LEAD-FREE SOLDER ALLOY AND IN-VEHICLE ELECTRONIC CIRCUIT
    2.
    发明申请
    LEAD-FREE SOLDER ALLOY AND IN-VEHICLE ELECTRONIC CIRCUIT 有权
    无铅焊接合金和车载电子电路

    公开(公告)号:US20160056570A1

    公开(公告)日:2016-02-25

    申请号:US14782142

    申请日:2014-04-03

    摘要: With the increasing density of in-vehicle electronic circuits, not only conventional cracks at bonding interfaces such as between the substrate and the solder attachment site or a component and the solder attachment site but also novel cracking problems of cracks occurring in the Sn matrix in the interior of the bonded solder have appeared. To solve the above problem, a lead-free solder alloy with 1-4 mass % Ag, 0.6-0.8 mass % Cu, 1-5 mass % Sb, 0.01-0.2 mass % Ni and the remainder being Sn is used. A solder alloy, which not only can withstand harsh temperature cycling characteristics from low temperatures of −40° C. to high temperatures of 125° C. but can also withstand external forces that occur when riding up on a curb or colliding with a vehicle in front for long periods, and an in-vehicle electronic circuit device using the solder alloy can thereby be obtained.

    摘要翻译: 随着车载电子电路密度的增加,不仅在基板和焊料附着部位之间的接合界面处的常规裂纹或部件和焊料附着位置,而且还存在Sn基体中出现裂纹的新颖裂纹问题 粘合焊料的内部已经出现。 为了解决上述问题,使用了具有1-4质量%Ag,0.6-0.8质量%Cu,1-5质量%Sb,0.01-0.2质量%Ni和余量为Sn的无铅焊料合金。 一种焊料合金,它不仅可以承受从-40°C的低温到125°C的高温的恶劣温度循环特性,而且还可以承受在爬上路边或与车辆碰撞时发生的外力 可以得到长时间的前方以及使用焊料合金的车载电子电路装置。

    SOLDERED JOINT AND METHOD FOR FORMING SOLDERED JOINT

    公开(公告)号:US20200284282A1

    公开(公告)日:2020-09-10

    申请号:US16759625

    申请日:2018-10-30

    IPC分类号: F16B5/08 B23K1/00

    摘要: A solder joint in which an electronic component with a back metal is bonded to a substrate by a solder alloy. The solder alloy includes: a solder alloy layer having an alloy composition consisting of, in mass %: Ag: 2 to 4%, Cu: 0.6 to 2%, Sb: 9.0 to 12%, Ni: 0.005 to 1%, optionally Co: 0.2% or less and Fe: 0.1% or less, with the balance being Sn; an Sn—Sb intermetallic compound phase; a back metal-side intermetallic compound layer formed at an interface between the back metal and the solder alloy; and a substrate-side intermetallic compound layer formed at an interface between the substrate and the solder alloy. The solder alloy layer exists at least one of between the Sn—Sb intermetallic compound phase and the back metal-side intermetallic compound layer, and between the Sn—Sb intermetallic compound phase and the substrate-side intermetallic compound layer.