公开(公告)号：US10403386B2

公开(公告)日：2019-09-03

申请号：US15598239

申请日：2017-05-17

Applicant: Silicon Motion, Inc.

Inventor： Sheng Yuan Huang

IPC: G11C29/42 ,  G11C16/10 ,  G11C16/26 ,  G11C29/44 ,  G11C16/34 ,  G11C29/12

Abstract: A method for screening bad columns in a data storage medium includes steps of: writing predetermined data into at least one sample block; comparing the written data with the predetermined data to calculate numbers of error bits in the plurality of columns; defining an inspection window covering a portion of the columns; summing the numbers of error bits in the portion of columns in the inspection window to obtain a total number of error bits and determining whether the total number of error bits is greater than a number of correctable bits; if yes, determining a start point and a terminal point of a bad column interval in the inspection window, wherein the numbers of error bits in the columns between the start point and the terminal point are greater than a threshold of error bits; and labeling the columns in the bad column interval as bad columns.

公开(公告)号：US20170372797A1

公开(公告)日：2017-12-28

申请号：US15598239

申请日：2017-05-17

Applicant: Silicon Motion, Inc.

Inventor： Sheng Yuan Huang

IPC: G11C29/42 ,  G11C16/10 ,  G11C16/26 ,  G11C29/44

CPC classification number: G11C29/42 ,  G11C16/10 ,  G11C16/26 ,  G11C16/349 ,  G11C29/44 ,  G11C2029/1204 ,  G11C2029/4402

Abstract: A method for screening bad columns in a data storage medium includes steps of: writing predetermined data into at least one sample block; comparing the written data with the predetermined data to calculate numbers of error bits in the plurality of columns; defining an inspection window covering a portion of the columns; summing the numbers of error bits in the portion of columns in the inspection window to obtain a total number of error bits and determining whether the total number of error bits is greater than a number of correctable bits; if yes, determining a start point and a terminal point of a bad column interval in the inspection window, wherein the numbers of error bits in the columns between the start point and the terminal point are greater than a threshold of error bits; and labeling the columns in the bad column interval as bad columns.