过使用等于或近似于目标阈值能量的多个近似能量获得的目标对象的多个图像获取的多个X射线数据作为X射线检测器的阈值能量。

公开(公告)号：US20140119506A1

公开(公告)日：2014-05-01

申请号：US13845742

申请日：2013-03-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dong Goo KANG ,  Sung Hoon KANG ,  Sung Su KIM ,  Young Hun SUNG ,  Hyun Hwa OH ,  Seok Min HAN

IPC: G01N23/04

CPC classification number: A61B6/502 ,  A61B6/0414 ,  A61B6/405 ,  A61B6/481 ,  A61B6/482 ,  A61B6/486 ,  A61B6/5258 ,  A61B6/544 ,  A61B6/545 ,  A61B6/583

Abstract: An apparatus and method for acquiring an optimal MEX image may include an X-ray source to generate an X-ray and to irradiate the X-ray, an energy identification detector to acquire a MEX image that is generated when the irradiated X-ray penetrates an object, and an optimal MEX processor to generate an optimal MEX parameter based on a characteristic of the object and to control at least one of the X-ray source and the energy identification detector based on the generated optimal MEX parameter.

Abstract translation: 用于获取最佳MEX图像的装置和方法可以包括产生X射线并照射X射线的X射线源，能量识别检测器以获取当照射的X射线穿透时产生的MEX图像 物体和最佳MEX处理器，以基于物体的特性生成最佳MEX参数，并且基于所生成的最佳MEX参数来控制X射线源和能量识别检测器中的至少一个。