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公开(公告)号：US08610608B2
公开(公告)日：2013-12-17
申请号：US13415430
申请日：2012-03-08
IPC分类号： H03M1/06
CPC分类号： H03J7/04
摘要： Various embodiments of the present invention provide systems and methods for data processing. For example, a data processing circuit is discussed that includes: a data detector circuit, a low latency detection circuit, and an error calculation circuit. The data detector circuit is operable to perform a data detection process on a first signal derived from a data input to yield a detected output, and to provide a loop error as a difference between the detected output and the first signal. The low latency detection circuit operable to process a second signal derived from the data input to yield a fast detector output, and to provide a generated error as a difference between the fast detector output and the second signal. The error calculation circuit is operable to calculate an error value based at least in part on the generated error and the loop error.
摘要翻译： 本发明的各种实施例提供了用于数据处理的系统和方法。 例如，讨论了包括数据检测器电路，低延迟检测电路和误差计算电路的数据处理电路。 数据检测器电路可操作以对从数据输入导出的第一信号执行数据检测处理，以产生检测到的输出，并提供循环误差作为检测到的输出与第一信号之间的差。 低延迟检测电路可操作以处理从数据输入得到的第二信号以产生快速检测器输出，并且将产生的误差提供为快速检测器输出和第二信号之间的差。 误差计算电路可操作以至少部分地基于所产生的误差和环路误差来计算误差值。
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公开(公告)号：US08949701B2
公开(公告)日：2015-02-03
申请号：US13368599
申请日：2012-02-08
IPC分类号： G06F11/00
CPC分类号： G11B20/10509 , G11B20/10046 , G11B20/10268 , G11B20/10472 , G11B20/1816 , G11B27/36 , G11B2220/2516 , H04L27/0002
摘要： Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.
摘要翻译： 本发明的各种实施例提供了用于介质缺陷检测的系统和方法。 例如，公开了一种媒体缺陷检测系统，其包括从介质导出的数据输入，快速包络计算电路，其接收数据输入并且基于数据输入提供快速衰减包络值;慢包络计算电路，其接收 数据输入并基于数据输入提供慢衰减包络值，以及介质缺陷检测电路。 媒体缺陷检测电路接收慢衰减包络值和快速衰减包络值，计算快速衰减包络值与慢衰减包络值的比值，并至少部分地基于比较来确定缺陷输出 比值到缺陷阈值。
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公开(公告)号：US08875005B2
公开(公告)日：2014-10-28
申请号：US13368599
申请日：2012-02-08
IPC分类号： G06F11/00
摘要： Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.
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公开(公告)号：US20130238944A1
公开(公告)日：2013-09-12
申请号：US13415430
申请日：2012-03-08
IPC分类号： G06F11/07
CPC分类号： H03J7/04
摘要： Various embodiments of the present invention provide systems and methods for data processing. For example, a data processing circuit is discussed that includes: a data detector circuit, a low latency detection circuit, and an error calculation circuit. The data detector circuit is operable to perform a data detection process on a first signal derived from a data input to yield a detected output, and to provide a loop error as a difference between the detected output and the first signal. The low latency detection circuit operable to process a second signal derived from the data input to yield a fast detector output, and to provide a generated error as a difference between the fast detector output and the second signal. The error calculation circuit is operable to calculate an error value based at least in part on the generated error and the loop error.
摘要翻译： 本发明的各种实施例提供了用于数据处理的系统和方法。 例如，讨论了包括数据检测器电路，低延迟检测电路和误差计算电路的数据处理电路。 数据检测器电路可操作以对从数据输入导出的第一信号执行数据检测处理，以产生检测到的输出，并提供循环误差作为检测到的输出与第一信号之间的差。 低延迟检测电路可操作以处理从数据输入得到的第二信号以产生快速检测器输出，并且将产生的误差提供为快速检测器输出和第二信号之间的差。 误差计算电路可操作以至少部分地基于所产生的误差和环路误差来计算误差值。
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公开(公告)号：US07952824B2
公开(公告)日：2011-05-31
申请号：US12399679
申请日：2009-03-06
IPC分类号： G11B27/36
CPC分类号： G11B27/36 , G11B2220/2516
摘要： Various embodiments of the present invention provide systems and methods for storage medium flaw detection. For example, some embodiments provide flaw detection systems that include an input circuit, a data processing circuit and a defect detection circuit. The input circuit is operable to receive an input signal and to provide a filtered output. The data processing circuit is operable to receive the filtered output and to compute a difference between the filtered output and an expected output, and the defect detection circuit receives the difference between the filtered output and the expected output and compares a derivative of the difference with a threshold value, and asserts a defect signal when a magnitude of the derivative of the difference exceeds a threshold value.
摘要翻译： 本发明的各种实施例提供了用于存储介质探伤的系统和方法。 例如，一些实施例提供了包括输入电路，数据处理电路和缺陷检测电路的探伤系统。 输入电路可操作以接收输入信号并提供滤波输出。 数据处理电路可操作以接收滤波后的输出并计算滤波后的输出与预期输出之间的差值，而缺陷检测电路接收滤波后的输出与预期输出之间的差值，并将差值的导数与 并且当差分的导数的大小超过阈值时，断言缺陷信号。
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公开(公告)号：US20130205185A1
公开(公告)日：2013-08-08
申请号：US13368599
申请日：2012-02-08
IPC分类号： G06F11/07
CPC分类号： G11B20/10509 , G11B20/10046 , G11B20/10268 , G11B20/10472 , G11B20/1816 , G11B27/36 , G11B2220/2516 , H04L27/0002
摘要： Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.
