公开(公告)号：US06774364B2

公开(公告)日：2004-08-10

申请号：US10410131

申请日：2003-04-10

Applicant: Shigenori Takagi

Inventor： Shigenori Takagi

IPC: H01J3728

CPC classification number: H01J37/28 ,  H01J2237/22

Abstract: In an operation of an electron microscope, at least a spot size of an electron beam on a specimen, an acceleration voltage, a detector type, a specimen position, and an observation magnification are set as a predetermined image observation condition and an observation image is picked up under the predetermined image observation condition. Different image observation conditions are automatically set based on the observation image. A plurality of observation images are picked up based on the setup image observation conditions. The plurality of picked-up observation images are simultaneously displayed on a second display section. A desired observation image is selected from among the observation images displayed on the second display section. The selected observation image is displayed on a first display section on an enlarged scale.

Abstract translation: 在电子显微镜的操作中，将样本上的电子束的至少点尺寸，加速电压，检测器类型，样本位置和观察倍率设置为预定图像观察条件，并且观察图像为 在预定图像观察条件下拾起。 基于观察图像自动设定不同的图像观察条件。 基于设置图像观察条件来拾取多个观察图像。 多个拾取观察图像同时显示在第二显示部分上。 从显示在第二显示部分上的观察图像中选择期望的观察图像。 所选择的观察图像以放大比例显示在第一显示部分上。

公开(公告)号：US20120001070A1

公开(公告)日：2012-01-05

申请号：US13152353

申请日：2011-06-03

Applicant: Shigenori Takagi

Inventor： Shigenori Takagi

IPC: G01N23/00

CPC classification number: H01J37/226 ,  G02B21/0004 ,  G02B21/26 ,  G02B21/365 ,  H01J37/023 ,  H01J37/16 ,  H01J37/228 ,  H01J37/28

Abstract: Work to obtain an optical and an electron microscope images at an identical display size is facilitated. A magnifying observation apparatus includes: an electron beam imaging device that obtains an electron microscope image in a chamber; an optical imaging device that obtains an optical image in the chamber; a moving device that moves the both devices such that an optical axis direction of one of the both devices is aligned with an optical axis direction of the other device; a display section that displays the electron microscope and the optical images; and a magnifying power conversion section that recognizes a magnifying power of an image obtained by one of the imaging devices and converts the magnifying power, which is used to obtain an image having a display size substantially identical to that of the image, by the other device into a magnifying power on a basis of the other device.

Abstract translation: 有助于以相同的显示尺寸获得光学和电子显微镜图像。 放大观察装置包括：电子束成像装置，其在室中获得电子显微镜图像; 光学成像装置，其获得所述腔室中的光学图像; 移动装置，其使两个装置移动，使得两个装置中的一个的光轴方向与另一装置的光轴方向对齐; 显示电子显微镜和光学图像的显示部分; 以及放大倍率转换部，其识别通过所述摄像装置之一获得的图像的放大倍数，并且通过所述另一装置转换用于获得具有与图像的显示尺寸基本相同的图像的图像的放大倍数 在其他设备的基础上成为放大倍数。

公开(公告)号：US06768114B2

公开(公告)日：2004-07-27

申请号：US10410133

申请日：2003-04-10

Applicant: Shigenori Takagi

Inventor： Shigenori Takagi

IPC: H01J3728

CPC classification number: H01J37/222 ,  G01N23/2251

Abstract: In an electron microscope, at least the characteristics of the specimen is set on a first image observation mode screen as an image observation condition. An observation image of the specimen is displayed on a first display section based on a condition set on the first image observation mode screen. Observation images of the specimen are displayed on a second display section as one or more secondary electron images or one or more reflection electron images under at least two types of image observation conditions based on the condition set on the first image observation mode screen. Any desired observation image is selected from among the observation images displayed on the second display section.

Abstract translation: 在电子显微镜中，至少将样本的特性设定在作为图像观察条件的第一图像观察模式画面上。 基于在第一图像观察模式屏幕上设置的条件，将样本的观察图像显示在第一显示部分上。 基于在第一图像观察模式屏幕上设置的条件，将样本的观察图像作为一个或多个二次电子图像或至少两种图像观察条件下的一个或多个反射电子图像显示在第二显示部分上。 从显示在第二显示部分上的观察图像中选择任何所需的观察图像。

公开(公告)号：US5126935A

公开(公告)日：1992-06-30

申请号：US433761

申请日：1989-11-09

Applicant: Takeshi Saitou ,  Katsumi Yoshida ,  Ikuo Shimanuki ,  Kimikazu Sato ,  Shigenori Takagi

Inventor： Takeshi Saitou ,  Katsumi Yoshida ,  Ikuo Shimanuki ,  Kimikazu Sato ,  Shigenori Takagi

