Contactless system for detecting subtle surface potential charge patterns
    3.
    发明授权
    Contactless system for detecting subtle surface potential charge patterns 失效
    用于检测微小表面电荷电荷模式的非接触式系统

    公开(公告)号:US6150824A

    公开(公告)日:2000-11-21

    申请号:US961061

    申请日:1997-10-30

    CPC分类号: G03G15/75 G01N27/60

    摘要: A contactless process for detecting electrical patterns on the outer surface of a member comprising providing a member having a charge pattern on an outer surface, repetitively measuring the charge pattern on the outer surface of the member with an electrostatic voltmeter probe maintained at a substantially constant distance from the surface, the distance between the probe and the imaging member being slightly greater than the minimum distance at which Paschen breakdown will occur to form a parallel plate capacitor with a gas between the probe and the surface, the frequency of repetition being selected to cause all time dependent signals to fall out of phase by a predetermined amount, and averaging the out of phase time dependent signals over a sufficient number of measuring repetitions to eliminate the time dependent signals. In one embodiment, the contactless process detects surface potential charge patterns in an electrostatographic imaging member. Apparatus for carrying out these processes are also described.

    摘要翻译: 一种用于检测构件的外表面上的电气图案的非接触式方法,包括在外表面上提供具有电荷图案的构件,用保持在基本上恒定距离的静电电压表探针重复测量构件的外表面上的电荷图案 从表面来看,探针与成像构件之间的距离略大于发生帕辛击穿的最小距离,以便在探头和表面之间形成具有气体的平行平板电容器,选择重复频率导致 所有时间相关信号相位相差预定量,并通过足够数量的测量重复对异相时间相关信号进行平均,以消除与时间相关的信号。 在一个实施例中,非接触式过程检测电摄影成像构件中的表面电荷电荷模式。 还描述了用于执行这些处理的装置。