摘要翻译： 本发明的各种实施例提供了用于介质缺陷检测的系统和方法。 例如，公开了一种媒体缺陷检测系统，其包括从介质导出的数据输入，快速包络计算电路，其接收数据输入并且基于数据输入提供快速衰减包络值;慢包络计算电路，其接收 数据输入并基于数据输入提供慢衰减包络值，以及介质缺陷检测电路。 媒体缺陷检测电路接收慢衰减包络值和快速衰减包络值，计算快速衰减包络值与慢衰减包络值的比值，并至少部分地基于比较来确定缺陷输出 比值到缺陷阈值。
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公开(公告)号：US08139457B2
公开(公告)日：2012-03-20
申请号：US12236148
申请日：2008-09-23
IPC分类号： G11B20/18
CPC分类号： G11B5/5565 , G11B5/59611 , G11B20/10037 , G11B20/1816 , G11B2220/2516
摘要： Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.
摘要翻译： 本发明的各种实施例提供了用于介质缺陷检测的系统和方法。 例如，公开了一种媒体缺陷检测系统，其包括从介质导出的数据输入，快速包络计算电路，其接收数据输入并且基于数据输入提供快速衰减包络值;慢包络计算电路，其接收 数据输入并基于数据输入提供慢衰减包络值，以及介质缺陷检测电路。 媒体缺陷检测电路接收慢衰减包络值和快速衰减包络值，计算快速衰减包络值与慢衰减包络值的比值，并至少部分地基于比较来确定缺陷输出 比值到缺陷阈值。
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公开(公告)号：US20100226031A1
公开(公告)日：2010-09-09
申请号：US12399679
申请日：2009-03-06
IPC分类号： G11B27/36
CPC分类号： G11B27/36 , G11B2220/2516
摘要： Various embodiments of the present invention provide systems and methods for storage medium flaw detection. For example, some embodiments provide flaw detection systems that include an input circuit, a data processing circuit and a defect detection circuit. The input circuit is operable to receive an input signal and to provide a filtered output. The data processing circuit is operable to receive the filtered output and to compute a difference between the filtered output and an expected output, and the defect detection circuit receives the difference between the filtered output and the expected output and compares a derivative of the difference with a threshold value, and asserts a defect signal when a magnitude of the derivative of the difference exceeds a threshold value.
摘要翻译： 本发明的各种实施例提供了用于存储介质探伤的系统和方法。 例如，一些实施例提供了包括输入电路，数据处理电路和缺陷检测电路的探伤系统。 输入电路可操作以接收输入信号并提供滤波输出。 数据处理电路可操作以接收滤波后的输出并计算滤波输出与期望输出之间的差值，而缺陷检测电路接收滤波后的输出与预期输出之间的差值，并将该差分的导数与 并且当差分的导数的大小超过阈值时，断言缺陷信号。
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公开(公告)号：US20100074078A1
公开(公告)日：2010-03-25
申请号：US12236148
申请日：2008-09-23
IPC分类号： G11B5/58
CPC分类号： G11B5/5565 , G11B5/59611 , G11B20/10037 , G11B20/1816 , G11B2220/2516
摘要： Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.
摘要翻译： 本发明的各种实施例提供了用于介质缺陷检测的系统和方法。 例如，公开了一种媒体缺陷检测系统，其包括从介质导出的数据输入，快速包络计算电路，其接收数据输入并且基于数据输入提供快速衰减包络值;慢包络计算电路，其接收 数据输入并基于数据输入提供慢衰减包络值，以及介质缺陷检测电路。 媒体缺陷检测电路接收慢衰减包络值和快速衰减包络值，计算快速衰减包络值与慢衰减包络值的比值，并至少部分地基于比较来确定缺陷输出 比值到缺陷阈值。
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公开(公告)号：US20130198421A1
公开(公告)日：2013-08-01
申请号：US13362466
申请日：2012-01-31
申请人： Nayak Ratnakar Aravind , Yu Liao , Haitao Xia
发明人： Nayak Ratnakar Aravind , Yu Liao , Haitao Xia
IPC分类号： G06F13/12
CPC分类号： H03M1/12 , G06F13/385
摘要： Various embodiments of the present invention provide systems and methods for data processing. For example, a data processing system is discussed that includes: an analog to digital converter circuit, and a magneto-resistive adjustment circuit. The analog to digital converter circuit is operable to convert an input signal into corresponding digital samples. The magneto-resistive adjustment circuit is operable to reduce signal asymmetry in the digital samples due to sensing by a magneto-resistive head to yield a corrected output.
摘要翻译： 本发明的各种实施例提供了用于数据处理的系统和方法。 例如，讨论了包括：模数转换器电路和磁阻调节电路的数据处理系统。 模数转换器电路可操作以将输入信号转换成对应的数字采样。 磁阻调节电路可操作以由于由磁阻头感测而产生校正输出，从而减少数字采样中的信号不对称性。
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