摘要:
A testing device of a semiconductor device includes a first board having a plurality of openings; a frame body provided in the openings, the frame body having a frame in which a plurality of probe needles is provided; and a plurality of second boards provided perpendicular to the first board in the periphery of the openings, the second boards being connected to the first board; wherein the probe needles pierce the frame so as to be connected to the second boards from the periphery of the frame body via the openings.
摘要:
A testing device of a semiconductor device includes a first board having a plurality of openings; a frame body provided in the openings, the frame body having a frame in which a plurality of probe needles is provided; and a plurality of second boards provided perpendicular to the first board in the periphery of the openings, the second boards being connected to the first board; wherein the probe needles pierce the frame so as to be connected to the second boards from the periphery of the frame body via the openings.
摘要:
A flame retardant thermoplastic resin composition which comprises 100 parts by weight of a thermoplastic resin, from 1 to 30 parts by weight of (A) at least one of polyhydric alcohol-boric acid metal complexes, from 15 to 30 parts by weight of (B) at least one of ammonium polyphosphate and melamine-modified ammonium polyphosphate, and from 3 to 30 parts by weight of (C) at least one of melamine and melamine derivatives.