IPC: G07G1/12 ,  G07G1/00 ,  G07G1/14 ,  G07G3/00

CPC classification number: G06Q20/203 ,  G07G1/00 ,  G07G1/145 ,  G07G3/00

Abstract: A POS terminal device which performs the function of a cash register upon input of a commodity code, with date and hour data included in the commodity code being checked at the time of data input and a caution indication that the term of validity has expired or the term of validity is approaching. The POS terminal device comprising time measuring device, input device for inputting a commodity code including date and hour data, judgment step for comparing date and hour data indicated by the time measuring device with date and hour data included in a commodity code inputted by the input device, and caution device, whereby in the case where the date and hour data indicated by the time measuring device represents a time not earlier than that represented by the date and hour data included in the commodity code as a result of comparison in the judgment step, and which informs an operator about that fact.

Abstract translation: 一种POS终端装置，其在输入商品代码时执行收银机的功能，在数据输入时检查包括在商品代码中的日期和时间数据，以及有效期限到期的警告指示或 有效期正在临近。 该POS终端装置包括时间测量装置，用于输入包括日期和时间数据的商品代码的输入装置，用于将由时间测量装置指示的日期和时间数据与日期和时间数据进行比较的判断步骤，所述日期和时间数据包括在由输入的输入 装置和警告装置，由此在时间测量装置指示的日期和时间数据表示不是早于由在判断步骤中比较的结果的商品代码中包含的日期和时间数据所表示的时间的时间的时间 ，并通知运营商该事实。

公开(公告)号：US08674301B2

公开(公告)日：2014-03-18

申请号：US13152353

申请日：2011-06-03

Applicant: Shigenori Takagi

Inventor： Shigenori Takagi

IPC: G01N23/00

CPC classification number: H01J37/226 ,  G02B21/0004 ,  G02B21/26 ,  G02B21/365 ,  H01J37/023 ,  H01J37/16 ,  H01J37/228 ,  H01J37/28

Abstract: Work to obtain an optical and an electron microscope images at an identical display size is facilitated. A magnifying observation apparatus includes: an electron beam imaging device that obtains an electron microscope image in a chamber; an optical imaging device that obtains an optical image in the chamber; a moving device that moves the both devices such that an optical axis direction of one of the both devices is aligned with an optical axis direction of the other device; a display section that displays the electron microscope and the optical images; and a magnifying power conversion section that recognizes a magnifying power of an image obtained by one of the imaging devices and converts the magnifying power, which is used to obtain an image having a display size substantially identical to that of the image, by the other device into a magnifying power on a basis of the other device.

Abstract translation: 有助于以相同的显示尺寸获得光学和电子显微镜图像。 放大观察装置包括：电子束成像装置，其在室中获得电子显微镜图像; 光学成像装置，其获得所述腔室中的光学图像; 移动装置，其使两个装置移动，使得两个装置中的一个的光轴方向与另一装置的光轴方向对齐; 显示电子显微镜和光学图像的显示部分; 以及放大倍率转换部，其识别通过所述摄像装置之一获得的图像的放大倍数，并且通过所述另一装置转换用于获得具有与图像的显示尺寸基本相同的图像的图像的放大倍数 在其他设备的基础上成为放大倍数。

公开(公告)号：US06734429B2

公开(公告)日：2004-05-11

申请号：US10395263

申请日：2003-03-25

Applicant: Shigenori Takagi

Inventor： Shigenori Takagi

IPC: H01J3282

CPC classification number: H01J37/28 ,  H01J37/026

Abstract: Eliminating charge of the specimen is performed by applying an acceleration voltage to an electron gun and applying primary electrons to a charged-up specimen from the electron gun. The maximum value of the acceleration voltages of the primary electrons applied in the past is adopted as charge elimination start acceleration voltage. The acceleration voltage is gradually dropped from the charge elimination start voltage so as to emit electrons charged on the specimen. The acceleration voltage is applied continuously until the specimen charged negatively becomes uncharged or is charged positively. A plurality of specimens are previously compared with respect to the acceleration voltage at which the secondary electron emission efficiency becomes 1 and charge elimination termination voltage at which dropping the acceleration voltage is terminated is set to the minimum acceleration voltage or less.

Abstract translation: 通过向电子枪施加加速电压并将电子从电子枪施加到带电的样品上来进行样品的去除电荷。 采用过去施加的一次电子的加速电压的最大值作为电荷消除开始加速电压。 加速电压从电荷消除开始电压逐渐下降，以发射充电在试样上的电子。 连续施加加速电压，直到带负电的样品变得不充电或带正电。 预先将多个试样与二次电子发射效率为1的加速电压进行比较，将加速电压下降的电荷消除终止电压设定为最小加速电压以下。