公开(公告)号：US11200117B2

公开(公告)日：2021-12-14

申请号：US17029912

申请日：2020-09-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Myung Kyu Lee ,  Jun Jin Kong ,  Ki Jun Lee ,  Sung Hye Cho ,  Dae Hyun Kim ,  Yong Gyu Chu

IPC: G06F11/10 ,  H03M13/29 ,  G11C29/52

Abstract: Disclosed are a semiconductor memory device, a controller, a memory system, and an operation method thereof. The semiconductor memory device includes a memory cell array including a plurality of memory cells, and an error correcting code (ECC) decoder configured to receive first data and a parity output from selected memory cells of the memory cell array. The ECC decoder generates a syndrome based on the first data and the parity, generates a decoding status flag (DSF) indicating a type of an error of the first data by the syndrome, and outputs the second data and the DSF to an external device outside of the semiconductor memory device when a read operation of the semiconductor memory device is performed.

公开(公告)号：US10824507B2

公开(公告)日：2020-11-03

申请号：US16372047

申请日：2019-04-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Myung Kyu Lee ,  Jun Jin Kong ,  Ki Jun Lee ,  Sung Hye Cho ,  Dae Hyun Kim ,  Yong Gyu Chu

IPC: G06F11/10 ,  H03M13/29 ,  G11C29/52

Abstract: Disclosed are a semiconductor memory device, a controller, and a memory system. The semiconductor memory device includes a memory cell array including a plurality of memory cells, and an error correcting code (ECC) decoder configured to receive first data and a parity output from selected memory cells of the memory cell array. The ECC decoder generates a syndrome based on the first data and the parity, generates a decoding status flag (DSF) indicating a type of an error of the first data by the syndrome, and outputs the second data and the DSF to an external device outside of the semiconductor memory device when a read operation of the semiconductor memory device is performed.