摘要:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
摘要:
An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.
摘要:
Input/output (I/O) measurement facilities are provided. An extended I/O measurement block facility is provided that enables measurement blocks to be stored in discontiguous areas of main storage and to be accessed directly via addresses. In a further aspect, an extended I/O measurement word facility is provided that facilitates the obtaining of measurement data for single I/O operations.
摘要:
An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.
摘要:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
摘要:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
摘要:
I/O measurement data for channels attached to logical control unit queues is obtained related to a plurality of logical control unit queues. A store secondary queue measurement data instruction specifies a range of queues for which extended secondary measurement blocks derived from the I/O measurement data are stored at a memory address specified by the store secondary queue measurement data instruction.
摘要:
I/O measurement data associated with the performance of an I/O operation process is gathered during the I/O process. The I/O measurement data is saved in an IRB memory location specified by a test subchannel instruction. An I/O interrupt signals the completion of the I/O operation process.
摘要翻译:在I / O过程中收集与执行I / O操作过程相关联的I / O测量数据。 I / O测量数据保存在由测试子通道指令指定的IRB存储单元中。 I / O中断指示完成I / O操作过程。
摘要:
A determination is made as to whether input/output constraints exist for controllers (e.g., control units) of a computing environment. To facilitate this determination, an I/O velocity is calculated. The I/O velocity represents a relationship between an amount of time waiting to use one or more resources of the controller and an amount of time using the one or more resources.
摘要翻译:确定对于计算环境的控制器(例如,控制单元)是否存在输入/输出约束。 为了便于确定,计算出I / O速度。 I / O速度表示等待使用控制器的一个或多个资源的时间量与使用该一个或多个资源的时间量之间的关系。
摘要:
Input/output (I/O) configurations of a computing environment are managed. This management includes dynamically adjusting an I/O configuration, when it is determined that such an adjustment is needed or desired. In order to make the adjustment, a channel path is selected from a plurality of channel paths. The selection of the channel path to be used in the adjustment is based on one or more characteristics associated with the channel path.